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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/BurchardERSB18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Adit_D._Singh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bernd_Becker_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dominik_Erb>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jan_Burchard>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sudhakar_M._Reddy>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCAD.2017.2772825>
foaf:homepage <https://doi.org/10.1109/TCAD.2017.2772825>
dc:identifier DBLP journals/tcad/BurchardERSB18 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCAD.2017.2772825 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label On the Generation of Waveform-Accurate Hazard and Charge-Sharing Aware Tests for Transistor Stuck-Off Faults in CMOS Logic Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Adit_D._Singh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bernd_Becker_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dominik_Erb>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jan_Burchard>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sudhakar_M._Reddy>
swrc:number 10 (xsd:string)
swrc:pages 2152-2165 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/BurchardERSB18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/BurchardERSB18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad37.html#BurchardERSB18>
rdfs:seeAlso <https://doi.org/10.1109/TCAD.2017.2772825>
dc:title On the Generation of Waveform-Accurate Hazard and Charge-Sharing Aware Tests for Transistor Stuck-Off Faults in CMOS Logic Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 37 (xsd:string)