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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/LiebeltL00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cheng-Chew_Lim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_J._Liebelt>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2000.893669>
foaf:homepage <https://doi.org/10.1109/ATS.2000.893669>
dc:identifier DBLP conf/ats/LiebeltL00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2000.893669 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label A method for determining whether asynchronous circuits are self-checking. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cheng-Chew_Lim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_J._Liebelt>
swrc:pages 472-477 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/LiebeltL00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/LiebeltL00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2000.html#LiebeltL00>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2000.893669>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject asynchronous circuits; low-power electronics; integrated circuit testing; integrated circuit noise; design for testability; fault diagnosis; logic testing; TSC; low power; low noise properties; semi-modular asynchronous circuit; testability; totally self-checking; output stuck-at-faults (xsd:string)
dc:title A method for determining whether asynchronous circuits are self-checking. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document