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Publications at "Asian Test Symposium"( http://dblp.L3S.de/Venues/Asian_Test_Symposium )

URL (DBLP): http://dblp.uni-trier.de/db/conf/ats

Publication years (Num. hits)
1995 (60) 1996 (50) 1997 (67) 1998 (92) 1999 (61) 2000 (84) 2001 (80) 2002 (73) 2003 (100) 2004 (75) 2005 (110) 2009 (77) 2010 (75) 2011 (93) 2012 (74) 2013 (55)
Publication types (Num. hits)
inproceedings(1210) proceedings(16)
Venues (Conferences, Journals, ...)
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Found 1226 publication records. Showing 1226 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
1Koji Yamazaki, Toshiyuki Tsutsumi, Hiroshi Takahashi, Yoshinobu Higami, Hironobu Yotsuyanagi, Masaki Hashizume, Kewal K. Saluja Diagnosing Resistive Open Faults Using Small Delay Fault Simulation. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Yingchieh Ho, Katherine Shu-Min Li, Sying-Jyan Wang Leakage Monitoring Technique in Near-Threshold Systems with a Time-Based Bootstrapped Ring Oscillator. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Koay Soon Chan, Nuzrul Fahmi Nordin, Kim Chon Chan, Terk Zyou Lok, Chee Wai Yong Multi-histogram ADC BIST System for ADC Linearity Testing. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Yasuo Sato, Seiji Kajihara A Stochastic Model for NBTI-Induced LSI Degradation in Field. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Masaki Hashizume, Tomoaki Konishi, Hiroyuki Yotsuyanagi, Shyue-Kung Lu Testable Design for Electrical Testing of Open Defects at Interconnects in 3D ICs. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Yuki Fukazawa, Tsuyoshi Iwagaki, Hideyuki Ichihara, Tomoo Inoue A Transient Fault Tolerant Test Pattern Generator for On-line Built-in Self-Test. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Chin Hai Ang Single Test Clock with Programmable Clock Enable Constraints for Multi-clock Domain SoC ATPG Testing. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Chi-Chun Yang, Che-Wei Chou, Jin-Fu Li A TSV Repair Scheme Using Enhanced Test Access Architecture for 3-D ICs. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Peter Sarson, Gregor Schatzberger, Robert Seitz Automotive EEPROM Qualification and Cost Optimization. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Kelson Gent, Michael S. Hsiao Functional Test Generation at the RTL Using Swarm Intelligence and Bounded Model Checking. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Chih-Sheng Hou, Jin-Fu Li Testing Disturbance Faults in Various NAND Flash Memories. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Fang Bao, Mohammad Tehranipoor, Harry Chen Worst-Case Critical-Path Delay Analysis Considering Power-Supply Noise. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Debesh Bhatta, Nicholas Tzou, Sen-Wen Hsiao, Abhijit Chatterjee Time Domain Reconstruction of Incoherently Undersampled Periodic Waveforms Using Bandwidth Interleaving. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Bing-Chuan Bai, Chun-Lung Hsu, Ming-Hsueh Wu, Chen-An Chen, Yee-Wen Chen, Kun-Lun Luo, Liang-Chia Cheng, James Chien-Mo Li Back-End-of-Line Defect Analysis for Rnv8T Nonvolatile SRAM. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Kun-Han Tsai, Xijiang Lin Multicycle-aware At-speed Test Methodology. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Suvadeep Banerjee, Hyun Woo Choi, David C. Keezer, Abhijit Chatterjee Enhanced Resolution Time-Domain Reflectometry for High Speed Channels: Characterizing Spatial Discontinuities with Non-ideal Stimulus. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Amit Kumar 0004, Janusz Rajski, Sudhakar M. Reddy, Thomas Rinderknecht On the Generation of Compact Deterministic Test Sets for BIST Ready Designs. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Ru Yi, Minghui Wu, Koji Asami, Haruo Kobayashi, Ramin Khatami, Atsuhiro Katayama, Isao Shimizu, Kentaroh Katoh Digital Compensation for Timing Mismatches in Interleaved ADCs. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Spencer K. Millican, Kewal K. Saluja Formulating Optimal Test Scheduling Problem with Dynamic Voltage and Frequency Scaling. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh, Krishnendu Chakrabarty A New LFSR Reseeding Scheme via Internal Response Feedback. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Dong Xiang A Cost-Effective Scheme for Network-on-Chip Router and Interconnect Testing. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Da Cheng, Hsunwei Hsiung, Bin Liu 0004, Jianing Chen, Jia Zeng, Ramesh Govindan, Sandeep K. Gupta A New March Test for Process-Variation Induced Delay Faults in SRAMs. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Akihiro Tomita, Xiaoqing Wen, Yasuo Sato, Seiji Kajihara, Patrick Girard 0001, Mohammad Tehranipoor, Laung-Terng Wang On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Shuo-You Hsu, Chih-Hsiang Hsu, Ting-Shuo Hsu, Jing-Jia Liou A Region-Based Framework for Design Feature Identification of Systematic Process Variations. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Ran Wang 0002, Krishnendu Chakrabarty, Bill Eklow Post-bond Testing of the Silicon Interposer and Micro-bumps in 2.5D ICs. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Dominik Erb, Michael A. Kochte, Matthias Sauer 0002, Hans-Joachim Wunderlich, Bernd Becker 0001 Accurate Multi-cycle ATPG in Presence of X-Values. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Elena I. Vatajelu, Luigi Dilillo, Alberto Bosio, Patrick Girard 0001, Aida Todri, Arnaud Virazel, Nabil Badereddine Adaptive Source Bias for Improved Resistive-Open Defect Coverage during SRAM Testing. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Kohei Miyase, Matthias Sauer 0002, Bernd Becker 0001, Xiaoqing Wen, Seiji Kajihara Search Space Reduction for Low-Power Test Generation. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Long-Yi Lin, Hao-Chiao Hong Design of a Fault-Injectable Fleischer-Laker Switched-Capacitor Biquad for Verifying the Static Linear Behavior Fault Model. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Sen-Wen Hsiao, Xian Wang, Abhijit Chatterjee Analog Sensor Based Testing of Phase-Locked Loop Dynamic Performance Parameters. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Xian Wang, Blanchard Kenfack, Estella Silva, Abhijit Chatterjee Built-In Test of Switched-Mode Power Converters: Avoiding DUT Damage Using Alternative Safe Measurements. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Hsunwei Hsiung, Da Cheng, Bin Liu 0004, Ramesh Govindan, Sandeep K. Gupta Interplay of Failure Rate, Performance, and Test Cost in TCAM under Process Variations. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Masafumi Nikaido, Yukihisa Funatsu, Tetsuya Seiyama, Junpei Nonaka, Kazuki Shigeta Failure Localization of Logic Circuits Using Voltage Contrast Considering State of Transistors. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Tong-Yu Hsieh, Yi-Han Peng, Chia-Chi Ku An Efficient Test Methodology for Image Processing Applications Based on Error-Tolerance. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Paolo Bernardi, Lyl M. Ciganda, Matteo Sonza Reorda, Said Hamdioui An Efficient Method for the Test of Embedded Memory Cores during the Operational Phase. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1J. Jiang, M. Aparicio, Mariane Comte, Florence Azaïs, Michel Renovell, Ilia Polian MIRID: Mixed-Mode IR-Drop Induced Delay Simulator. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Rafal Baranowski, Michael A. Kochte, Hans-Joachim Wunderlich Securing Access to Reconfigurable Scan Networks. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Chao Han, Adit D. Singh Hazard Initialized LOC Tests for TDF Undetectable CMOS Open Defects. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Li-Ren Huang, Shi-Yu Huang, Kun-Han Tsai, Wu-Tung Cheng, Stephen K. Sunter Mid-bond Interposer Wire Test. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Jose Moreira, Bernhard Roth, Hubert Werkmann, Lars Klapproth, Michael Howieson, Mark Broman, Wend Ouedraogo, Mitchell Lin An Active Test Fixture Approach for 40 Gbps and Above At-Speed Testing Using a Standard ATE System. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Jifeng Chen, Mohammad Tehranipoor Critical Paths Selection and Test Cost Reduction Considering Process Variations. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Shyue-Kung Lu, Hao-Cheng Jheng, Masaki Hashizume, Jiun-Lang Huang, Pony Ning Fault Scrambling Techniques for Yield Enhancement of Embedded Memories. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1 22nd Asian Test Symposium, ATS 2013, Yilan County, Taiwan, November 18-21, 2013 Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  BibTeX  RDF
1Hsun-Cheng Lee, Jacob A. Abraham Digital Calibration for 8-Bit Delay Line ADC Using Harmonic Distortion Correction. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Kentaroh Katoh, Yuta Doi, Satoshi Ito, Haruo Kobayashi, Ensi Li, Nobukazu Takai An Analysis of Stochastic Self-Calibration of TDC Using Two Ring Oscillators. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Stephan Eggersglüß Peak Capture Power Reduction for Compact Test Sets Using Opt-Justification-Fill. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Yanhong Zhou, Tiancheng Wang, Tao Lv 0001, Huawei Li, Xiaowei Li 0001 Path Constraint Solving Based Test Generation for Hard-to-Reach States. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Bing-Yang Lin, Mincent Lee, Cheng-Wen Wu Exploration Methodology for 3D Memory Redundancy Architectures under Redundancy Constraints. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Arpita Dutta, Subhadip Kundu, Santanu Chattopadhyay Thermal Aware Don't Care Filling to Reduce Peak Temperature and Thermal Variance during Testing. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Guoliang Li, Jun Qian, Yuan Zuo, Rui Li, Qinfu Yang Scan Test Data Volume Reduction for SoC Designs in EDT Environment. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Katherine Shu-Min Li, Cheng-You Ho, Ruei-Ting Gu, Sying-Jyan Wang, Yingchieh Ho, Jiun-Jie Huang, Bo-Chuan Cheng, An-Ting Liu A Layout-Aware Test Methodology for Silicon Interposer in System-in-a-Package. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Chen-An Chen, Yee-Wen Chen, Chun-Lung Hsu, Ming-Hsueh Wu, Kun-Lun Luo, Bing-Chuan Bai, Liang-Chia Cheng Cost-Effective TAP-Controlled Serialized Compressed Scan Architecture for 3D Stacked ICs. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Fangming Ye, Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu Handling Missing Syndromes in Board-Level Functional-Fault Diagnosis. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Chi-Jih Shih, Shih-An Hsieh, Yi-Chang Lu, James Chien-Mo Li, Tzong-Lin Wu, Krishnendu Chakrabarty Test Generation of Path Delay Faults Induced by Defects in Power TSV. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Wooheon Kang, Changwook Lee, Keewon Cho, Sungho Kang A Die Selection and Matching Method with Two Stages for Yield Enhancement of 3-D Memories. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Shyue-Kung Lu, Tsu-Lin Li, Pony Ning Scrambling and Data Inversion Techniques for Yield Enhancement of NROM-Based ROMs. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Xiaoxin Fan, Manish Sharma, Wu-Tung Cheng, Sudhakar M. Reddy Diagnosis of Cell Internal Defects with Multi-cycle Test Patterns. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Y.-H. Chou, J.-L. Huang, X.-L. Huang A Built-In Characterization Technique for 1-Bit/Stage Pipelined ADC. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Yasuo Sato, Senling Wang, Takaaki Kato, Kohei Miyase, Seiji Kajihara Low Power BIST for Scan-Shift and Capture Power. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Satoshi Jo, Takeshi Matsumoto, Masahiro Fujita SAT-Based Automatic Rectification and Debugging of Combinational Circuits with LUT Insertions. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Takahiro J. Yamaguchi Session Summary IV: Post-Silicon Measurements and Tests: Analog Test and High-Speed I/O Test II. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Jun Qian A Few Design Techniques for the "Dependability" of a SOC. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Byeongju Cha, Sandeep K. Gupta Efficient Trojan Detection via Calibration of Process Variations. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Toru Nakura, Tetsuya Iizuka, Kunihiro Asada Impact of All-Digital PLL on SoC Testing. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard 0001, Aida Todri, G. Prenat, Jérémy Alvarez-Herault, Ken Mackay Impact of Resistive-Bridge Defects in TAS-MRAM Architectures. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Sergej Deutsch, Krishnendu Chakrabarty, Shreepad Panth, Sung Kyu Lim TSV Stress-Aware ATPG for 3D Stacked ICs. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Nobutaka Takahashi, Toshiaki Watanabe, Takehisa Suzuki, Manabu Kimura Portable/Desktop Testing Solution for Engineering with Cloud. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Islam A. K. M. Mahfuzul, Hidetoshi Onodera On-Chip Detection of Process Shift and Process Spread for Silicon Debugging and Model-Hardware Correlation. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima, Masahiro Takakura An Effective At-Speed Scan Testing Approach Using Multiple-Timing Clock Waveforms. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Jose Moreira Design of a High Bandwidth Interposer for Performance Evaluation of ATE Test Fixtures at the DUT Socket. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Jun-Hua Kuo, Ting-Shuo Hsu, Jing-Jia Liou Test Cost Reduction for Performance Yield Recovery by Classification of Multiple-Clock Test Data. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Spencer K. Millican, Kewal K. Saluja Linear Programming Formulations for Thermal-Aware Test Scheduling of 3D-Stacked Integrated Circuits. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Debasis Mitra 0002, Sarmishtha Ghoshal, Hafizur Rahaman, Krishnendu Chakrabarty, Bhargab B. Bhattacharya On-Line Error Detection in Digital Microfluidic Biochips. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012 Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  BibTeX  RDF
1Xiaoqing Wen, Sudhakar M. Reddy Session Summary III: Power-Aware Testing: Present and Future. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Xijiang Lin, Janusz Rajski On Utilizing Test Cube Properties to Reduce Test Data Volume Further. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Yu-Hsiang Lin, Shi-Yu Huang, Kun-Han Tsai, Wu-Tung Cheng Programmable Leakage Test and Binning for TSVs. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu Board-Level Functional Fault Diagnosis Using Learning Based on Incremental Support-Vector Machines. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Miroslav Valka, Alberto Bosio, Luigi Dilillo, Patrick Girard 0001, Aida Todri, Arnaud Virazel, P. Debaud, S. Guilhot Power Supply Noise Sensor Based on Timing Uncertainty Measurements. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Wu-Tung Cheng, Feng-Ming Kuo Embedded Tutorial Summary: Diagnosis for Accelerating Yield and Failure Analysis. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Armin Krieg, Johannes Grinschgl, Christian Steger, Reinhold Weiss, Holger Bock, Josef Haid Hardware-Accelerated Workload Characterization for Power Modeling and Fault Injection. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Yu Hu, Xinli Gu, Xiaowei Li 0001 In-Field Testing of NAND Flash Storage: Why and How? Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Takahiro J. Yamaguchi, Kunihiro Asada, Kiichi Niitsu, Mohamed Abbas, Satoshi Komatsu, Haruo Kobayashi, Jose A. Moreira A New Procedure for Measuring High-Accuracy Probability Density Functions. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Alberto Bosio, Luigi Dilillo, Patrick Girard 0001, Aida Todri, Arnaud Virazel Why and How Controlling Power Consumption during Test: A Survey. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Pranab Roy, Hafizur Rahaman, Parthasarathi Dasgupta, Bhargab B. Bhattacharya A New Look Ahead Technique for Customized Testing in Digital Microfluidic Biochips. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Senling Wang, Yasuo Sato, Kohei Miyase, Seiji Kajihara A Scan-Out Power Reduction Method for Multi-cycle BIST. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Koji Nii, Yasumasa Tsukamoto, Yuichiro Ishii, Makoto Yabuuchi, Hidehiro Fujiwara, Kazuyoshi Okamoto A Test Screening Method for 28 nm HK/MG Single-Port and Dual-Port SRAMs Considering with Dynamic Stability and Read/Write Disturb Issues. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh A Test-Per-Clock LFSR Reseeding Algorithm for Concurrent Reduction on Test Sequence Length and Test Data Volume. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Wei Zhao 0010, Mohammad Tehranipoor PowerMAX: Fast Power Analysis during Test. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Paolo Bernardi, Mauricio de Carvalho, Ernesto Sánchez 0001, Matteo Sonza Reorda, Alberto Bosio, Luigi Dilillo, Patrick Girard 0001, Miroslav Valka Peak Power Estimation: A Case Study on CPU Cores. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Xinli Gu Session Summary V: Is Component Interconnection Test Enough for Board or System Test. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Munetoshi Fukui, Yasuhiko Nara, Junichi Fuse Characteristics Variability Evaluation of Actual LSI Transistors with Nanoprobing. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu Adaptive Board-Level Functional Fault Diagnosis Using Decision Trees. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Jianbo Li, Yu Huang 0005, Wu-Tung Cheng, Chris Schuermyer, Dong Xiang, Eric Faehn, Ruth Farrugia A Hybrid Flow for Memory Failure Bitmap Classification. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Xijiang Lin Power Supply Droop and Its Impacts on Structural At-Speed Testing. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Valerio Guarnieri, Franco Fummi, Krishnendu Chakrabarty Reduced-Complexity Transition-Fault Test Generation for Non-scan Circuits through High-Level Mutant Injection. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Ying Zhang, Ahmed Rezine, Petru Eles, Zebo Peng Automatic Test Program Generation for Out-of-Order Superscalar Processors. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Sanghyeon Baeg, Jongsun Bae, Soonyoung Lee, Chul Seung Lim, Sang Hoon Jeon, Hyeonwoo Nam Soft Error Issues with Scaling Technologies. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Alexander Czutro, Michael E. Imhof, J. Jiang, Abdullah Mumtaz, Matthias Sauer 0002, Bernd Becker 0001, Ilia Polian, Hans-Joachim Wunderlich Variation-Aware Fault Grading. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Guoliang Li, Jun Qian, Peter Li, Greg Zuo Multi-level EDT to Reduce Scan Channels in SoC Designs. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
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