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Publications at "European Test Symposium"( http://dblp.L3S.de/Venues/European_Test_Symposium )

URL (DBLP): http://dblp.uni-trier.de/db/conf/ets

Publication years (Num. hits)
2004 (27) 2005 (36) 2006 (40) 2007 (35) 2008 (31) 2009 (27) 2010 (65) 2011 (53) 2012 (57)
Publication types (Num. hits)
inproceedings(362) proceedings(9)
Venues (Conferences, Journals, ...)
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The graphs summarize 199 occurrences of 154 keywords

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Found 371 publication records. Showing 371 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
1Fábio P. Itturriet, Ronaldo Rodrigues Ferreira, Luigi Carro Fault-Tolerant Algebraic Architecture for radiation induced soft-errors. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Vasilis F. Pavlidis, Hu Xu, Giovanni De Micheli Enhanced wafer matching heuristics for 3-D ICs. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Paolo Bernardi, Lyl M. Ciganda, Mauricio de Carvalho, Michelangelo Grosso, Jorge Luis Lagos-Benites, Ernesto Sánchez 0001, Matteo Sonza Reorda, Oscar Ballan On-line software-based self-test of the Address Calculation Unit in RISC processors. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Ender Yilmaz, Sule Ozev Adaptive multi-site testing for analog/mixed-signal circuits incorporating neighborhood information. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Jean DaRolt, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre On-chip test comparison for protecting confidential data in secure ICs. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Jaan Raik FP7 collaborative research project DIAMOND: Diagnosis, error modeling and correction for reliable systems design. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Asma Laraba, Haralampos-G. D. Stratigopoulos, Salvador Mir, Hervé Naudet, Christophe Forel Enhanced reduced code linearity test technique for multi-bit/stage pipeline ADCs. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Marco Ottavi Introducing MEDIAN: A new COST Action on manufacturable and dependable multicore architectures at nanoscale. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Stefan Hillebrecht, Michael A. Kochte, Hans-Joachim Wunderlich, Bernd Becker 0001 Exact stuck-at fault classification in presence of unknowns. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Riccardo Mariani The impact of functional safety standards in the design and test of reliable and available integrated circuits. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Cristiana Bolchini, Antonio Miele, Chiara Sandionigi Increasing autonomous fault-tolerant FPGA-based systems' lifetime. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Xinli Gu, Jeff Rearick, Bill Eklow, Martin Keim, Jun Qian, Artur Jutman, Krishnendu Chakrabarty, Erik Larsson Re-using chip level DFT at board level. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard 0001, Aida Todri, Arnaud Virazel, Nabil Badereddine Defect analysis in power mode control logic of low-power SRAMs. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Matthias Sauer 0002, Alexander Czutro, Bernd Becker 0001, Ilia Polian On the quality of test vectors for post-silicon characterization. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Mihalis Psarakis, Andreas Apostolakis Fault tolerant FPGA processor based on runtime reconfigurable modules. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Arvind Jain, Rubin A. Parekhji Time-division multiplexing for testing SoCs with DVS and multiple voltage islands. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Shaji Krishnan, Hans G. Kerkhoff A robust metric for screening outliers from analogue product manufacturing tests responses. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Gabriel L. Nazar, Luigi Carro Fast error detection through efficient use of hardwired resources in FPGAs. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard 0001, Aida Todri, G. Prenat, Jérémy Alvarez-Herault, Ken Mackay Coupling-based resistive-open defects in TAS-MRAM architectures. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Chandra K. H. Suresh, Ozgur Sinanoglu, Sule Ozev Adaptive testing of chips with varying distributions of unknown response bits. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Abishek Ramdas, Ozgur Sinanoglu Toggle-masking scheme for x-filtering. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Q. Wang, Andreas Wallin, Viacheslav Izosimov, Urban Ingelsson, Zebo Peng Test tool qualification through fault injection. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Valentin Gherman, Samuel Evain, Yannick Bonhomme Memory reliability improvements based on maximized error-correcting codes. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Manuel J. Barragan Asian, Gildas Léger, José L. Huertas OBT for settling error test of sampled-data systems using signal-dependent clocking. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Abhishek Jain 0003, Andrea Veggetti, Dennis Crippa, Pierluigi Rolandi On-chip delay measurement circuit. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Piet Engelke, Hermann Obermeir Funding project DIANA - Integrated diagnostics for the analysis of electronic failures in vehicles. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Samah Mohamed Saeed, Ozgur Sinanoglu DfT support for launch and capture power reduction in launch-off-capture testing. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1 17th IEEE European Test Symposium, ETS 2012, Annecy, France, May 28 - June 1 2012 Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  BibTeX  RDF
1Jae Wook Lee, Ji Hwan (Paul) Chun, Jacob A. Abraham Indirect method for random jitter measurement on SoCs using critical path characterization. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Artur Jutman, Sergei Devadze, Igor Aleksejev, Thomas Wenzel Embedded synthetic instruments for Board-Level testing. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Mohamed Tagelsir Mohammadat, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin Multi-voltage aware resistive open fault modeling. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Jörg Henkel, Oliver Bringmann 0001, Andreas Herkersdorf, Wolfgang Rosenstiel, Norbert Wehn Dependable embedded systems: The German research foundation DFG priority program SPP 1500. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Syed Zafar Shazli, Mehdi Baradaran Tahoori Online detection and recovery of transient errors in front-end structures of microprocessors. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Irith Pomeranz On the detection of path delay faults by functional broadside tests. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Chih-Sheng Hou, Jin-Fu Li Disturbance fault testing on various NAND flash memories. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Mahesh Prabhu, Jacob A. Abraham Functional test generation for hard to detect stuck-at faults using RTL model checking. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Carolina Metzler, Aida Todri, Alberto Bosio, Luigi Dilillo, Patrick Girard 0001, Arnaud Virazel Through-Silicon-Via resistive-open defect analysis. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Stefanos Valadimas, Yiorgos Tsiatouhas, Angela Arapoyanni Cost and power efficient timing error tolerance in flip-flop based microprocessor cores. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Cândido Duarte, Henrique Cavadas, Pedro Coke, Luis Malheiro, Vítor Grade Tavares, Pedro Guedes de Oliveira BIST design for analog cell matching. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Fabian Oboril, Mehdi Baradaran Tahoori Reducing wearout in embedded processors using proactive fine-grain dynamic runtime adaptation. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Zhengliang Lv, Linda Milor, Shiyuan Yang Impact of NBTI on analog components. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Zhaobo Zhang, Xinli Gu, Yaohui Xie, Zhiyuan Wang, Zhanglei Wang, Krishnendu Chakrabarty Diagnostic system based on support-vector machines for board-level functional diagnosis. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Mohamed Azimane Reducing test cost for mixed signal circuits "From TOETS to ELESIS". Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Mehdi Dehbashi, Görschwin Fey, Kaushik Roy 0001, Anand Raghunathan Functional analysis of circuits under timing variations. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Jakub Janicki, Jerzy Tyszer, Grzegorz Mrugalski, Janusz Rajski Bandwidth-aware test compression logic for SoC designs. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Said Hamdioui, Rob Aitken VLSI Test technology: Why is the field not sexy enough? Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Nadereh Hatami, Rafal Baranowski, Paolo Prinetto, Hans-Joachim Wunderlich Efficient system-level aging prediction. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Armin Krieg, Johannes Grinschgl, Christian Steger, Reinhold Weiss, Andreas Genser, Holger Bock, Josef Haid Characterization and handling of low-cost micro-architectural signatures in MPSoCs. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Friedrich Hapke, Jürgen Schlöffel Introduction to the defect-oriented cell-aware test methodology for significant reduction of DPPM rates. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Aritra Banerjee, Shyam Kumar Devarakond, Shreyas Sen, Debashis Banerjee, Abhijit Chatterjee Testing of digitally assisted adaptive analog/RF systems using tuning knob - Performance space estimation. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Alexander Czutro, Matthias Sauer 0002, Ilia Polian, Bernd Becker 0001 Multi-conditional SAT-ATPG for power-droop testing. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Alejandro Cook, Sybille Hellebrand, Hans-Joachim Wunderlich Built-in self-diagnosis exploiting strong diagnostic windows in mixed-mode test. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Xiaoqing Wen Power-aware testing: The next stage. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1George Theodorou, Serafeim Chatzopoulos, Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos A Software-Based Self-Test methodology for on-line testing of data TLBs. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Urmas Repinski, Hanno Hantson, Maksim Jenihhin, Jaan Raik, Raimund Ubar, Giuseppe Di Guglielmo, Graziano Pravadelli, Franco Fummi Combining dynamic slicing and mutation operators for ESL correction. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Yukiya Miura, Yasuo Sato, Yousuke Miyake, Seiji Kajihara On-chip temperature and voltage measurement for field testing. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Ender Yilmaz, Sule Ozev, Ozgur Sinanoglu, Peter C. Maxwell Adaptive testing: Conquering process variations. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Michael Nicolaidis, Vladimir Pasca, Lorena Anghel I-BIRAS: Interconnect Built-In Self-Repair and Adaptive Serialization in 3D Integrated Systems. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Nicola Bombieri, Franco Fummi, Valerio Guarnieri Accelerating RTL Fault Simulation through RTL-to-TLM Abstraction. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF RTL fault simulation, fault simulation acceleration, RTL-to-TLM abstraction
1Masoud Zamani, Navid Farazmand, Mehdi Baradaran Tahoori Fault Masking and Diagnosis in Reversible Circuits. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF Majority voter, Reversible logic, Fault masking
1Harm C. M. Bossers, Johann Hurink, Gerard J. M. Smit Online Univariate Outlier Detection in Final Test: A Robust Rolling Horizon Approach. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF online outlier detection, final test, robust
1Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer Reduced ATE Interface for High Test Data Compression. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF channel bandwidth management, embedded deterministic test, test interface, tri-modal compression, test data compression, scan-based designs
1Mottaqiallah Taouil, Said Hamdioui Layer Redundancy Based Yield Improvement for 3D Wafer-to-Wafer Stacked Memories. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF 3D stacked-IC, memory redundancy, 3D memory, yield enhancement
1Stephen K. Sunter, Aubin Roy A Mixed-Signal Test Bus and Analog BIST with 'Unlimited' Time and Voltage Resolution. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF mixed-signal DFT, analog bus, mixed-signal BIST
1Jaan Raik, Anna Rannaste, Maksim Jenihhin, Taavi Viilukas, Raimund Ubar, Hideo Fujiwara Constraint-Based Hierarchical Untestability Identification for Synchronous Sequential Circuits. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Massoud Mokhtarpour Ghahroodi, Mark Zwolinski, Rick Wong, Shi-Jie Wen Timing Vulnerability Factors of Ultra Deep-sub-micron CMOS. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Sandra Irobi, Zaid Al-Ars, Said Hamdioui Memory Test Optimization for Parasitic Bit Line Coupling in SRAMs. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF Parasitic Bit Line coupling, SRAMs, Memory tests
1Chun-Chuan Chi, Erik Jan Marinissen, Sandeep Kumar Goel, Cheng-Wen Wu DfT Architecture for 3D-SICs with Multiple Towers. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF three-dimensional stacking, 3D-SIC, multi-tower, DfT, wrapper, design-for-test, TSV, through-silicon via
1Mauro Scandiuzzo, Salvatore Cani, Luca Perugini, Simone Spolzino, Roberto Canegallo, Luca Perilli, Roberto Cardu, Eleonora Franchi, C. Gozzi, F. Maggioni Input/Output Pad for Direct Contact and Contactless Testing. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF wireless probing, I/O, SiP, capacitive coupling
1Alessandro Cilardo, Carmelo Lofiego, Antonino Mazzeo, Nicola Mazzocca Revisiting Application-Dependent Test for FPGA Devices. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF Application-Dependent test, FPGA test
1Michail Maniatakos, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris AVF Analysis Acceleration via Hierarchical Fault Pruning. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Esa Korhonen, Juha Kostamovaara Memory Optimized Two-Stimuli INL Test Method for DAC-ADC Pairs. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF didital-analog conversion, algorithms, testing, histograms, linearity, analog-digital conversion
1Tomokazu Yoneda, Makoto Nakao, Michiko Inoue, Yasuo Sato, Hideo Fujiwara Temperature-Variation-Aware Test Pattern Optimization. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Feng Yuan, Xiao Liu 0011, Qiang Xu 0001 On High-Quality Test Pattern Selection and Manipulation. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF Pseudo-functional testing, test overkill, test escape, test pattern selection
1Miroslav Valka, Alberto Bosio, Luigi Dilillo, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel, Ernesto Sánchez 0001, Mauricio de Carvalho, Matteo Sonza Reorda A Functional Power Evaluation Flow for Defining Test Power Limits during At-Speed Delay Testing. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF At-speed delay fault testing, Power-aware Testing, Functional power
1Xuan-Lun Huang, Ping-Ying Kang, Jiun-Lang Huang, Yung-Fa Chou, Yung-Pin Lee, Ding-Ming Kwai A Pre- and Post-bond Self-Testing and Calibration Methodology for SAR ADC Array in 3-D CMOS Imager. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF 3-D IC testing, calibration-oriented testing, pre-, post-bond testing, SAR ADC, mixed-signal testing
1Jean DaRolt, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre Scan Attacks and Countermeasures in Presence of Scan Response Compactors. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF scan-based attack, security, testability, response compaction
1 16th European Test Symposium, ETS 2011, Trondheim, Norway, May 23-27, 2011 Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  BibTeX  RDF
1Ender Yilmaz, Sule Ozev Fast and Accurate DPPM Computation Using Model Based Filtering. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF DPPM, Analog/Mixed Signal, Simulation, Importance sampling, Test Quality
1Aritra Banerjee, Subho Chatterjee, Azad Naeemi, Abhijit Chatterjee Power Aware Post-manufacture Tuning of Analog Nanocircuits. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Dhiego Silva, K. Stangherlin, Letícia Maria Veiras Bolzani, Fabian Vargas A Hardware-Based Approach for Fault Detection in RTOS-Based Embedded Systems. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF Hardware-Based Approach, RTOS
1Uros Legat, Anton Biasizzo, Franc Novak FPGA Soft Error Recovery Mechanism with Small Hardware Overhead. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Irith Pomeranz On Transition Fault Diagnosis Using Multicycle At-Speed Broadside Tests. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF Broadside tests, multicycle tests, fault diagnosis, transition faults
1Yoshinobu Higami, Hiroshi Takahashi, Shin-ya Kobayashi, Kewal K. Saluja Enhancement of Clock Delay Faults Testing. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF Clock line, Test Generation, Delay faults
1Afsaneh Nassery, Sule Ozev, Marian Verhelst, Mustapha Slamani Extraction of EVM from Transmitter System Parameters. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Alejandro Cook, Melanie Elm, Hans-Joachim Wunderlich, Ulrich Abelein Structural In-Field Diagnosis for Random Logic Circuits. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF In-field diagnosis, Built-In Self-Diagnosis
1Shaji Krishnan, Hans G. Kerkhoff A Robust Metric for Screening Outliers from Analogue Product Manufacturing Tests Responses. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF Analogue, Reliability, Test, Outliers, Mahalanobis distance
1Viacheslav Izosimov, Michele Lora, Graziano Pravadelli, Franco Fummi, Zebo Peng, Giuseppe Di Guglielmo, Masahiro Fujita Optimization of Assertion Placement in Time-Constrained Embedded Systems. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF time-constrained embedded systems, soft errors, executable assertions
1Atefe Dalirsani, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich Structural Test for Graceful Degradation of NoC Switches. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF Logic Diagnosis, Performability, Network-on-Chip, Graceful Degradation
1Stelios Neophytou, Kyriakos Christou, Maria K. Michael An Approach for Quantifying Path Correlation in Digital Circuits without any Path or Segment Enumeration. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF zero-supressed binary decision diagrams, digital circuits, path similarity
1Alexandru Paler, Armin Alaghi, Ilia Polian, John P. Hayes Tomographic Testing and Validation of Probabilistic Circuits. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF Probabilistic testing, quantum computing
1Anelise Kologeski, Caroline Concatto, Luigi Carro, Fernanda Lima Kastensmidt Improving Reliability in NoCs by Application-Specific Mapping Combined with Adaptive Fault-Tolerant Method in the Links. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF Data Splitting, Fault Tolerance, Mapping, Adaptive Routing, Links, NoCs
1Fang Bao, Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, LeRoy Winemberg, Mohammad Tehranipoor Critical Fault-Based Pattern Generation for Screening SDDs. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Yukiya Miura Dual Edge Triggered Flip-Flops for Noise Aware Design. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF data signal, dependable design, edge triggered flip-flop, noise, synchronous circuits
1Hongxia Fang, Zhiyuan Wang, Xinli Gu, Krishnendu Chakrabarty Ranking of Suspect Faulty Blocks Using Dataflow Analysis and Dempster-Shafer Theory for the Diagnosis of Board-Level Functional Failures. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Nuno Alves, Yiwen Shi, Nicholas Imbriglia, Jennifer Dworak, Kundan Nepal, R. Iris Bahar Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF on-chip diagnosis, test set selection, Logic Implications
1Dongsoo Lee, Kaushik Roy 0001 Viterbi-Based Efficient Test Data Compression. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF On-Chip Decompressor, Scalability, Logic Test, Test Data Compression, Low-Power Test
1Hai Yu, Michael Nicolaidis, Lorena Anghel, Nacer-Eddine Zergainoh Efficient Fault Detection Architecture Design of Latch-Based Low Power DSP/MCU Processor. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF GRAAL, fault detection, DSP, soft error, SETs
1Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer Diagnosis of Failing Scan Cells through Orthogonal Response Compaction. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Zhaobo Zhang, Xrysovalantis Kavousianos, Yan Luo, Yiorgos Tsiatouhas, Krishnendu Chakrabarty Signature Analysis for Testing, Diagnosis, and Repair of Multi-mode Power Switches. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF Multi-Mode Power Switches, DFT for Multicore Chips, Static Power Management, Testing, Voltage-Control Oscillator
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