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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 11 occurrences of 8 keywords
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Results
Found 28 publication records. Showing 28 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
65 | Yongsheng Wang, Jinxiang Wang 0001, Fengchang Lai, Yizheng Ye |
Optimal Schemes for ADC BIST Based on Histogram. |
Asian Test Symposium |
2005 |
DBLP DOI BibTeX RDF |
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65 | Brendan Mullane, Ciaran MacNamee, Vincent O'Brien, Thomas Fleischmann |
An on-chip solution for static ADC test and measurement. |
ACM Great Lakes Symposium on VLSI |
2009 |
DBLP DOI BibTeX RDF |
ADC-BiST, code histogram, linearity measurements, test, system-on-chip, analog to digital converter |
56 | Hung-Kai Chen 0001, Chih-Hu Wang, Chau-Chin Su |
A Self Calibrated ADC BIST Methodology. |
VTS |
2002 |
DBLP DOI BibTeX RDF |
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38 | Xiankun Jin, Tao Chen 0006, Mayank Jain, Arun Kumar Barman, David Kramer, Doug Garrity, Randall L. Geiger, Degang Chen 0001 |
An on-chip ADC BIST solution and the BIST enabled calibration scheme. |
ITC |
2017 |
DBLP DOI BibTeX RDF |
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34 | Koay Soon Chan, Nuzrul Fahmi Nordin, Kim Chon Chan, Terk Zyou Lok, Chee Wai Yong |
Multi-histogram ADC BIST System for ADC Linearity Testing. |
Asian Test Symposium |
2013 |
DBLP DOI BibTeX RDF |
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30 | Maria Da Gloria Flores, Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin, Felipe R. Clayton, Cristiano Benevento |
Low Cost BIST for Static and Dynamic Testing of ADCs. |
J. Electron. Test. |
2005 |
DBLP DOI BibTeX RDF |
ADC BIST, noise based testing, mixed-signal test |
26 | Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell |
A Low-Cost BIST Architecture for Linear Histogram Testing of ADCs. |
J. Electron. Test. |
2001 |
DBLP DOI BibTeX RDF |
Built-In Self-Test (BIST), analog and mixed-signal testing, ADC test |
24 | Senthil Sivakumar, S. P. Joy Vasantha Rani |
Efficient Design of ADC BIST with an Analog Ramp Signal Generation and Digital Error Estimation. |
J. Circuits Syst. Comput. |
2019 |
DBLP DOI BibTeX RDF |
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24 | Senthil Sivakumar, S. P. Joy Vasantha Rani |
An ADC BIST using on-chip ramp generation and digital ORA. |
Microelectron. J. |
2018 |
DBLP DOI BibTeX RDF |
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24 | Hao Meng, Degang Chen 0001 |
A simple ramp generator with level spreading for SEIR based ADC BIST circuit. |
MWSCAS |
2015 |
DBLP DOI BibTeX RDF |
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24 | Yan Duan, Tao Chen 0006, Zhiqiang Liu, Xu Zhang, Degang Chen 0001 |
High-constancy offset generator robust to CDAC nonlinearity for SEIR-based ADC BIST. |
ISCAS |
2015 |
DBLP DOI BibTeX RDF |
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24 | Matthieu Dubois, Haralampos-G. D. Stratigopoulos, Salvador Mir, Manuel J. Barragán |
Statistical Evaluation of Digital Techniques for $\sum\varDelta$ ADC BIST. |
VLSI-SoC (Selected Papers) |
2014 |
DBLP DOI BibTeX RDF |
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24 | Jingbo Duan, Bharath K. Vasan, Chen Zhao, Degang Chen 0001, Randall L. Geiger |
On Chip Signal Generators for Low Overhead ADC BIST. |
J. Electron. Test. |
2012 |
DBLP DOI BibTeX RDF |
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24 | Jingbo Duan, Degang Chen 0001, Randall L. Geiger |
A low cost method for testing offset and gain error for ADC BIST. |
ISCAS |
2012 |
DBLP DOI BibTeX RDF |
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24 | Jingbo Duan, Degang Chen 0001 |
SNR measurement based on linearity test for ADC BIST. |
ISCAS |
2011 |
DBLP DOI BibTeX RDF |
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24 | An-Sheng Chao, Soon-Jyh Chang, Hsin-Wen Ting |
A SAR ADC BIST for simplified linearity test. |
SoCC |
2011 |
DBLP DOI BibTeX RDF |
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24 | Jingbo Duan, Le Jin, Degang Chen 0001 |
INL based dynamic performance estimation for ADC BIST. |
ISCAS |
2010 |
DBLP DOI BibTeX RDF |
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24 | Jingbo Duan, Degang Chen 0001, Randall L. Geiger |
Phase control of triangular stimulus generator for ADC BIST. |
ISCAS |
2010 |
DBLP DOI BibTeX RDF |
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24 | Jingbo Duan, Degang Chen 0001, Randall L. Geiger |
Cost Effective Signal Generators for ADC BIST. |
ISCAS |
2009 |
DBLP DOI BibTeX RDF |
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24 | Hsin-Wen Ting, Cheng-Wu Lin, Bin-Da Liu, Soon-Jyh Chang |
Oscillator-Based Reconfigurable Sinusoidal Signal Generator for ADC BIST. |
J. Electron. Test. |
2007 |
DBLP DOI BibTeX RDF |
Reconfigurable oscillator, Sinusoidal signal generator, Sigma-delta modulator |
24 | Erdem Serkan Erdogan, Sule Ozev |
An ADC-BiST scheme using sequential code analysis. |
DATE |
2007 |
DBLP DOI BibTeX RDF |
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24 | Dongmyung Lee, Kwisung Yoo, Kicheol Kim, Gunhee Han, Sungho Kang |
Code-width testing-based compact ADC BIST circuit. |
IEEE Trans. Circuits Syst. II Express Briefs |
2004 |
DBLP DOI BibTeX RDF |
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24 | Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell |
On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BIST. |
J. Electron. Test. |
2003 |
DBLP DOI BibTeX RDF |
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24 | Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell |
Optimizing Sinusoidal Histogram Test for Low Cost ADC BIST. |
J. Electron. Test. |
2001 |
DBLP DOI BibTeX RDF |
Built-In Self-Test (BIST), analog and mixed-signal testing, ADC test |
24 | Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell |
On-chip Generator of a Saw-Tooth Test Stimulus for ADC BIST. |
VLSI-SOC |
2001 |
DBLP BibTeX RDF |
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24 | Florence Azaïs, Serge Bernard, Y. Betrand, Michel Renovell |
Towards an ADC BIST scheme using the histogram test technique. |
ETW |
2000 |
DBLP DOI BibTeX RDF |
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24 | Michel Renovell, Florence Azaïs, Serge Bernard, Yves Bertrand |
Hardware Resource Minimization for Histogram-Based ADC BIST. |
VTS |
2000 |
DBLP DOI BibTeX RDF |
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24 | Stephen K. Sunter, Naveena Nagi |
A Simplified Polynomial-Fitting Algorithm for DAC and ADC BIST. |
ITC |
1997 |
DBLP DOI BibTeX RDF |
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