Property | Value |
---|---|
dcterms:bibliographicCitation | <http://dblp.uni-trier.de/rec/bibtex/phd/hal/Ouattara14a> |
dc:creator | <https://dblp.l3s.de/d2r/resource/authors/Boukary_Ouattara> |
foaf:homepage | <https://tel.archives-ouvertes.fr/tel-01079067> |
dc:identifier | DBLP phd/hal/Ouattara14a (xsd:string) |
dcterms:issued | 2014 (xsd:gYear) |
rdfs:label | Pr√©vision des effets de vieillissement par √©lectromigration dans les circuits int√©gr√©s CMOS en nŇďuds technologiques submicroniques. (Forecasting the effects of aging by electromigration in the circuits integrated CMOS submicron technology nodes). (xsd:string) |
foaf:maker | <https://dblp.l3s.de/d2r/resource/authors/Boukary_Ouattara> |
dc:publisher | Pierre and Marie Curie University, Paris, France (xsd:string) |
owl:sameAs | <http://bibsonomy.org/uri/bibtexkey/phd/hal/Ouattara14a/dblp> |
owl:sameAs | <http://dblp.rkbexplorer.com/id/phd/hal/Ouattara14a> |
rdfs:seeAlso | <https://tel.archives-ouvertes.fr/tel-01079067> |
dc:title | Pr√©vision des effets de vieillissement par √©lectromigration dans les circuits int√©gr√©s CMOS en nŇďuds technologiques submicroniques. (Forecasting the effects of aging by electromigration in the circuits integrated CMOS submicron technology nodes). (xsd:string) |
dc:type | <http://purl.org/dc/dcmitype/Text> |
rdf:type | swrc:PhDThesis |
rdf:type | foaf:Document |