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Results
Found 1119 publication records. Showing 1119 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Cullen E. Bash, Kirk Bresniker, Paolo Faraboschi, Tiffani Jarnigan, Dejan S. Milojicic, Pam Wood |
Ethics in Sustainability.  |
IEEE Des. Test  |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Sayed Ahmad Salehi |
Area-Efficient LFSR-Based Stochastic Number Generators With Minimum Correlation. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
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| 1 | Alexandre Joannou, Peter Rugg, Jonathan Woodruff, Franz A. Fuchs, Marno van der Maas, Matthew Naylor, Michael Roe, Robert N. M. Watson, Peter G. Neumann, Simon W. Moore |
Randomized Testing of RISC-V CPUs Using Direct Instruction Injection. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Irith Pomeranz |
Conventional Tests for Approximate Scan Logic. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Evangeline F. Y. Young |
Recap of the 42nd Edition of the International Conference on Computer- Aided Design (ICCAD 2023). |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
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| 1 | Anish Krishnakumar, Hanguang Yu, Tutu Ajayi, A. Alper Goksoy, Vishrut Pandey, Joshua Mack, Md Sahil Hassan, Kuan-Yu Chen, Chaitali Chakrabarti, Daniel W. Bliss, Ali Akoglu, Hun-Seok Kim, Ronald G. Dreslinski, David T. Blaauw, Ümit Y. Ogras |
FALCON: An FPGA Emulation Platform for Domain-Specific SoCs (DSSoCs). |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
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| 1 | Shuwen Deng, Wenjie Xiong 0001, Jakub Szefer |
Designing Secure TLBs. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
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| 1 | Yuxuan Pan, Zhonghua Zhou, S. Arash Sheikholeslam, André Ivanov |
VioNet: A Hierarchical Detailed Routing Wire-Short Violation Predictor Based on a Convolutional Neural Network. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Sudeep Pasricha, Marilyn Wolf |
Ethical Design of Computers: From Semiconductors to IoT and Artificial Intelligence. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Naghmeh Karimi |
The 28th IEEE European Test Symposium. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
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| 1 | Taewhan Kim |
Recap of the 29th Edition of the Asia and South Pacific Design Automation Conference (ASPDAC 2024). |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Partha Pratim Pande |
Robust and Secure Systems. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
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| 1 | Mahendra Rathor, Girraj Prasad Rathor |
Hard-Sign: A Hardware Watermarking Scheme Using Dated Handwritten Signature. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Philip Koopman, William H. Widen |
Safety Ethics for Design and Test of Automated Driving Features. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Xiaobo Sharon Hu, Alain Girault, Heiko Falk |
Report on the 2023 Embedded Systems Week (ESWEEK). |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Arun Joseph, Pretty Mariam Jacob, Matthias Klein, Wolfgang Roesner |
Efficient Aspect Verification and Debugging of High-Performance Microprocessor Designs. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Scott Davidson 0001 |
Predictions. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Partha Pratim Pande |
Ethics in Computing. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Dina A. Moussa, Michael Hefenbrock, Mehdi B. Tahoori |
Testing for Multiple Faults in Deep Neural Networks. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Zain Ul Abideen 0002, Rui Wang, Tiago Diadami Perez, Geert Jan Schrijen, Samuel Pagliarini |
Impact of Orientation on the Bias of SRAM-Based PUFs. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Pietro Inglese, Elena Ioana Vatajelu, Giorgio Di Natale |
Side Channel and Fault Analyses on Memristor-Based Logic In-Memory. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Partha Pratim Pande |
Special Issue on the 2021 Workshop on Top Picks in Hardware and Embedded Security. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Zhan Gao, Min-Chun Hu 0002, Rogier Baert, Bilal Chehab, Joe Swenton, Santosh Malagi, Jos Huisken, Kees Goossens, Erik Jan Marinissen |
Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Craig Partridge, Moti Gorin, Eric Easley, Jesse Gray |
Five Years Teaching Ethics and Computing. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Scott Davidson 0001 |
Losing My Memory. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Huili Chen, Cheng Fu, Bita Darvish Rouhani, Jishen Zhao, Farinaz Koushanfar |
Intellectual Property Protection of Deep-Learning Systems via Hardware/Software Co-Design. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Sudeep Pasricha, Marilyn Wolf |
Special Issue on Ethics in Computing. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Axel Jantsch, Swaroop Ghosh, Ümit Y. Ogras, Pascal Meinerzhagen |
ISLPED 2023: International Symposium on Low-Power Electronics and Design. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Stjepan Picek, Annelie Heuser, Alan Jovic, Shivam Bhasin, Francesco Regazzoni 0001 |
Tipping the Balance: Imbalanced Classes in Deep-Learning Side-Channel Analysis. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Prabuddha Chakraborty, Jonathan Cruz 0001, Rasheed Almawzan, Tanzim Mahfuz, Swarup Bhunia |
Learning Your Lock: Exploiting Structural Vulnerabilities in Logic Locking. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Rob Munoz |
Furthering Moore's Law Integration Benefits in the Chiplet Era. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Zhang Zhang, Annan Wang, Hongtao Ren, Guangjun Xie, Xin Cheng 0001 |
Voltage-Resistance-Adaptive MPPT Circuit for Energy Harvesting. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Scott Davidson 0001 |
Niklaus Wirth (1934-2024) - An Appreciation. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Gang Qu 0001 |
Special Issue on the 2021 Workshop on Top Picks in Hardware and Embedded Security. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Kushagra Bhatheja, Shravan K. Chaganti, Johnathan Leisinger, Emmanuel Nti Darko, Isaac Bruce, Degang Chen 0001 |
A BIST Approach to Approximate Co-Testing of Embedded Data Converters. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Esmaeil Mohammadian Koruyeh, Khaled N. Khasawneh, Chengyu Song, Nael B. Abu-Ghazaleh |
Spectre Returns! Speculation Attacks Using the Return Stack Buffer. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Ke Huang 0001, Yu Liu, Nenad Korolija, John M. Carulli, Yiorgos Makris |
Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Kyonghwan Yoon, Eunjin Jeong, Woosuk Kang, Soonhoi Ha |
Memory Usage Estimation for Dataflow-Model-Based Software Development Methodology. |
IEEE Des. Test |
2024 |
DBLP DOI BibTeX RDF |
|
| 1 | Elbruz Ozen, Alex Orailoglu |
Shaping Resilient AI Hardware Through DNN Computational Feature Exploitation. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Nuno Roma, Bruno Zatt |
SBCCI 2022. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Ankita Paul, Shihao Song, Twisha Titirsha, Anup Das 0001 |
On the Mitigation of Read Disturbances in Neuromorphic Inference Hardware. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Praise O. Farayola, Ekaniyere Oko-Odion, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi 0001, Degang Chen 0001 |
Site-to-Site Variation in Analog Multisite Testing: A Survey on Its Detection and Correction. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Aviral Shrivastava, Xiaobo Sharon Hu |
Report on the 2022 Embedded Systems Week (ESWEEK). |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Shruti Yadav Narayana, Emily Shriver, Kenneth O'Neal, Nuriye Yildirim, Khamida Begaliyeva, Ümit Y. Ogras |
Similarity-Based Fast Analysis of Data Center Networks. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | K. Ramakrishna Kini, Muddu Madakyaru, Fouzi Harrou, Ying Sun 0002 |
Detecting Pediatric Foot Deformities Using Plantar Pressure Measurements: A Semisupervised Approach. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Josie E. Rodriguez Condia, Felipe Augusto da Silva, Ahmet Çagri Bagbaga, Juan-David Guerrero-Balaguera, Said Hamdioui, Christian Sauer 0001, Matteo Sonza Reorda |
Using STLs for Effective In-Field Test of GPUs. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Ibrahim Krayem, Joel Ortiz Sosa, Cédric Killian, Daniel Chillet |
Analytical Model for Performance Evaluation of Token-Passing-Based WiNoCs. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Honorio Martín, Sophie Dupuis, Giorgio Di Natale, Luis Entrena |
Using Approximate Circuits Against Hardware Trojans. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Hoai Luan Pham, Thi Hong Tran, Vu Trung Duong Le, Yasuhiko Nakashima |
Flexible and Scalable BLAKE/BLAKE2 Coprocessor for Blockchain-Based IoT Applications. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Víctor Jiménez, Mario Rodríguez, Marc Domínguez, Josep Sans, Ivan Diaz, Luca Valente, Vito Luca Guglielmi, Josue V. Quiroga, R. Ignacio Genovese, Nehir Sönmez, Oscar Palomar, Miquel Moretó |
Functional Verification of a RISC-V Vector Accelerator. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Md Sami Ul Islam Sami, Hadi Mardani Kamali, Farimah Farahmandi, Fahim Rahman, Mark M. Tehranipoor |
Enabling Security of Heterogeneous Integration: From Supply Chain to In-Field Operations. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Abhinav Goel, Caleb Tung, Nick Eliopoulos, George K. Thiruvathukal, Amy Wang, Yung-Hsiang Lu, James C. Davis 0001 |
Tree-Based Unidirectional Neural Networks for Low-Power Computer Vision. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Marcel Moscarelli Corrêa, Daniel Palomino 0001, Guilherme Corrêa 0001, Luciano Agostini |
Heuristic-Based Algorithms for Low-Complexity AV1 Intraprediction. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Gabriele Tombesi, Joseph Zuckerman, Paolo Mantovani, Davide Giri, Maico Cassel dos Santos, Tianyu Jia, David Brooks 0001, Gu-Yeon Wei, Luca P. Carloni |
SoCProbe: Compositional Post-Silicon Validation of Heterogeneous NoC-Based SoCs. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Seyed-Sajad Ahmadpour, Nima Jafari Navimipour, Ali Nawaz Bahar, Mohammad Mosleh, Senay Yalçin |
An Energy-Aware Nanoscale Design of Reversible Atomic Silicon Based on Miller Algorithm. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Ian O'Connor, Robert Wille, Andy D. Pimentel, Valeria Bertacco |
Postpandemic Conferences: The DATE 2023 Experience. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Nicola Nicolici |
Interview With Janet Olson. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Tulika Mitra |
The 2022 International Conference on Computer-Aided Design (ICCAD). |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Junhuan Yang, Lei Yang |
Hardware/Software Coexploration for Hyperdimensional Computing on Network-on-Chip Architecture. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Partha Pratim Pande |
The 2022 Symposium on Integrated Circuits and Systems Design (SBCCI 2022). |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Partha Pratim Pande |
Approximate Computing: Challenges, Methodologies, Algorithms, and Architectures for Dependable and Secure Systems. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Chung-Huang Yeh, Jwu E. Chen |
Recycling Test Methods to Improve Test Capacity and Increase Chip Shipments. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Soyed Tuhin Ahmed, Mehdi B. Tahoori |
Fault-Tolerant Neuromorphic Computing With Memristors Using Functional ATPG for Efficient Recalibration. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Rafael Follmann Faccenda, Gustavo Comarú, Luciano Lores Caimi, Fernando Gehm Moraes |
SeMAP - A Method to Secure the Communication in NoC-Based Many-Cores. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Nicola Nicolici |
Interview With Prof. Sung-Mo (Steve) Kang. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Shun Nagasaki, Junichiro Kadomoto, Hidetsugu Irie, Shuichi Sakai |
Dynamically Reconfigurable Network Protocol for Shape-Changeable Computer System. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Luis Francisco, W. Rhett Davis, Paul D. Franzon |
A Deep Transfer Learning Design Rule Checker With Synthetic Training. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Zhonghai Lu |
PiN: Processing in Network-on-Chip. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Giovanni De Micheli |
Strange Loops in Design and Technology: 59th DAC Keynote Speech. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Partha Pratim Pande |
Machine Learning for CAD/EDA. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Shruti Yadav Narayana, Sumit K. Mandal, Raid Ayoub, Mohammad M. Islam, Michael Kishinevsky, Ümit Y. Ogras |
Fast Analysis Using Finite Queuing Model for Multilayer NoCs. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Zeyu Chen, Ankur Bindal, Vaidehi Garg, Tushar Krishna |
SPOCK: Reverse Packet Traversal for Deadlock Recovery. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Taochen Gu, Fayu Wan, Jingjie Zhou, Qizheng Ji, Binhong Li, Blaise Ravelo |
T-Topology Coupler-Based Bandpass Negative Group Delay Active Circuit Design and Test. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Hao Cai, Yaoru Hou, Mengdi Zhang, Bo Liu 0019, Lirida Alves de Barros Naviner |
Dependable STT-MRAM With Emerging Approximation and Speculation Paradigms. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Timothy Martin, Charlotte Barnes, Gary Gréwal, Shawki Areibi |
Integrating Machine-Learning Probes in FPGA CAD: Why and How? |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Vincent Meyers, Dennis Gnad, Mehdi Baradaran Tahoori |
Active and Passive Physical Attacks on Neural Network Accelerators. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | K. Neethu, K. C. Sharin Shahana, Rekha K. James, John Jose, Sumit K. Mandal |
ELEMENT: Energy-Efficient Multi-NoP Architecture for IMC-Based 2.5-D Accelerator for DNN Training. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Lingxiao Zhu, Wenjie Fan, Chenyang Dai, Shize Zhou, Yongqi Xue, Zhonghai Lu, Li Li 0003, Yuxiang Fu |
A NoC-Based Spatial DNN Inference Accelerator With Memory-Friendly Dataflow. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Styliani Tompazi, Ioannis Tsiokanos, Jesús Martínez del Rincón, Georgios Karakonstantis |
Estimating Code Vulnerability to Timing Errors Via Microarchitecture-Aware Machine Learning. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Bo Liu 0019, Hao Cai, Zilong Zhang, Xiaoling Ding, Renyuan Zhang, Yu Gong, Zhen Wang 0019, Wei Ge, Jun Yang 0006 |
Multiplication Circuit Architecture for Error- Tolerant CNN-Based Keywords Speech Recognition. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Juan-David Guerrero-Balaguera, Josie E. Rodriguez Condia, Matteo Sonza Reorda |
STLs for GPUs: Using High-Level Language Approaches. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Andrew B. Kahng |
Machine Learning for CAD/EDA: The Road Ahead. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Tao Zhang, Fahim Rahman, Mark M. Tehranipoor, Farimah Farahmandi |
FPGA-Chain: Enabling Holistic Protection of FPGA Supply Chain With Blockchain Technology. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Partha Pratim Pande |
40th IEEE VLSI Test Symposium 2022. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Fei Su, Chunsheng Liu, Haralampos-G. Stratigopoulos |
Special Issue on Testability and Dependability of Artificial Intelligence Hardware. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Patrik Omland, Yang Peng, Michael Paulitsch, Jorge Parra, Gustavo Espinosa, Abishai Daniel, Gereon Hinz, Alois C. Knoll |
API-Based Hardware Fault Simulation for DNN Accelerators. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Ulf Schlichtmann, Bing Li 0005, Bei Yu 0001, Raviv Gal |
Guest Editors' Introduction: Special Issue on Machine Learning for CAD/EDA. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Timoteo García Bertoa, Giulio Gambardella, Nicholas J. Fraser, Michaela Blott, John McAllister |
Fault-Tolerant Neural Network Accelerators With Selective TMR. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Partha Pratim Pande |
The 2023 Networks-on-Chip (NOCS) Symposium. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Scott Davidson 0001 |
Calling Yourself Back. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Tinghuan Chen, Grace Li Zhang, Bei Yu 0001, Bing Li 0005, Ulf Schlichtmann |
Machine Learning in Advanced IC Design: A Methodological Survey. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Partha Pratim Pande |
Special Issue on Testability and Dependability of Artificial Intelligence Hardware. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Tim Fischer 0001, Michael Rogenmoser, Matheus A. Cavalcante, Frank K. Gürkaynak, Luca Benini |
FlooNoC: A Multi-Tb/s Wide NoC for Heterogeneous AXI4 Traffic. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Charles Augustine, Hai Helen Li |
ISLPED 2022: An Experience of a Hybrid Conference in the Time of COVID-19. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Blaise Ravelo, Alexandre Douyère, Yang Liu, Wenceslas Rahajandraibe, Fayu Wan, George Chan, Mathieu Guerin |
Fully Microstrip Three-Port Circuit Bandpass NGD Design and Test. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Scott Davidson 0001 |
Our Gated Community. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Srinivasan Subramaniyan, Oscar Ferraz, M. R. Ashuthosh, Santosh Krishna, Guohui Wang, Joseph R. Cavallaro, Vítor Silva 0001, Gabriel Falcão 0001, Madhura Purnaprajna |
Enabling High-Level Design Strategies for High-Throughput and Low-Power NB-LDPC Decoders. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Fei Su, Chunsheng Liu, Haralampos-G. Stratigopoulos |
Testability and Dependability of AI Hardware: Survey, Trends, Challenges, and Perspectives. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Alberto Bosio, Mario Barbareschi, Alessandro Savino, Jie Han 0001, Jürgen Teich |
Special Issue on Approximate Computing: Challenges, Methodologies, Algorithms, and Architectures for Dependable and Secure Systems. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Haoxing Ren, Brucek Khailany, Matthew Fojtik, Yanqing Zhang 0002 |
Machine Learning and Algorithms: Let Us Team Up for EDA. |
IEEE Des. Test |
2023 |
DBLP DOI BibTeX RDF |
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