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Publications of "Dominik Erb" ( http://dblp.L3S.de/Authors/Dominik_Erb )

  Author page on DBLP  Author page in RDF  Community of Dominik Erb in ASPL-2

Publication years (Num. hits)
2013-2017 (18) 2018 (2)
Publication types (Num. hits)
article(4) inproceedings(15) phdthesis(1)
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Found 21 publication records. Showing 20 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
1Jan Burchard, Dominik Erb, Sudhakar M. Reddy, Adit D. Singh, Bernd Becker 0001 On the Generation of Waveform-Accurate Hazard and Charge-Sharing Aware Tests for Transistor Stuck-Off Faults in CMOS Logic Circuits. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Jan Burchard, Dominik Erb, Bernd Becker 0001 Characterization of possibly detected faults by accurately computing their detection probability. Search on Bibsonomy DATE The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Pascal Raiola, Jan Burchard, Felix Neubauer, Dominik Erb, Bernd Becker 0001 Evaluating the Effectiveness of D-chains in SAT-based ATPG and Diagnostic TPG. Search on Bibsonomy J. Electronic Testing The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Jan Burchard, Dominik Erb, Adit D. Singh, Sudhakar M. Reddy, Bernd Becker 0001 Fast and waveform-accurate hazard-aware SAT-based TSOF ATPG. Search on Bibsonomy DATE The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Jan Burchard, Felix Neubauer, Pascal Raiola, Dominik Erb, Bernd Becker 0001 Evaluating the effectiveness of D-chains in SAT-based ATPG. Search on Bibsonomy LATS The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Jan Burchard, Dominik Erb, Sudhakar M. Reddy, Adit D. Singh, Bernd Becker 0001 Efficient SAT-based generation of hazard-activated TSOF tests. Search on Bibsonomy VTS The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Pascal Raiola, Dominik Erb, Sudhakar M. Reddy, Bernd Becker 0001 Accurate Diagnosis of Interconnect Open Defects Based on the Robust Enhanced Aggressor Victim Model. Search on Bibsonomy VLSI Design The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Karsten Scheibler, Dominik Erb, Bernd Becker 0001 Accurate CEGAR-based ATPG in presence of unknown values for large industrial designs. Search on Bibsonomy DATE The full citation details ... 2016 DBLP  BibTeX  RDF
1Dominik Erb, Karsten Scheibler, Michael A. Kochte, Matthias Sauer 0002, Hans-Joachim Wunderlich, Bernd Becker 0001 Mixed 01X-RSL-Encoding for fast and accurate ATPG with unknowns. Search on Bibsonomy ASP-DAC The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Karsten Scheibler, Dominik Erb, Bernd Becker 0001 Applying Tailored Formal Methods to X-ATPG. Search on Bibsonomy MBMV The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Dominik Erb On the handling of uncertainty in test pattern generation. Search on Bibsonomy 2016   RDF
1Dominik Erb, Michael A. Kochte, Sven Reimer, Matthias Sauer 0002, Hans-Joachim Wunderlich, Bernd Becker 0001 Accurate QBF-Based Test Pattern Generation in Presence of Unknown Values. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Karsten Scheibler, Dominik Erb, Bernd Becker 0001 Improving test pattern generation in presence of unknown values beyond restricted symbolic logic. Search on Bibsonomy ETS The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Dominik Erb, Karsten Scheibler, Matthias Sauer 0002, Sudhakar M. Reddy, Bernd Becker 0001 Multi-cycle Circuit Parameter Independent ATPG for interconnect open defects. Search on Bibsonomy VTS The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Dominik Erb, Michael A. Kochte, Matthias Sauer 0002, Stefan Hillebrecht, Tobias Schubert 0001, Hans-Joachim Wunderlich, Bernd Becker 0001 Exact Logic and Fault Simulation in Presence of Unknowns. Search on Bibsonomy ACM Trans. Design Autom. Electr. Syst. The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Dominik Erb, Karsten Scheibler, Matthias Sauer 0002, Bernd Becker 0001 Efficient SMT-based ATPG for interconnect open defects. Search on Bibsonomy DATE The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Dominik Erb, Karsten Scheibler, Matthias Sauer 0002, Sudhakar M. Reddy, Bernd Becker 0001 Circuit Parameter Independent Test Pattern Generation for Interconnect Open Defects. Search on Bibsonomy ATS The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Dominik Erb, Karsten Scheibler, Michael A. Kochte, Matthias Sauer 0002, Hans-Joachim Wunderlich, Bernd Becker 0001 Test pattern generation in presence of unknown values based on restricted symbolic logic. Search on Bibsonomy ITC The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Stefan Hillebrecht, Michael A. Kochte, Dominik Erb, Hans-Joachim Wunderlich, Bernd Becker 0001 Accurate QBF-based test pattern generation in presence of unknown values. Search on Bibsonomy DATE The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Dominik Erb, Michael A. Kochte, Matthias Sauer 0002, Hans-Joachim Wunderlich, Bernd Becker 0001 Accurate Multi-cycle ATPG in Presence of X-Values. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
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