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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/vlsi/EsonuAR94>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/C%E2%88%9A%C4%ABme_Rozon>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dhamin_Al-Khalili>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_Ogbonna_Esonu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1155%2F1994%2F70696>
foaf:homepage <https://doi.org/10.1155/1994/70696>
dc:identifier DBLP journals/vlsi/EsonuAR94 (xsd:string)
dc:identifier DOI doi.org%2F10.1155%2F1994%2F70696 (xsd:string)
dcterms:issued 1994 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/vlsi>
rdfs:label Fault Characterization and Testability Analysis of Emitter Coupled Logic and Comparison with CMOS & BiCMOS Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/C%E2%88%9A%C4%ABme_Rozon>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dhamin_Al-Khalili>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_Ogbonna_Esonu>
swrc:number 4 (xsd:string)
swrc:pages 261-276 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/vlsi/EsonuAR94/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/vlsi/EsonuAR94>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/vlsi/vlsi1.html#EsonuAR94>
rdfs:seeAlso <https://doi.org/10.1155/1994/70696>
dc:title Fault Characterization and Testability Analysis of Emitter Coupled Logic and Comparison with CMOS & BiCMOS Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 1 (xsd:string)