![[RDF data]](https://dblp.l3s.de/d2r/snorql/rdf_flyer.24.gif)
| Property | Value |
|---|---|
| dcterms:bibliographicCitation | <http://dblp.uni-trier.de/rec/bibtex/phd/basesearch/Andjelkovic22> |
| dc:creator | <https://dblp.l3s.de/d2r/resource/authors/Marko_S._Andjelkovic> |
| foaf:homepage | <https://publishup.uni-potsdam.de/frontdoor/index/index/docId/53484> |
| dc:identifier | DBLP phd/basesearch/Andjelkovic22 (xsd:string) |
| dcterms:issued | 2022 (xsd:gYear) |
| rdfs:label | A methodology for characterization, modeling and mitigation of single event transient effects in CMOS standard combinational cells (Eine Methode zur Charakterisierung, Modellierung und Minderung von SET Effekten in kombinierten CMOS-Standardzellen) (xsd:string) |
| foaf:maker | <https://dblp.l3s.de/d2r/resource/authors/Marko_S._Andjelkovic> |
| dc:publisher | University of Potsdam, Germany (xsd:string) |
| owl:sameAs | <http://bibsonomy.org/uri/bibtexkey/phd/basesearch/Andjelkovic22/dblp> |
| owl:sameAs | <http://dblp.rkbexplorer.com/id/phd/basesearch/Andjelkovic22> |
| rdfs:seeAlso | <https://publishup.uni-potsdam.de/frontdoor/index/index/docId/53484> |
| dc:title | A methodology for characterization, modeling and mitigation of single event transient effects in CMOS standard combinational cells (Eine Methode zur Charakterisierung, Modellierung und Minderung von SET Effekten in kombinierten CMOS-Standardzellen) (xsd:string) |
| dc:type | <http://purl.org/dc/dcmitype/Text> |
| rdf:type | swrc:PhDThesis |
| rdf:type | foaf:Document |