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Publications at "J. Electronic Testing"( http://dblp.L3S.de/Venues/J._Electronic_Testing )

URL (DBLP): http://dblp.uni-trier.de/db/journals/et

Publication years (Num. hits)
1990 (20) 1991 (33) 1992 (36) 1993 (35) 1994 (36) 1995 (50) 1996 (45) 1997 (51) 1998 (50) 1999 (55) 2000 (59) 2001 (53) 2002 (60) 2003 (69) 2004 (64) 2005 (56) 2006 (43) 2007 (56) 2008 (52) 2009 (32) 2010 (57) 2011 (70) 2012 (80) 2013 (81) 2014 (69) 2015 (58) 2016 (74) 2017 (70) 2018 (68) 2019 (38)
Publication types (Num. hits)
article(1620)
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Found 1620 publication records. Showing 1620 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
1Yongkang Tang, Liang Fang, Shaoqing Li Activity Factor Based Hardware Trojan Detection and Localization. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1 Test Technology Newsletter. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Biswajit Bhowmik, Santosh Biswas, Jatindra Kumar Deka, Bhargab B. Bhattacharya A Low-Cost Test Solution for Reliable Communication in Networks-on-Chip. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Paulo Ricardo Cechelero Villa, Rodrigo Travessini, Roger C. Goerl, Fabian Luis Vargas, Eduardo Augusto Bezerra Fault Tolerant Soft-Core Processor Architecture Based on Temporal Redundancy. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Maryam Shafiee, Sule Ozev Contact-Less Near-Field Test of Active Integrated RF Phased Array Antennas. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Omid Ranjbar, Siavash Bayat Sarmadi, Fatemeh Pooyan, Hossein Asadi A Unified Approach to Detect and Distinguish Hardware Trojans and Faults in SRAM-based FPGAs. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Shuo Cai, Weizheng Wang, Fei Yu, Binyong He Single Event Transient Propagation Probabilities Analysis for Nanometer CMOS Circuits. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1 2018 JETTA Reviewers. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Serhiy Avramenko, Massimo Violante RTOS Solution for NoC-Based COTS MPSoC Usage in Mixed-Criticality Systems. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Vishwani D. Agrawal Editorial. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Shiva Taghipour, Rahebeh Niaraki Asli Impact of Negative Bias Temperature Instability on Gate-All-Around Flip-Flops. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Mahroo Zandrahimi, Philippe Debaud, Armand Castillejo, Zaid Al-Ars Evaluation of the Impact of Technology Scaling on Delay Testing for Low-Cost AVS. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Rahma Ben Fraj, Vincent Beroulle, Nicolas Fourty, Aref Meddeb An Optimized NS2 Module for UHF Passive RFID Systems. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Marco Grossi, Martin Omaña Impact of Bias Temperature Instability (BTI) Aging Phenomenon on Clock Deskew Buffers. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1 New Editors - 2019. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Amit Karel, Florence Azaïs, Mariane Comte, Jean Marc Gallière, Michel Renovell Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Maha Kooli, Giorgio Di Natale, Alberto Bosio Memory-Aware Design Space Exploration for Reliability Evaluation in Computing Systems. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1G. Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Haibin Wang, Xixi Dai, Younis Mohammed Younis Ibrahim, Hongwen Sun, Issam Nofal, Li Cai, Gang Guo, Zicai Shen, Li Chen 0001 A Layout-Based Rad-Hard DICE Flip-Flop Design. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Jiaqiang Li, Pedro Reviriego, Liyi Xiao Low Delay 3-Bit Burst Error Correction Codes. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1D. A. Oumar, M. I. Boukhari, M. A. Taha, Stéphane Capraro, D. Piétroy, J. P. Chatelon, J. J. Rousseau Characterization Method for Integrated Magnetic Devices at Lower Frequencies (up to 110 MHz). Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Rahul Kundu, Fei Su, Prashant Goteti A Distributed Error and Anomaly Communication Architecture for Analog and Mixed-Signal Systems. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Remesh Kumar K. R, K. Shreekrishna Kumar Testing of Current Carrying Capacity of Conducting Tracks in High Power Flexible Printed Circuit Boards. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Haider Al-kanan, Xianzhen Yang, Fu Li Saleh Model and Digital Predistortion for Power Amplifiers in Wireless Communications Using the Third-Order Intercept Point. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Marek Cieplucha Metric-Driven Verification Methodology with Regression Management. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Sophie Dupuis, Marie-Lise Flottes Logic Locking: A Survey of Proposed Methods and Evaluation Metrics. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1 Test Technology Newsletter. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Shakeel Ahmad, Jerzy J. Dabrowski Design of Two-Tone RF Generator for On-Chip IP3/IP2 Test. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Alexandra Kourfali, Florian Fricke, Michael Hübner, Dirk Stroobandt An Integrated on-Silicon Verification Method for FPGA Overlays. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1 Test Technology Newsletter. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Andres F. Gomez, Víctor H. Champac An Efficient Metric-Guided Gate Sizing Methodology for Guardband Reduction Under Process Variations and Aging Effects. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Vishwani D. Agrawal Editorial. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1S. Herasimov, V. Pavlii, O. Tymoshchuk, M. Yu. Yakovlev, D. Ye. Khaustov, Ye. Ryzhov, L. Sakovych, Yuriy A. Nastishin Testing Signals for Electronics: Criteria for Synthesis. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Ali Hajian, Saeed Safari Modeling Soft Error Propagation in Near-Threshold Combinational Circuits Using Neural Networks. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Martin Omaña, S. Govindaraj, Cecilia Metra Low-Cost Strategy for Bus Propagation Delay Reduction. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Vishwani D. Agrawal Editorial. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1S. Geetha 0002, P. Amritvalli Design of High Speed Error Tolerant Adder Using Gate Diffusion Input Technique. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Gennaro Severino Rodrigues, Ádria Barros de Oliveira, Fernanda Lima Kastensmidt, Vincent Pouget, Alberto Bosio Assessing the Reliability of Successive Approximate Computing Algorithms under Fault Injection. Search on Bibsonomy J. Electronic Testing The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Ahcène Bounceur, Samia Djemai, Belkacem Brahmi, Mohand Ouamer Bibi, Reinhardt Euler A Classification Approach for an Accurate Analog/RF BIST Evaluation Based on the Process Parameters. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Dragan Lambic, Aleksandar Jankovic, Musheer Ahmad Security Analysis of the Efficient Chaos Pseudo-random Number Generator Applied to Video Encryption. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Naoki Terao, Toru Nakura, Masahiro Ishida, Rimon Ikeno, Takashi Kusaka, Tetsuya Iizuka, Kunihiro Asada Digitally-Controlled Compensation Current Injection to ATE Power Supply for Emulation of Customer Environment. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Xu Bai, Hui Hu, Wanjun Li, Fulu Liu Blind Calibration Method for Two-Channel Time-Interleaved Analog-to-Digital Converters Based on FFT. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1 Test Technology Newsletter. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Roya Dibaj, Dhamin Al-Khalili, Maitham Shams Gate Oxide Short Defect Model in FinFETs. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Parth Kansara, Sharanabasavaraja Bheema Reddy, Louay Abdallah, Ke Huang Dynamic Analog/RF Alternate Test Strategies Based on On-chip Learning. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Vladimir Chepelev, Yury Parfenov, William Radasky, Boris Titov, Leonid Zdoukhov, Kejie Li, Yuhao Chen, Xu Kong, Yan-zhao Xie Methodical Approach for Immunity Assessment of Electronic Devices Excited by High Power EMP. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1 Test Technology Newsletter. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Wei Jiang, Guoan Wang A Simplified Calibration Methodology for On-Chip Couplers. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1R. Jothin, C. Vasanthanayaki High Performance Modified Static Segment Approximate Multiplier based on Significance Probability. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Vishwani D. Agrawal Editorial. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1J. Qing, Y. Zeng, X. J. Li, P. J. Zhang, Y. B. Sun, Y. L. Shi Analytical Low Frequency NBTI Compact Modeling with H2 Locking and Electron Fast Capture and Emission. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Stephane David-Grignot, Achraf Lamlih, Mohamed Moez Belhaj, Vincent Kerzerho, Florence Azaïs, Fabien Soulier, Philippe Freitas, Tristan Rouyer, Sylvain Bonhommeau, Serge Bernard On-chip Generation of Sine-wave Summing Digital Signals: an Analytic Study Considering Implementation Constraints. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Nabil El Belghiti Alaoui, Alexandre Boyer, Patrick Tounsi, Arnaud Viard Upgrading In-Circuit Test of High Density PCBAs Using Electromagnetic Measurement and Principal Component Analysis. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Muhammad Osama, Lamya Gaber, Aziza I. Hussein, Hanafy Mahmoud An Efficient SAT-Based Test Generation Algorithm with GPU Accelerator. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1 2017 JETTA-TTTC Best Paper Award. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Lorena Anghel, Mounir Benabdenbi, Alberto Bosio, Marcello Traiola, Elena Ioana Vatajelu Test and Reliability in Approximate Computing. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Felipe Silva, Jardel Silveira, Jarbas Silveira, César A. M. Marcon, Fabian Vargas, Otávio Alcântara de Lima Jr. An Extensible Code for Correcting Multiple Cell Upset in Memory Arrays. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Ying Zhang, Li Ling, Jianhui Jiang, Jie Xiao Thermal-aware SoC Test Scheduling with Voltage/Frequency Scaling and Test Partition. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Vishwani D. Agrawal Editorial. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Xiaozhi Du, Dongyang Luo, Kailun Shi, Chaohui He, Shuhuan Liu FFI4SoC: a Fine-Grained Fault Injection Framework for Assessing Reliability against Soft Error in SoC. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Yassine Naija, Vincent Beroulle, Mohsen Machhout Security Enhancements of a Mutual Authentication Protocol Used in a HF Full-Fledged RFID Tag. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Mengbo Sun, Hongjun Lv, Yongqiang Zhang, Guangjun Xie The Fundamental Primitives with Fault-Tolerance in Quantum-Dot Cellular Automata. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1 Test Technology Newsletter. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Stelios N. Neophytou, Maria K. Michael Path Representation in Circuit Netlists Using Linear-Sized ZDDs with Optimal Variable Ordering. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Rana Elnaggar, Krishnendu Chakrabarty Machine Learning for Hardware Security: Opportunities and Risks. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1B. Mert Gönültas, Janset Savas, Ramin Khayatzadeh, Sacid Aygün, Fehmi Çivitci, Y. Daghan Gökdel, M. Berke Yelten, Onur Ferhanoglu Reliability Testing of 3D-Printed Electromechanical Scanning Devices. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Vishwani D. Agrawal Editorial. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Pablo Ilha Vaz, Thiago Hanna Both, Fábio Fedrizzi Vidor, Raphael Martins Brum, Gilson I. Wirth Design Flow Methodology for Radiation Hardened by Design CMOS Enclosed-Layout-Transistor-Based Standard-Cell Library. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Shigang Zhang, Long Wang, Ying Liu, Xiaofei Zhang, Yongmin Yang Real Time Fault Diagnosis with Tests of Uncertain Quality for Multimode Systems and its Application in a Satellite Power System. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1 Test Technology Newsletter. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1 New Editor - 2018. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Naghmeh Karimi, Jean-Luc Danger, Sylvain Guilley Impact of Aging on the Reliability of Delay PUFs. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Hani Malloug, Manuel J. Barragan, Salvador Mir Practical Harmonic Cancellation Techniques for the On-Chip Implementation of Sinusoidal Signal Generators for Mixed-Signal BIST Applications. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Riadul Islam Low-Power Resonant Clocking Using Soft Error Robust Energy Recovery Flip-Flops. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1M. A. Nourian, Mahdi Fazeli, David Hély Hardware Trojan Detection Using an Advised Genetic Algorithm Based Logic Testing. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Weize Yu, Yiming Wen, Selçuk Köse, Jia Chen Exploiting Multi-Phase On-Chip Voltage Regulators as Strong PUF Primitives for Securing IoT. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Yang Zhang 0027, Houde Quan, Xiongwei Li, Kaiyan Chen Golden-Free Processor Hardware Trojan Detection Using Bit Power Consistency Analysis. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Vaishali H. Dhare, Usha Sandeep Mehta Multiple Missing Cell Defect Modeling for QCA Devices. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Peter Sarson, Tomonori Yanagida, Kosuke Machida Measuring Group Delay of Frequency Downconverter Devices Using a Chirped RF Modulated Signal. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Marcos T. Leipnitz, Gabriel L. Nazar Fault Tolerance Mechanisms for FPGA-Based Regular Expression Matching. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Yang Yu, Jie Liang, Zhi-Ming Yang, Xiyuan Peng NBTI and Power Reduction Using a Workload-Aware Supply Voltage Assignment Approach. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Vasudevan Madampu Suryasarman, Santosh Biswas, Aryabartta Sahu Automation of Test Program Synthesis for Processor Post-silicon Validation. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Michael A. Skitsas, Chrysostomos A. Nicopoulos, Maria K. Michael Exploring System Availability During Software-Based Self-Testing of Multi-core CPUs. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Yong Gao 0004, En Li, Gaofeng Guo Measurement of Nonlinear Dielectric Behaviour of Semiconductor Material Under Microwave Field in Dual-Mode Rectangular Cavity. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Peter Sarson, Tomonori Yanagida, Shohei Shibuya, Kosuke Machida, Haruo Kobayashi A Distortion Shaping Technique to Equalize Intermodulation Distortion Performance of Interpolating Arbitrary Waveform Generators in Automated Test Equipment. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Pralhadrao V. Shantagiri, Rohit Kapur Handling Unknown with Blend of Scan and Scan Compression. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Vishwani D. Agrawal Editorial. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Vijaypal Singh Rathor, Bharat Garg, G. K. Sharma 0001 New Lightweight Architectures for Secure FSM Design to Thwart Fault Injection and Trojan Attacks. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1 Test Technology Newsletter. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Haiying Yuan, Changshi Zhou, Xun Sun, Kai Zhang, Tong Zheng, Chang Liu, Xiuyu Wang LFSR Reseeding-Oriented Low-Power Test-Compression Architecture for Scan Designs. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Eman El Mandouh, Amr G. Wassal Application of Machine Learning Techniques in Post-Silicon Debugging and Bug Localization. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Shyue-Kung Lu, Hao-Cheng Jheng, Hao-Wei Lin, Masaki Hashizume Address Remapping Techniques for Enhancing Fabrication Yield of Embedded Memories. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Giorgio Pollaccia, Marco Restifo, Federico Venini Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Shyue-Kung Lu, Shang-Xiu Zhong, Masaki Hashizume Fault Leveling Techniques for Yield and Reliability Enhancement of NAND Flash Memories. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Ke Huang, Manuel J. Barragan Guest Editorial: Special Issue on Analog, Mixed-Signal, and RF Testing. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Vishwani D. Agrawal Editorial. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1R. Jothin, C. Vasanthanayaki High Performance Static Segment On-Chip Memory for Image Processing Applications. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Freddy Forero, Jean Marc Gallière, Michel Renovell, Víctor H. Champac Detectability Challenges of Bridge Defects in FinFET Based Logic Cells. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Toral Shah, Anzhela Yu. Matrosova, Masahiro Fujita, Virendra Singh Multiple Stuck-at Fault Testability Analysis of ROBDD Based Combinational Circuit Design. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Vishwani D. Agrawal Editorial. Search on Bibsonomy J. Electronic Testing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
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