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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/ErbSSRB14>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bernd_Becker_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dominik_Erb>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Karsten_Scheibler>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Matthias_Sauer_0002>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sudhakar_M._Reddy>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2014.34>
foaf:homepage <https://doi.org/10.1109/ATS.2014.34>
dc:identifier DBLP conf/ats/ErbSSRB14 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2014.34 (xsd:string)
dcterms:issued 2014 (xsd:gYear)
rdfs:label Circuit Parameter Independent Test Pattern Generation for Interconnect Open Defects. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bernd_Becker_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dominik_Erb>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Karsten_Scheibler>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Matthias_Sauer_0002>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sudhakar_M._Reddy>
swrc:pages 131-136 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2014>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/ErbSSRB14/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/ErbSSRB14>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2014.html#ErbSSRB14>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2014.34>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:title Circuit Parameter Independent Test Pattern Generation for Interconnect Open Defects. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document