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Publications of "Elham K. Moghaddam" ( http://dblp.L3S.de/Authors/Elham_K._Moghaddam )

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Publication years (Num. hits)
2007-2017 (15) 2018 (1)
Publication types (Num. hits)
article(4) inproceedings(12)
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Found 17 publication records. Showing 16 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
1Michael Chen, Elham K. Moghaddam, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer, Justyna Zawada Hardware Protection via Logic Locking Test Points. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Cesar Acero, Derek Feltham, Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee 0001, Marek Patyra, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Justyna Zawada Embedded Deterministic Test Points. Search on Bibsonomy IEEE Trans. VLSI Syst. The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Cesar Acero, Derek Feltham, Marek Patyra, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee 0001, Vidya Neerkundar, Janusz Rajski, Jerzy Tyszer, Justyna Zawada On New Test Points for Compact Cell-Aware Tests. Search on Bibsonomy IEEE Design & Test The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Elham K. Moghaddam, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer, Justyna Zawada On Test Points Enhancing Hardware Security. Search on Bibsonomy ATS The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee 0001, Sudhakar M. Reddy, Janusz Rajski, Jerzy Tyszer Minimal area test points for deterministic patterns. Search on Bibsonomy ITC The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Elham K. Moghaddam, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer, Justyna Zawada Test point insertion in hybrid test compression/LBIST architectures. Search on Bibsonomy ITC The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Amit Kumar 0004, Mark Kassab, Elham K. Moghaddam, Nilanjan Mukherjee 0001, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Chen Wang 0014 Isometric Test Data Compression. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Haluk Konuk, Elham K. Moghaddam, Nilanjan Mukherjee 0001, Janusz Rajski, Deepak Solanki, Jerzy Tyszer, Justyna Zawada Design for low test pattern counts. Search on Bibsonomy DAC The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Cesar Acero, Derek Feltham, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee 0001, Vidya Neerkundar, Marek Patyra, Janusz Rajski, Jerzy Tyszer, Justyna Zawada Embedded deterministic test points for compact cell-aware tests. Search on Bibsonomy ITC The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Amit Kumar 0004, Mark Kassab, Elham K. Moghaddam, Nilanjan Mukherjee 0001, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Chen Wang 0014 Isometric test compression with low toggling activity. Search on Bibsonomy ITC The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Xijiang Lin, Elham K. Moghaddam, Nilanjan Mukherjee 0001, Benoit Nadeau-Dostie, Janusz Rajski, Jerzy Tyszer Power Aware Embedded Test. Search on Bibsonomy Asian Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Jakub Janicki Low Test Data Volume Low Power At-Speed Delay Tests Using Clock-Gating. Search on Bibsonomy Asian Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Janusz Rajski, Elham K. Moghaddam, Sudhakar M. Reddy Low power compression utilizing clock-gating. Search on Bibsonomy ITC The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Mark Kassab At-speed scan test with low switching activity. Search on Bibsonomy VTS The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Xijiang Lin, Nilanjan Mukherjee 0001, Mark Kassab Low capture power at-speed test in EDT environment. Search on Bibsonomy ITC The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Elham K. Moghaddam, Shaahin Hessabi An On-Line BIST Technique for Stuck-Open Fault Detection in CMOS Circuits. Search on Bibsonomy DSD The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
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