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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isvlsi/LiTLPTO18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/I-Lun_Tseng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Valerio_Perez>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vikas_Tripathi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yongfu_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yoong_Seang_Jonathan_Ong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhao_Chuan_Lee>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISVLSI.2018.00082>
foaf:homepage <https://doi.org/10.1109/ISVLSI.2018.00082>
dc:identifier DBLP conf/isvlsi/LiTLPTO18 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISVLSI.2018.00082 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
rdfs:label Identifying Lithography Weak-Points of Standard Cells with Partial Pattern Matching. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/I-Lun_Tseng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Valerio_Perez>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vikas_Tripathi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yongfu_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yoong_Seang_Jonathan_Ong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhao_Chuan_Lee>
swrc:pages 417-422 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/isvlsi/2018>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/isvlsi/LiTLPTO18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/isvlsi/LiTLPTO18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/isvlsi/isvlsi2018.html#LiTLPTO18>
rdfs:seeAlso <https://doi.org/10.1109/ISVLSI.2018.00082>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isvlsi>
dc:title Identifying Lithography Weak-Points of Standard Cells with Partial Pattern Matching. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document