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Publications of "Jacob A. Abraham" ( http://dblp.L3S.de/Authors/Jacob_A._Abraham )

URL (Homepage):  http://www.ece.utexas.edu/people/faculty/jacob-abraham  Author page on DBLP  Author page in RDF  Community of Jacob A. Abraham in ASPL-2

Publication years (Num. hits)
1974-1983 (15) 1984-1986 (21) 1987-1989 (22) 1990 (16) 1991-1992 (22) 1993 (15) 1994-1995 (20) 1996-1997 (21) 1998-1999 (26) 2000-2001 (20) 2002-2003 (25) 2004 (17) 2005-2006 (22) 2007-2008 (36) 2009 (18) 2010 (15) 2011-2012 (36) 2013-2014 (26) 2015-2016 (18) 2017-2019 (11)
Publication types (Num. hits)
article(106) inproceedings(316)
Venues (Conferences, Journals, ...)
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The graphs summarize 281 occurrences of 195 keywords

Results
Found 423 publication records. Showing 422 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
1Byoungho Kim, Jacob A. Abraham Spectral Leakage-Driven Loopback Scheme for Prediction of Mixed-Signal Circuit Specifications. Search on Bibsonomy IEEE Trans. Industrial Electronics The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Eric Cheng, Shahrzad Mirkhani, Lukasz G. Szafaryn, Chen-Yong Cher, Hyungmin Cho, Kevin Skadron, Mircea R. Stan, Klas Lilja, Jacob A. Abraham, Pradip Bose, Subhasish Mitra Tolerating Soft Errors in Processor Cores Using CLEAR (Cross-Layer Exploration for Architecting Resilience). Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Md Imran Momtaz, Suvadeep Banerjee, Sujay Pandey, Jacob A. Abraham, Abhijit Chatterjee Cross-Layer Control Adaptation for Autonomous System Resilience. Search on Bibsonomy IOLTS The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Ninghan Tian, Daniel G. Saab, Jacob A. Abraham ESIFT: Efficient System for Error Injection. Search on Bibsonomy IOLTS The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Ameya Chaudhari, Jacob A. Abraham Effective Control Flow Integrity Checks for Intrusion Detection. Search on Bibsonomy IOLTS The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Jie Fang, Shankar Thirunakkarasu, Xuefeng Yu, Fabian Silva-Rivas, Chaoming Zhang, Frank Singor, Jacob A. Abraham A 5-GS/s 10-b 76-mW Time-Interleaved SAR ADC in 28 nm CMOS. Search on Bibsonomy IEEE Trans. on Circuits and Systems The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Eric Cheng, Shahrzad Mirkhani, Lukasz G. Szafaryn, Chen-Yong Cher, Hyungmin Cho, Kevin Skadron, Mircea R. Stan, Klas Lilja, Jacob A. Abraham, Pradip Bose, Subhasish Mitra Tolerating Soft Errors in Processor Cores Using CLEAR (Cross-Layer Exploration for Architecting Resilience). Search on Bibsonomy CoRR The full citation details ... 2017 DBLP  BibTeX  RDF
1Tong Zhang, Daniel G. Saab, Jacob A. Abraham Automatic Assertion Generation for Simulation, Formal Verification and Emulation. Search on Bibsonomy ISVLSI The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Vijay Kiran Kalyanam, Peter G. Sassone, Jacob A. Abraham Power prediction of embedded scalar and vector processor: Challenges and solutions. Search on Bibsonomy ISQED The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Jacob A. Abraham, Suvadeep Banerjee, Abhijit Chatterjee Design of efficient error resilience in signal processing and control systems: From algorithms to circuits. Search on Bibsonomy IOLTS The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Eric Cheng, Jacob A. Abraham, Pradip Bose, Alper Buyuktosunoglu, Keith A. Campbell, Deming Chen, Chen-Yong Cher, Hyungmin Cho, Binh Q. Le, Klas Lilja, Shahrzad Mirkhani, Kevin Skadron, Mircea Stan, Lukasz G. Szafaryn, Christos Vezyrtzis, Subhasish Mitra Cross-Layer Resilience in Low-Voltage Digital Systems: Key Insights. Search on Bibsonomy ICCD The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Immanuel Raja, Gaurab Banerjee, Mohamad A. Zeidan, Jacob A. Abraham A 0.1-3.5-GHz Duty-Cycle Measurement and Correction Technique in 130-nm CMOS. Search on Bibsonomy IEEE Trans. VLSI Syst. The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Eric Cheng, Shahrzad Mirkhani, Lukasz G. Szafaryn, Chen-Yong Cher, Hyungmin Cho, Kevin Skadron, Mircea R. Stan, Klas Lilja, Jacob A. Abraham, Pradip Bose, Subhasish Mitra CLEAR: Cross-Layer Exploration for Architecting Resilience - Combining Hardware and Software Techniques to Tolerate Soft Errors in Processor Cores. Search on Bibsonomy CoRR The full citation details ... 2016 DBLP  BibTeX  RDF
1Jacob A. Abraham, Abhijit Chatterjee Design of Self Calibrating and Error Resilient Mixed-Signal Systems for Signal Processing, Communications and Control. Search on Bibsonomy VLSI Design The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Suvadeep Banerjee, Abhijit Chatterjee, Jacob A. Abraham Checksum based error detection in linearized representations of non linear control systems. Search on Bibsonomy LATS The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Harini Bhamidipati, Daniel G. Saab, Jacob A. Abraham Single Trojan injection model generation and detection. Search on Bibsonomy LATS The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Eric Cheng, Shahrzad Mirkhani, Lukasz G. Szafaryn, Chen-Yong Cher, Hyungmin Cho, Kevin Skadron, Mircea R. Stan, Klas Lilja, Jacob A. Abraham, Pradip Bose, Subhasish Mitra Clear: c̲ross-l̲ayer e̲xploration for a̲rchitecting r̲esilience combining hardware and software techniques to tolerate soft errors in processor cores. Search on Bibsonomy DAC The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Andrzej J. Strojwas, Jacob A. Abraham, Hong Hao, Max M. Shulaker Keynote address: Challenges and opportunities in electrical characterization and test for 14nm and below. Search on Bibsonomy VTS The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Shih-Hsin Hu, Jacob A. Abraham Quality Aware Error Detection in 2-D Separable Linear Transformation. Search on Bibsonomy ATS The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Jacob A. Abraham Cross-layer resilience: are high-level techniques always better? Search on Bibsonomy HLDVT The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Suvadeep Banerjee, Abhijit Chatterjee, Jacob A. Abraham Efficient cross-layer concurrent error detection in nonlinear control systems using mapped predictive check states. Search on Bibsonomy ITC The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Eun Jung Jang, Jaeyong Chung, Jacob A. Abraham Delay Defect Diagnosis Methodology Using Path Delay Measurements. Search on Bibsonomy IEICE Transactions The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Hsun-Cheng Lee, Jacob A. Abraham Digital Calibration for 8-bit Delay Line ADC Using Harmonic Distortion Correction. Search on Bibsonomy J. Electronic Testing The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Jacob A. Abraham, Abhijit Chatterjee Tutorial T3: Error Resilient Real-Time Embedded Systems: Computing, Communications and Control. Search on Bibsonomy VLSI Design The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Gregory Ford, Aswin Krishna, Jacob A. Abraham, Daniel G. Saab Formal Verification ATPG Search Engine Emulator (Abstract Only). Search on Bibsonomy FPGA The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Shahrzad Mirkhani, Subhasish Mitra, Chen-Yong Cher, Jacob A. Abraham Efficient soft error vulnerability estimation of complex designs. Search on Bibsonomy DATE The full citation details ... 2015 DBLP  BibTeX  RDF
1Shahrzad Mirkhani, Balavinayagam Samynathan, Jacob A. Abraham In-depth soft error vulnerability analysis using synthetic benchmarks. Search on Bibsonomy VTS The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Jacob A. Abraham, Ravishankar K. Iyer, Dimitris Gizopoulos, Dan Alexandrescu, Yervant Zorian The future of fault tolerant computing. Search on Bibsonomy IOLTS The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Vijay Kiran Kalyanam, Martin Saint-Laurent, Jacob A. Abraham Power-aware multi-voltage custom memory models for enhancing RTL and low power verification. Search on Bibsonomy ICCD The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Byoungho Kim, Jacob A. Abraham Bitstream-Driven Built-In Characterization for Analog and Mixed-Signal Embedded Circuits. Search on Bibsonomy IEEE Trans. on Circuits and Systems The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Byoungho Kim, Jacob A. Abraham Dynamic Performance Characterization of Embedded Single-Ended Mixed-Signal Circuits. Search on Bibsonomy IEEE Trans. on Circuits and Systems The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Marc Snir, Robert W. Wisniewski, Jacob A. Abraham, Sarita V. Adve, Saurabh Bagchi, Pavan Balaji, Jim Belak, Pradip Bose, Franck Cappello, Bill Carlson, Andrew A. Chien, Paul Coteus, Nathan DeBardeleben, Pedro C. Diniz, Christian Engelmann, Mattan Erez, Saverio Fazzari, Al Geist, Rinku Gupta, Fred Johnson, Sriram Krishnamoorthy, Sven Leyffer, Dean Liberty, Subhasish Mitra, Todd Munson, Rob Schreiber, Jon Stearley, Eric Van Hensbergen Addressing failures in exascale computing. Search on Bibsonomy IJHPCA The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Hsun-Cheng Lee, Jacob A. Abraham Harmonic distortion correction for 8-bit delay line ADC using gray code. Search on Bibsonomy LATW The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Shakeel S. Abdulla, Haewoon Nam, Jacob A. Abraham A novel algorithm for sparse FFT pruning and its applications to OFDMA technology. Search on Bibsonomy IPCCC The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Shahrzad Mirkhani, Hyungmin Cho, Subhasish Mitra, Jacob A. Abraham Rethinking error injection for effective resilience. Search on Bibsonomy ASP-DAC The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Ulf Schlichtmann, Veit Kleeberger, Jacob A. Abraham, Adrian Evans, Christina Gimmler-Dumont, Michael Glaß, Andreas Herkersdorf, Sani R. Nassif, Norbert Wehn Connecting different worlds - Technology abstraction for reliability-aware design and Test. Search on Bibsonomy DATE The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Hsun-Cheng Lee, Jacob A. Abraham A novel low power 11-bit hybrid ADC using flash and delay line architectures. Search on Bibsonomy DATE The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Shahrzad Mirkhani, Jacob A. Abraham Fast evaluation of test vector sets using a simulation-based statistical metric. Search on Bibsonomy VTS The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Jacob A. Abraham, Xinli Gu, Teresa MacLaurin, Janusz Rajski, Paul G. Ryan, Dimitris Gizopoulos, Matteo Sonza Reorda Special session 8B - Panel: In-field testing of SoC devices: Which solutions by which players? Search on Bibsonomy VTS The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Suvadeep Banerjee, Alvaro Gómez-Pau, Abhijit Chatterjee, Jacob A. Abraham Error Resilient Real-Time State Variable Systems for Signal Processing and Control. Search on Bibsonomy ATS The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Shahrzad Mirkhani, Jacob A. Abraham EAGLE: A regression model for fault coverage estimation using a simulation based metric. Search on Bibsonomy ITC The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Jaeyong Chung, Jacob A. Abraham Concurrent Path Selection Algorithm in Statistical Timing Analysis. Search on Bibsonomy IEEE Trans. VLSI Syst. The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Jaeyong Chung, Joonsung Park, Jacob A. Abraham A Built-In Repair Analyzer With Optimal Repair Rate for Word-Oriented Memories. Search on Bibsonomy IEEE Trans. VLSI Syst. The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Mohamad A. Zeidan, Gaurab Banerjee, Jacob A. Abraham Asynchronous Measurement of Transient Phase-Shift Resulting From RF Receiver State-Change. Search on Bibsonomy IEEE Trans. on Circuits and Systems The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Byoungho Kim, Jacob A. Abraham Capacitor-Coupled Built-Off Self-Test in Analog and Mixed-Signal Embedded Systems. Search on Bibsonomy IEEE Trans. on Circuits and Systems The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Kihyuk Han, Joon-Sung Yang, Jacob A. Abraham Dynamic Trace Signal Selection for Post-Silicon Validation. Search on Bibsonomy VLSI Design The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Junyoung Park, Ameya Chaudhari, Jacob A. Abraham Non-speculative double-sampling technique to increase energy-efficiency in a high-performance processor. Search on Bibsonomy DATE The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Hyungmin Cho, Shahrzad Mirkhani, Chen-Yong Cher, Jacob A. Abraham, Subhasish Mitra Quantitative evaluation of soft error injection techniques for robust system design. Search on Bibsonomy DAC The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Takahiro J. Yamaguchi, Jacob A. Abraham, Gordon W. Roberts, Suriyaprakash Natarajan, Dennis J. Ciplickas Special session 12B: Panel post-silicon validation & test in huge variance era. Search on Bibsonomy VTS The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Ameya Chaudhari, Junyoung Park, Jacob A. Abraham A framework for low overhead hardware based runtime control flow error detection and recovery. Search on Bibsonomy VTS The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Kihyuk Han, Joon-Sung Yang, Jacob A. Abraham Enhanced algorithm of combining trace and scan signals in post-silicon validation. Search on Bibsonomy VTS The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Vinod Viswanath, Rajeev Muralidhar, Harinarayanan Seshadri, Jacob A. Abraham On a rewriting strategy for dynamically managing power constraints and power dissipation in SoCs. Search on Bibsonomy ISQED The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Suvadeep Banerjee, Aritra Banerjee, Abhijit Chatterjee, Jacob A. Abraham Real-time checking of linear control systems using analog checksums. Search on Bibsonomy IOLTS The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Hsun-Cheng Lee, Jacob A. Abraham Digital Calibration for 8-Bit Delay Line ADC Using Harmonic Distortion Correction. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Mahesh Prabhu, Jacob A. Abraham Application of under-approximation techniques to functional test generation targeting hard to detect stuck-at faults. Search on Bibsonomy ITC The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Xiao Pu, Krishnaswamy Nagaraj, Jacob A. Abraham, Axel Thomsen A Novel fractional-n PLL Based on a Simple Reference Multiplier. Search on Bibsonomy Journal of Circuits, Systems, and Computers The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Vinod Viswanath, Jacob A. Abraham Automatic and Correct Register Transfer Level Annotations for Low Power Microprocessor Design. Search on Bibsonomy J. Low Power Electronics The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Byoungho Kim, Jacob A. Abraham Imbalance-Based Self-Test for High-Speed Mixed-Signal Embedded Systems. Search on Bibsonomy IEEE Trans. on Circuits and Systems The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Mohamad A. Zeidan, Gaurab Banerjee, Ranjit Gharpurey, Jacob A. Abraham Phase-Aware Multitone Digital Signal Based Test for RF Receivers. Search on Bibsonomy IEEE Trans. on Circuits and Systems The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Baker Mohammad, Jacob A. Abraham A reduced voltage swing circuit using a single supply to enable lower voltage operation for SRAM-based memory. Search on Bibsonomy Microelectronics Journal The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Hyunjin Kim, Jacob A. Abraham A Built-in Self-Test Scheme for Memory Interfaces Timing Test and Measurement. Search on Bibsonomy J. Electronic Testing The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Sachin Dileep Dasnurkar, Jacob A. Abraham Calibration Enabled Scalable Current Sensor Module for Quiescent Current Testing. Search on Bibsonomy J. Electronic Testing The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Chaoming Zhang, Ranjit Gharpurey, Jacob A. Abraham Built-in Self Test of RF Subsystems with Integrated Detectors. Search on Bibsonomy J. Electronic Testing The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Jaeyong Chung, Jacob A. Abraham Refactoring of Timing Graphs and Its Use in Capturing Topological Correlation in SSTA. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Jaeyong Chung, Jinjun Xiong, Vladimir Zolotov, Jacob A. Abraham Testability-Driven Statistical Path Selection. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Jaeyong Chung, Jacob A. Abraham On Computing Criticality in Refactored Timing Graphs. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Jaeyong Chung, Jinjun Xiong, Vladimir Zolotov, Jacob A. Abraham Path Criticality Computation in Parameterized Statistical Timing Analysis Using a Novel Operator. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Junyoung Park, H. Mert Ustun, Jacob A. Abraham Run-time Prediction of the Optimal Performance Point in DVS-based Dynamic Thermal Management. Search on Bibsonomy VLSI Design The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Hyunjin Kim, Jacob A. Abraham On-chip source synchronous interface timing test scheme with calibration. Search on Bibsonomy DATE The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Hyunjin Kim, Jacob A. Abraham A Built-In Self-Test scheme for DDR memory output timing test and measurement. Search on Bibsonomy VTS The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Eun Jung Jang, Anne Gattiker, Sani R. Nassif, Jacob A. Abraham An oscillation-based test structure for timing information extraction. Search on Bibsonomy VTS The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Junyoung Park, Jacob A. Abraham An aging-aware flip-flop design based on accurate, run-time failure prediction. Search on Bibsonomy VTS The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Ji Hwan (Paul) Chun, Siew Mooi Lim, Shao Chee Ong, Jae Wook Lee, Jacob A. Abraham Test of phase interpolators in high speed I/Os using a sliding window search. Search on Bibsonomy VTS The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Ameya Chaudhari, Jacob A. Abraham Stream cipher hash based execution monitoring (SCHEM) framework for intrusion detection on embedded processors. Search on Bibsonomy IOLTS The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Jae Wook Lee, Ji Hwan (Paul) Chun, Jacob A. Abraham Indirect method for random jitter measurement on SoCs using critical path characterization. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Mahesh Prabhu, Jacob A. Abraham Functional test generation for hard to detect stuck-at faults using RTL model checking. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Shahrzad Mirkhani, Jacob A. Abraham, Toai Vo, Hong Shin Jun, Bill Eklow FALCON: Rapid statistical fault coverage estimation for complex designs. Search on Bibsonomy ITC The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Byoungho Kim, Jacob A. Abraham Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits. Search on Bibsonomy IEEE Trans. on Circuits and Systems The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Ramtilak Vemu, Jacob A. Abraham CEDA: Control-Flow Error Detection Using Assertions. Search on Bibsonomy IEEE Trans. Computers The full citation details ... 2011 DBLP  DOI  BibTeX  RDF Control-flow errors, software-based detection, fault tolerance, error detection
1Joonsung Park, Hongjoong Shin, Jacob A. Abraham Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model. Search on Bibsonomy J. Electronic Testing The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Kihyuk Han, Joonsung Park, Jae Wook Lee, Jaeyong Chung, Eonjo Byun, Cheol-Jong Woo, Sejang Oh, Jacob A. Abraham Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. Search on Bibsonomy J. Electronic Testing The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Byoungho Kim, Jacob A. Abraham Transformer-Coupled Loopback Test for Differential Mixed-Signal Dynamic Specifications. Search on Bibsonomy IEEE Trans. Instrumentation and Measurement The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Jacob A. Abraham Tutorial: "Manufacturing test of systems-on-a-chip (SoCs)". Search on Bibsonomy SoCC The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Joonsoo Kim, Joonsoo Lee, Jacob A. Abraham System accuracy estimation of SRAM-based device authentication. Search on Bibsonomy ASP-DAC The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Jaeyong Chung, Jinjun Xiong, Vladimir Zolotov, Jacob A. Abraham Path criticality computation in parameterized statistical timing analysis. Search on Bibsonomy ASP-DAC The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Tung-Yeh Wu, Shih-Hsin Hu, Jacob A. Abraham Robust power gating reactivation by dynamic wakeup sequence throttling. Search on Bibsonomy ASP-DAC The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Jaeyong Chung, Jinjun Xiong, Vladimir Zolotov, Jacob A. Abraham Testability driven statistical path selection. Search on Bibsonomy DAC The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Eun Jung Jang, Anne E. Gattiker, Sani R. Nassif, Jacob A. Abraham Efficient and product-representative timing model validation. Search on Bibsonomy VTS The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Hyunjin Kim, Jacob A. Abraham On-Chip Programmable Dual-Capture for Double Data Rate Interface Timing Test. Search on Bibsonomy Asian Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Eun Jung Jang, Jaeyong Chung, Anne E. Gattiker, Sani R. Nassif, Jacob A. Abraham Post-Silicon Timing Validation Method Using Path Delay Measurements. Search on Bibsonomy Asian Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Junyoung Park, Jacob A. Abraham A fast, accurate and simple critical path monitor for improving energy-delay product in DVS systems. Search on Bibsonomy ISLPED The full citation details ... 2011 DBLP  BibTeX  RDF
1Hongjoong Shin, Joonsung Park, Jacob A. Abraham Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits. Search on Bibsonomy J. Electronic Testing The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Ramyanshu Datta, Antony Sebastine, Ashwin Raghunathan, Gary D. Carpenter, Kevin J. Nowka, Jacob A. Abraham On-Chip Delay Measurement Based Response Analysis for Timing Characterization. Search on Bibsonomy J. Electronic Testing The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Shakeel S. Abdulla, Haewoon Nam, Earl E. Swartzlander Jr., Jacob A. Abraham High speed recursion-free CORDIC architecture. Search on Bibsonomy SoCC The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Tung-Yeh Wu, Sriram Sambamurthy, Jacob A. Abraham Estimation of maximum application-level power supply noise. Search on Bibsonomy SoCC The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Jagdish Chandra Patra, Jacob A. Abraham, Pramod Kumar Meher, Goutam Chakraborty An improved SOM-based visualization technique for DNA microarray data analysis. Search on Bibsonomy IJCNN The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Jae Wook Lee, Ji Hwan (Paul) Chun, Jacob A. Abraham A delay measurement method using a shrinking clock signal. Search on Bibsonomy ACM Great Lakes Symposium on VLSI The full citation details ... 2010 DBLP  DOI  BibTeX  RDF edge placement accuracy, tester, measurement, delay
1Ji Hwan (Paul) Chun, Jae Wook Lee, Jacob A. Abraham A novel characterization technique for high speed I/O mixed signal circuit components using random jitter injection. Search on Bibsonomy ASP-DAC The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Mohamad A. Zeidan, Aritra Banerjee, Ranjit Gharpurey, Jacob A. Abraham Multitone digital signal based test for RF receivers. Search on Bibsonomy VTS The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Jaeyong Chung, Joonsung Park, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo Reducing test time and area overhead of an embedded memory array built-in repair analyzer with optimal repair rate. Search on Bibsonomy VTS The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
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