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Publications at "J. Electronic Testing"( http://dblp.L3S.de/Venues/J._Electronic_Testing )

URL (DBLP): http://dblp.uni-trier.de/db/journals/et

Publication years (Num. hits)
1990 (20) 1991 (33) 1992 (36) 1993 (35) 1994 (36) 1995 (50) 1996 (45) 1997 (51) 1998 (50) 1999 (55) 2000 (59) 2001 (53) 2002 (60) 2003 (69) 2004 (64) 2005 (56) 2006 (43) 2007 (56) 2008 (52) 2009 (32) 2010 (57) 2011 (70) 2012 (80) 2013 (81) 2014 (69) 2015 (58) 2016 (74) 2017 (70) 2018 (68) 2019 (13)
Publication types (Num. hits)
article(1595)
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Found 1595 publication records. Showing 1595 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
1 2018 JETTA Reviewers. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Shiva Taghipour, Rahebeh Niaraki Asli Impact of Negative Bias Temperature Instability on Gate-All-Around Flip-Flops. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1 Test Technology Newsletter. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Marek Cieplucha Metric-Driven Verification Methodology with Regression Management. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Serhiy Avramenko, Massimo Violante RTOS Solution for NoC-Based COTS MPSoC Usage in Mixed-Criticality Systems. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Shakeel Ahmad, Jerzy J. Dabrowski Design of Two-Tone RF Generator for On-Chip IP3/IP2 Test. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Paulo Ricardo Cechelero Villa, Rodrigo Travessini, Roger C. Goerl, Fabian Luis Vargas, Eduardo Augusto Bezerra Fault Tolerant Soft-Core Processor Architecture Based on Temporal Redundancy. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Rahma Ben Fraj, Vincent Beroulle, Nicolas Fourty, Aref Meddeb An Optimized NS2 Module for UHF Passive RFID Systems. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Haibin Wang, Xixi Dai, Younis Mohammed Younis Ibrahim, Hongwen Sun, Issam Nofal, Li Cai, Gang Guo, Zicai Shen, Li Chen 0001 A Layout-Based Rad-Hard DICE Flip-Flop Design. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Andres F. Gomez, Víctor H. Champac An Efficient Metric-Guided Gate Sizing Methodology for Guardband Reduction Under Process Variations and Aging Effects. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1 New Editors - 2019. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Amit Karel, Florence Azaïs, Mariane Comte, Jean Marc Gallière, Michel Renovell Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Vishwani D. Agrawal Editorial. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1J. Qing, Y. Zeng, X. J. Li, P. J. Zhang, Y. B. Sun, Y. L. Shi Analytical Low Frequency NBTI Compact Modeling with H2 Locking and Electron Fast Capture and Emission. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Rana Elnaggar, Krishnendu Chakrabarty Machine Learning for Hardware Security: Opportunities and Risks. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Yang Zhang 0027, Houde Quan, Xiongwei Li, Kaiyan Chen Golden-Free Processor Hardware Trojan Detection Using Bit Power Consistency Analysis. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Naoki Terao, Toru Nakura, Masahiro Ishida, Rimon Ikeno, Takashi Kusaka, Tetsuya Iizuka, Kunihiro Asada Digitally-Controlled Compensation Current Injection to ATE Power Supply for Emulation of Customer Environment. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Eman El Mandouh, Amr G. Wassal Application of Machine Learning Techniques in Post-Silicon Debugging and Bug Localization. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Siyuan Yan, Xiao Li, Changhong Jiang, Hui Li, Lingmei Wang, Fu Li Digital Predistortion for Spectrum Compliance in the Internet of Things. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Pralhadrao V. Shantagiri, Rohit Kapur Handling Unknown with Blend of Scan and Scan Compression. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Congyin Shi, Sanghoon Lee 0008, Sergio Soto Aguilar, Edgar Sánchez-Sinencio A Time-Domain Digital-Intensive Built-In Tester for Analog Circuits. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1 Test Technology Newsletter. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1 New Editor - 2018. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Riadul Islam Low-Power Resonant Clocking Using Soft Error Robust Energy Recovery Flip-Flops. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Giorgio Pollaccia, Marco Restifo, Federico Venini Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Vaishali H. Dhare, Usha Sandeep Mehta Multiple Missing Cell Defect Modeling for QCA Devices. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1R. Jothin, C. Vasanthanayaki High Performance Modified Static Segment Approximate Multiplier based on Significance Probability. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Hani Malloug, Manuel J. Barragan, Salvador Mir Practical Harmonic Cancellation Techniques for the On-Chip Implementation of Sinusoidal Signal Generators for Mixed-Signal BIST Applications. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Vishwani D. Agrawal Editorial. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Nabil El Belghiti Alaoui, Alexandre Boyer, Patrick Tounsi, Arnaud Viard Upgrading In-Circuit Test of High Density PCBAs Using Electromagnetic Measurement and Principal Component Analysis. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Vasudevan Madampu Suryasarman, Santosh Biswas, Aryabartta Sahu Automation of Test Program Synthesis for Processor Post-silicon Validation. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Yang Yu, Jie Liang, Zhi-Ming Yang, Xiyuan Peng NBTI and Power Reduction Using a Workload-Aware Supply Voltage Assignment Approach. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Vijaypal Singh Rathor, Bharat Garg, G. K. Sharma New Lightweight Architectures for Secure FSM Design to Thwart Fault Injection and Trojan Attacks. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Haiying Yuan, Changshi Zhou, Xun Sun, Kai Zhang, Tong Zheng, Chang Liu, Xiuyu Wang LFSR Reseeding-Oriented Low-Power Test-Compression Architecture for Scan Designs. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1 Test Technology Newsletter. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Naghmeh Karimi, Jean-Luc Danger, Sylvain Guilley Impact of Aging on the Reliability of Delay PUFs. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Peter Sarson, Tomonori Yanagida, Kosuke Machida Measuring Group Delay of Frequency Downconverter Devices Using a Chirped RF Modulated Signal. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Vishwani D. Agrawal Editorial. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Vishwani D. Agrawal Editorial. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1 Test Technology Newsletter. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Abdus Sami Hassan, Tooba Arifeen, Hossein Moradian, Jeong-A Lee Generation Methodology for Good-Enough Approximate Modules of ATMR. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Yassine Naija, Vincent Beroulle, Mohsen Machhout Security Enhancements of a Mutual Authentication Protocol Used in a HF Full-Fledged RFID Tag. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1R. Jothin, C. Vasanthanayaki High Performance Static Segment On-Chip Memory for Image Processing Applications. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Yong Gao 0004, En Li, Gaofeng Guo Measurement of Nonlinear Dielectric Behaviour of Semiconductor Material Under Microwave Field in Dual-Mode Rectangular Cavity. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Shyue-Kung Lu, Hao-Cheng Jheng, Hao-Wei Lin, Masaki Hashizume Address Remapping Techniques for Enhancing Fabrication Yield of Embedded Memories. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Xiaozhi Du, Dongyang Luo, Kailun Shi, Chaohui He, Shuhuan Liu FFI4SoC: a Fine-Grained Fault Injection Framework for Assessing Reliability against Soft Error in SoC. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1M. A. Nourian, Mahdi Fazeli, David Hély Hardware Trojan Detection Using an Advised Genetic Algorithm Based Logic Testing. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Roya Dibaj, Dhamin Al-Khalili, Maitham Shams Gate Oxide Short Defect Model in FinFETs. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Stelios N. Neophytou, Maria K. Michael Path Representation in Circuit Netlists Using Linear-Sized ZDDs with Optimal Variable Ordering. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1 Test Technology Newsletter. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Freddy Forero, Jean Marc Gallière, Michel Renovell, Víctor H. Champac Detectability Challenges of Bridge Defects in FinFET Based Logic Cells. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Stephane David-Grignot, Achraf Lamlih, Mohamed Moez Belhaj, Vincent Kerzerho, Florence Azaïs, Fabien Soulier, Philippe Freitas, Tristan Rouyer, Sylvain Bonhommeau, Serge Bernard On-chip Generation of Sine-wave Summing Digital Signals: an Analytic Study Considering Implementation Constraints. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Pablo Ilha Vaz, Thiago Hanna Both, Fábio Fedrizzi Vidor, Raphael Martins Brum, Gilson I. Wirth Design Flow Methodology for Radiation Hardened by Design CMOS Enclosed-Layout-Transistor-Based Standard-Cell Library. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Toral Shah, Anzhela Yu. Matrosova, Masahiro Fujita, Virendra Singh Multiple Stuck-at Fault Testability Analysis of ROBDD Based Combinational Circuit Design. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Michael A. Skitsas, Chrysostomos A. Nicopoulos, Maria K. Michael Exploring System Availability During Software-Based Self-Testing of Multi-core CPUs. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Lorena Anghel, Mounir Benabdenbi, Alberto Bosio, Marcello Traiola, Elena Ioana Vatajelu Test and Reliability in Approximate Computing. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Vishwani D. Agrawal Editorial. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Shigang Zhang, Long Wang, Ying Liu, Xiaofei Zhang, Yongmin Yang Real Time Fault Diagnosis with Tests of Uncertain Quality for Multimode Systems and its Application in a Satellite Power System. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Xu Bai, Hui Hu, Wanjun Li, Fulu Liu Blind Calibration Method for Two-Channel Time-Interleaved Analog-to-Digital Converters Based on FFT. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Wei Jiang, Guoan Wang A Simplified Calibration Methodology for On-Chip Couplers. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Aydin Dirican, Cagatay Ozmen, Martin Margala Leakage-Aware Droop Measurement Built-in Self-Test Circuit for Digital Low-Dropout Regulators. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Vishwani D. Agrawal Editorial. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Felipe Silva, Jardel Silveira, Jarbas Silveira, César A. M. Marcon, Fabian Vargas, Otávio Alcântara de Lima Jr. An Extensible Code for Correcting Multiple Cell Upset in Memory Arrays. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Marcos T. Leipnitz, Gabriel L. Nazar Fault Tolerance Mechanisms for FPGA-Based Regular Expression Matching. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Parth Kansara, Sharanabasavaraja Bheema Reddy, Louay Abdallah, Ke Huang Dynamic Analog/RF Alternate Test Strategies Based on On-chip Learning. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Peter Sarson, Tomonori Yanagida, Shohei Shibuya, Kosuke Machida, Haruo Kobayashi A Distortion Shaping Technique to Equalize Intermodulation Distortion Performance of Interpolating Arbitrary Waveform Generators in Automated Test Equipment. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Muhammad Osama, Lamya Gaber, Aziza I. Hussein, Hanafy Mahmoud An Efficient SAT-Based Test Generation Algorithm with GPU Accelerator. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1 2017 JETTA-TTTC Best Paper Award. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Xiaozhi Du, Dongyang Luo, Chaohui He, Shuhuan Liu A Fine-Grained Software-Implemented DMA Fault Tolerance for SoC Against Soft Error. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Ying Zhang, Li Ling, Jianhui Jiang, Jie Xiao Thermal-aware SoC Test Scheduling with Voltage/Frequency Scaling and Test Partition. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Shyue-Kung Lu, Shang-Xiu Zhong, Masaki Hashizume Fault Leveling Techniques for Yield and Reliability Enhancement of NAND Flash Memories. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Weize Yu, Yiming Wen, Selçuk Köse, Jia Chen Exploiting Multi-Phase On-Chip Voltage Regulators as Strong PUF Primitives for Securing IoT. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Dragan Lambic, Aleksandar Jankovic, Musheer Ahmad Security Analysis of the Efficient Chaos Pseudo-random Number Generator Applied to Video Encryption. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1B. Mert Gönültas, Janset Savas, Ramin Khayatzadeh, Sacid Aygün, Fehmi Çivitci, Y. Daghan Gökdel, M. Berke Yelten, Onur Ferhanoglu Reliability Testing of 3D-Printed Electromechanical Scanning Devices. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Vladimir Chepelev, Yury Parfenov, William Radasky, Boris Titov, Leonid Zdoukhov, Kejie Li, Yuhao Chen, Xu Kong, Yan-zhao Xie Methodical Approach for Immunity Assessment of Electronic Devices Excited by High Power EMP. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Ahcène Bounceur, Samia Djemai, Belkacem Brahmi, Mohand Ouamer Bibi, Reinhardt Euler A Classification Approach for an Accurate Analog/RF BIST Evaluation Based on the Process Parameters. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Ke Huang, Manuel J. Barragan Guest Editorial: Special Issue on Analog, Mixed-Signal, and RF Testing. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Mengbo Sun, Hongjun Lv, Yongqiang Zhang, Guangjun Xie The Fundamental Primitives with Fault-Tolerance in Quantum-Dot Cellular Automata. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Vishwani D. Agrawal Editorial. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Mostafa E. Salehi, Ali Azarpeyvand, Armin Hajaboutalebi Aboutalebi Vulnerability Analysis of Adder Architectures Considering Design and Synthesis Constraints. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1 Test Technology Newsletter. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Konstantin O. Petrosyants, Lev M. Sambursky, Igor A. Kharitonov, Boris G. Lvov Radiation-Induced Fault Simulation of SOI/SOS CMOS LSI's Using Universal Rad-SPICE MOSFET Model. Search on Bibsonomy J. Electronic Testing The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Peter Sarson, Haruo Kobayashi Using Distortion Shaping Technique to Equalize ADC THD Performance Between ATEs. Search on Bibsonomy J. Electronic Testing The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1M. Tulio Martins, G. Cardoso Medeiros, Thiago Copetti, Fabian Vargas, Marcus Pohls Analysing NBTI Impact on SRAMs with Resistive Defects. Search on Bibsonomy J. Electronic Testing The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Yuling Shang, Liyuan Sun, Chunquan Li, Jianfeng Ma Test of Mechanical Failure for Via Holes and Solder Joints of Complex Interconnect Structure. Search on Bibsonomy J. Electronic Testing The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Alfonso Martínez-Cruz, Ricardo Barrón Fernández, Herón Molina-Lozano, Marco Antonio Ramírez Salinas, Luis Alfonso Villa Vargas, Prometeo Cortés-Antonio, Kwang-Ting (Tim) Cheng An Automatic Functional Coverage for Digital Systems Through a Binary Particle Swarm Optimization Algorithm with a Reinitialization Mechanism. Search on Bibsonomy J. Electronic Testing The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1 Test Technology Newsletter. Search on Bibsonomy J. Electronic Testing The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Amin Bazzazi, Mohammad Taghi Manzuri Shalmani, Ali Mohammad Afshin Hemmatyar Hardware Trojan Detection Based on Logical Testing. Search on Bibsonomy J. Electronic Testing The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1R. Jothin, C. Vasanthanayaki High Speed Energy Efficient Static Segment Adder for Approximate Computing Applications. Search on Bibsonomy J. Electronic Testing The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Mangal Hemant Dhend, Rajan Hari Chile Fault Diagnosis of Smart Grid Distribution System by Using Smart Sensors and Symlet Wavelet Function. Search on Bibsonomy J. Electronic Testing The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Ayan Palchaudhuri, Anindya Sundar Dhar Built-In Fault Localization Circuitry for High Performance FPGA Based Implementations. Search on Bibsonomy J. Electronic Testing The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Jasbir N. Patel, Hao Jiang, Bozena Kaminska A Passive Authentication System Based on Optical Variable Nano/Micro-Structures. Search on Bibsonomy J. Electronic Testing The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Alvaro Gómez-Pau, Luz Balado, Joan Figueras Multi-Directional Space Tessellation to Improve the Decision Boundary in Indirect Mixed-Signal Testing. Search on Bibsonomy J. Electronic Testing The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Yan Duan, Tao Chen 0006, Degang Chen A Low-cost Dithering Method for Improving ADC Linearity Test Applied in uSMILE Algorithm. Search on Bibsonomy J. Electronic Testing The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Breeta SenGupta, Dimitar Nikolov, Urban Ingelsson, Erik Larsson Test Planning for Core-based Integrated Circuits under Power Constraints. Search on Bibsonomy J. Electronic Testing The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Vishwani D. Agrawal Editorial. Search on Bibsonomy J. Electronic Testing The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Tamzidul Hoque, Seetharam Narasimhan, Xinmu Wang, Sanchita Mal-Sarkar, Swarup Bhunia Golden-Free Hardware Trojan Detection with High Sensitivity Under Process Noise. Search on Bibsonomy J. Electronic Testing The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Yong Deng, Ning Liu Soft Fault Diagnosis in Analog Circuits Based on Bispectral Models. Search on Bibsonomy J. Electronic Testing The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Ding Deng, Yang Guo, Zhentao Li A Parallel Test Application Method towards Power Reduction. Search on Bibsonomy J. Electronic Testing The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1 Test Technology Newsletter. Search on Bibsonomy J. Electronic Testing The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
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