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Searching for phrase ADC-BiST (changed automatically) with no syntactic query expansion in all metadata.

Publication years (Num. hits)
1997-2009 (15) 2010-2019 (13)
Publication types (Num. hits)
article(9) inproceedings(19)
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The graphs summarize 11 occurrences of 8 keywords

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Found 28 publication records. Showing 28 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
65Yongsheng Wang, Jinxiang Wang 0001, Fengchang Lai, Yizheng Ye Optimal Schemes for ADC BIST Based on Histogram. Search on Bibsonomy Asian Test Symposium The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
65Brendan Mullane, Ciaran MacNamee, Vincent O'Brien, Thomas Fleischmann An on-chip solution for static ADC test and measurement. Search on Bibsonomy ACM Great Lakes Symposium on VLSI The full citation details ... 2009 DBLP  DOI  BibTeX  RDF ADC-BiST, code histogram, linearity measurements, test, system-on-chip, analog to digital converter
56Hung-Kai Chen 0001, Chih-Hu Wang, Chau-Chin Su A Self Calibrated ADC BIST Methodology. Search on Bibsonomy VTS The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
38Xiankun Jin, Tao Chen 0006, Mayank Jain, Arun Kumar Barman, David Kramer, Doug Garrity, Randall L. Geiger, Degang Chen 0001 An on-chip ADC BIST solution and the BIST enabled calibration scheme. Search on Bibsonomy ITC The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
34Koay Soon Chan, Nuzrul Fahmi Nordin, Kim Chon Chan, Terk Zyou Lok, Chee Wai Yong Multi-histogram ADC BIST System for ADC Linearity Testing. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
30Maria Da Gloria Flores, Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin, Felipe R. Clayton, Cristiano Benevento Low Cost BIST for Static and Dynamic Testing of ADCs. Search on Bibsonomy J. Electron. Test. The full citation details ... 2005 DBLP  DOI  BibTeX  RDF ADC BIST, noise based testing, mixed-signal test
26Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell A Low-Cost BIST Architecture for Linear Histogram Testing of ADCs. Search on Bibsonomy J. Electron. Test. The full citation details ... 2001 DBLP  DOI  BibTeX  RDF Built-In Self-Test (BIST), analog and mixed-signal testing, ADC test
24Senthil Sivakumar, S. P. Joy Vasantha Rani Efficient Design of ADC BIST with an Analog Ramp Signal Generation and Digital Error Estimation. Search on Bibsonomy J. Circuits Syst. Comput. The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
24Senthil Sivakumar, S. P. Joy Vasantha Rani An ADC BIST using on-chip ramp generation and digital ORA. Search on Bibsonomy Microelectron. J. The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
24Hao Meng, Degang Chen 0001 A simple ramp generator with level spreading for SEIR based ADC BIST circuit. Search on Bibsonomy MWSCAS The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
24Yan Duan, Tao Chen 0006, Zhiqiang Liu, Xu Zhang, Degang Chen 0001 High-constancy offset generator robust to CDAC nonlinearity for SEIR-based ADC BIST. Search on Bibsonomy ISCAS The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
24Matthieu Dubois, Haralampos-G. D. Stratigopoulos, Salvador Mir, Manuel J. Barragán Statistical Evaluation of Digital Techniques for $\sum\varDelta$ ADC BIST. Search on Bibsonomy VLSI-SoC (Selected Papers) The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
24Jingbo Duan, Bharath K. Vasan, Chen Zhao, Degang Chen 0001, Randall L. Geiger On Chip Signal Generators for Low Overhead ADC BIST. Search on Bibsonomy J. Electron. Test. The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
24Jingbo Duan, Degang Chen 0001, Randall L. Geiger A low cost method for testing offset and gain error for ADC BIST. Search on Bibsonomy ISCAS The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
24Jingbo Duan, Degang Chen 0001 SNR measurement based on linearity test for ADC BIST. Search on Bibsonomy ISCAS The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
24An-Sheng Chao, Soon-Jyh Chang, Hsin-Wen Ting A SAR ADC BIST for simplified linearity test. Search on Bibsonomy SoCC The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
24Jingbo Duan, Le Jin, Degang Chen 0001 INL based dynamic performance estimation for ADC BIST. Search on Bibsonomy ISCAS The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
24Jingbo Duan, Degang Chen 0001, Randall L. Geiger Phase control of triangular stimulus generator for ADC BIST. Search on Bibsonomy ISCAS The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
24Jingbo Duan, Degang Chen 0001, Randall L. Geiger Cost Effective Signal Generators for ADC BIST. Search on Bibsonomy ISCAS The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
24Hsin-Wen Ting, Cheng-Wu Lin, Bin-Da Liu, Soon-Jyh Chang Oscillator-Based Reconfigurable Sinusoidal Signal Generator for ADC BIST. Search on Bibsonomy J. Electron. Test. The full citation details ... 2007 DBLP  DOI  BibTeX  RDF Reconfigurable oscillator, Sinusoidal signal generator, Sigma-delta modulator
24Erdem Serkan Erdogan, Sule Ozev An ADC-BiST scheme using sequential code analysis. Search on Bibsonomy DATE The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
24Dongmyung Lee, Kwisung Yoo, Kicheol Kim, Gunhee Han, Sungho Kang Code-width testing-based compact ADC BIST circuit. Search on Bibsonomy IEEE Trans. Circuits Syst. II Express Briefs The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
24Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BIST. Search on Bibsonomy J. Electron. Test. The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
24Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell Optimizing Sinusoidal Histogram Test for Low Cost ADC BIST. Search on Bibsonomy J. Electron. Test. The full citation details ... 2001 DBLP  DOI  BibTeX  RDF Built-In Self-Test (BIST), analog and mixed-signal testing, ADC test
24Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell On-chip Generator of a Saw-Tooth Test Stimulus for ADC BIST. Search on Bibsonomy VLSI-SOC The full citation details ... 2001 DBLP  BibTeX  RDF
24Florence Azaïs, Serge Bernard, Y. Betrand, Michel Renovell Towards an ADC BIST scheme using the histogram test technique. Search on Bibsonomy ETW The full citation details ... 2000 DBLP  DOI  BibTeX  RDF
24Michel Renovell, Florence Azaïs, Serge Bernard, Yves Bertrand Hardware Resource Minimization for Histogram-Based ADC BIST. Search on Bibsonomy VTS The full citation details ... 2000 DBLP  DOI  BibTeX  RDF
24Stephen K. Sunter, Naveena Nagi A Simplified Polynomial-Fitting Algorithm for DAC and ADC BIST. Search on Bibsonomy ITC The full citation details ... 1997 DBLP  DOI  BibTeX  RDF
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