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Publications of "Janusz Rajski" ( http://dblp.L3S.de/Authors/Janusz_Rajski )

URL (Homepage):  https://www.wikidata.org/entity/Q16562065  Author page on DBLP  Author page in RDF  Community of Janusz Rajski in ASPL-2

Publication years (Num. hits)
1984-1990 (21) 1991-1994 (15) 1995-1996 (19) 1997-1999 (20) 2000-2002 (16) 2003-2004 (24) 2005-2006 (28) 2007-2008 (22) 2009-2010 (18) 2011-2012 (20) 2013-2014 (19) 2015-2016 (18) 2017-2019 (13)
Publication types (Num. hits)
article(69) inproceedings(183) proceedings(1)
Venues (Conferences, Journals, ...)
GrowBag graphs for keyword ? (Num. hits/coverage)

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The graphs summarize 103 occurrences of 59 keywords

Results
Found 254 publication records. Showing 253 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
1Elham K. Moghaddam, Nilanjan Mukherjee 0001, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Justyna Zawada Logic BIST With Capture-Per-Clock Hybrid Test Points. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Wu-Tung Cheng, Grzegorz Mrugalski, Janusz Rajski, Maciej Trawka, Jerzy Tyszer On Cyclic Scan Integrity Tests for EDT-based Compression. Search on Bibsonomy VTS The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Michael Chen, Elham K. Moghaddam, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer, Justyna Zawada Hardware Protection via Logic Locking Test Points. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Yingdi Liu, Janusz Rajski, Sudhakar M. Reddy, Jedrzej Solecki, Jerzy Tyszer Staggered ATPG with capture-per-cycle observation test points. Search on Bibsonomy VTS The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Janusz Rajski, Jerzy Tyszer, Justyna Zawada On New Class of Test Points and Their Applications. Search on Bibsonomy ITC The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Yu Huang 0005, Sylwester Milewski, Janusz Rajski, Jerzy Tyszer, Chen Wang 0014 Hypercompression of Test Patterns. Search on Bibsonomy ITC The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Yingdi Liu, Nilanjan Mukherjee 0001, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer Deterministic Stellar BIST for In-System Automotive Test. Search on Bibsonomy ITC The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1W. Howell, Friedrich Hapke, E. Brazil, S. Venkataraman, R. Datta, Andreas Glowatz, Wilfried Redemund, J. Schmerberg, Anja Fast, Janusz Rajski DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies. Search on Bibsonomy ITC The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Grzegorz Mrugalski, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Chen Wang 0014 Trimodal Scan-Based Test Paradigm. Search on Bibsonomy IEEE Trans. VLSI Syst. The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Cesar Acero, Derek Feltham, Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee 0001, Marek Patyra, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Justyna Zawada Embedded Deterministic Test Points. Search on Bibsonomy IEEE Trans. VLSI Syst. The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Grzegorz Mrugalski, Janusz Rajski, Lukasz Rybak, Jedrzej Solecki, Jerzy Tyszer Star-EDT: Deterministic On-Chip Scheme Using Compressed Test Patterns. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Artur Pogiel, Janusz Rajski, Jerzy Tyszer ROM fault diagnosis for O(n2) test algorithms. Search on Bibsonomy ETS The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Sylwester Milewski, Nilanjan Mukherjee 0001, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Justyna Zawada Full-scan LBIST with capture-per-cycle hybrid test points. Search on Bibsonomy ITC The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Cesar Acero, Derek Feltham, Marek Patyra, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee 0001, Vidya Neerkundar, Janusz Rajski, Jerzy Tyszer, Justyna Zawada On New Test Points for Compact Cell-Aware Tests. Search on Bibsonomy IEEE Design & Test The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Xijiang Lin, Sudhakar M. Reddy, Janusz Rajski Transistor stuck-on fault detection tests for digital CMOS circuits. Search on Bibsonomy ETS The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Elham K. Moghaddam, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer, Justyna Zawada On Test Points Enhancing Hardware Security. Search on Bibsonomy ATS The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee 0001, Sudhakar M. Reddy, Janusz Rajski, Jerzy Tyszer Minimal area test points for deterministic patterns. Search on Bibsonomy ITC The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Elham K. Moghaddam, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer, Justyna Zawada Test point insertion in hybrid test compression/LBIST architectures. Search on Bibsonomy ITC The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Nilanjan Mukherjee 0001, Janusz Rajski Digital Testing of ICs for Automotive Applications. Search on Bibsonomy VLSI Design The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Michal Filipek, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Benoit Nadeau-Dostie, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer Low-Power Programmable PRPG With Test Compression Capabilities. Search on Bibsonomy IEEE Trans. VLSI Syst. The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Wu-Tung Cheng, Yan Dong, Grady Giles, Yu Huang 0005, Jakub Janicki, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer Scan Test Bandwidth Management for Ultralarge-Scale System-on-Chip Architectures. Search on Bibsonomy IEEE Trans. VLSI Syst. The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Amit Kumar 0004, Mark Kassab, Elham K. Moghaddam, Nilanjan Mukherjee 0001, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Chen Wang 0014 Isometric Test Data Compression. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Xijiang Lin, Wu-Tung Cheng, Janusz Rajski On Improving Transition Test Set Quality to Detect CMOS Transistor Stuck-Open Faults. Search on Bibsonomy ATS The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Grzegorz Mrugalski, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Chen Wang 0014 TestExpress - New Time-Effective Scan-Based Deterministic Test Paradigm. Search on Bibsonomy ATS The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Guoliang Li, Jun Qian, Qinfu Yang, Yuan Zuo, Rui Li, Yu Huang, Mark Kassab, Janusz Rajski Hybrid Hierarchical and Modular Tests for SoC Designs. Search on Bibsonomy NATW The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Janusz Rajski, Nilanjan Mukherjee 0001 Innovative practices session 11C: Advanced scan methodologies [3 presentations]. Search on Bibsonomy VTS The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Kun-Han Tsai, Janusz Rajski Clock-domain-aware test for improving pattern compression. Search on Bibsonomy VLSI-DAT The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Grzegorz Mrugalski, Janusz Rajski, Lukasz Rybak, Jedrzej Solecki, Jerzy Tyszer A deterministic BIST scheme based on EDT-compressed test patterns. Search on Bibsonomy ITC The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Cesar Acero, Derek Feltham, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee 0001, Vidya Neerkundar, Marek Patyra, Janusz Rajski, Jerzy Tyszer, Justyna Zawada Embedded deterministic test points for compact cell-aware tests. Search on Bibsonomy ITC The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Xijiang Lin, Sudhakar M. Reddy, Janusz Rajski Using Boolean Tests to Improve Detection of Transistor Stuck-Open Faults in CMOS Digital Logic Circuits. Search on Bibsonomy VLSI Design The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Haluk Konuk, Elham K. Moghaddam, Nilanjan Mukherjee 0001, Janusz Rajski, Deepak Solanki, Jerzy Tyszer, Justyna Zawada Design for low test pattern counts. Search on Bibsonomy DAC The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Jakub Janicki, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer Erratum to "Test Time Reduction in EDT Bandwidth Management for SoC Designs". Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Friedrich Hapke, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, Michael Reese, Marek Hustava, Martin Keim, Juergen Schloeffel, Anja Fast Cell-Aware Test. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Albert Au, Artur Pogiel, Janusz Rajski, Piotr Sydow, Jerzy Tyszer, Justyna Zawada Quality assurance in memory built-in self-test tools. Search on Bibsonomy DDECS The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Friedrich Hapke, Ralf Arnold, Matthias Beck, M. Baby, S. Straehle, J. F. Goncalves, A. Panait, R. Behr, G. Maugard, A. Prashanthi, Juergen Schloeffel, Wilfried Redemund, Andreas Glowatz, Anja Fast, Janusz Rajski Cell-aware experiences in a high-quality automotive test suite. Search on Bibsonomy ETS The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Xijiang Lin, Mark Kassab, Janusz Rajski Using dynamic shift to reduce test data volume in high-compression designs. Search on Bibsonomy ETS The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Maciej Trawka, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Artur Pogiel, Janusz Rajski, Jakub Janicki, Jerzy Tyszer High-Speed Serial Embedded Deterministic Test for System-on-Chip Designs. Search on Bibsonomy ATS The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Sylwester Milewski, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer Low Power Test Compression with Programmable Broadcast-Based Control. Search on Bibsonomy ATS The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Yu Huang, Mark Kassab, Jay Jahangiri, Janusz Rajski, Wu-Tung Cheng, Dongkwan Han, Jihye Kim, Kun Young Chung Test Compression Improvement with EDT Channel Sharing in SoC Designs. Search on Bibsonomy NATW The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Jacob A. Abraham, Xinli Gu, Teresa MacLaurin, Janusz Rajski, Paul G. Ryan, Dimitris Gizopoulos, Matteo Sonza Reorda Special session 8B - Panel: In-field testing of SoC devices: Which solutions by which players? Search on Bibsonomy VTS The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Amit Kumar 0004, Mark Kassab, Elham K. Moghaddam, Nilanjan Mukherjee 0001, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Chen Wang 0014 Isometric test compression with low toggling activity. Search on Bibsonomy ITC The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Marcin Gebala, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer On Using Implied Values in EDT-based Test Compression. Search on Bibsonomy DAC The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Jakub Janicki, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer Test Time Reduction in EDT Bandwidth Management for SoC Designs. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer On Deploying Scan Chains for Data Storage in Test Compression Environment. Search on Bibsonomy IEEE Design & Test The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Janusz Rajski, Miodrag Potkonjak, Adit D. Singh, Abhijit Chatterjee, Zain Navabi, Matthew R. Guthaus, Sezer Gören Embedded tutorials: Embedded tutorial 1: Cell-aware test-from gates to transistors. Search on Bibsonomy VLSI-SoC The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Jerzy Tyszer, Michal Filipek, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski New test compression scheme based on low power BIST. Search on Bibsonomy ETS The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Amit Kumar 0004, Janusz Rajski, Sudhakar M. Reddy, Thomas Rinderknecht On the Generation of Compact Deterministic Test Sets for BIST Ready Designs. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Janusz Rajski, Jerzy Tyszer Fault diagnosis of TSV-based interconnects in 3-D stacked designs. Search on Bibsonomy ITC The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Amit Kumar 0004, Janusz Rajski, Sudhakar M. Reddy, Chen Wang 0014 On the generation of compact test sets. Search on Bibsonomy ITC The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Jakub Janicki, Jerzy Tyszer, Wu-Tung Cheng, Yu Huang 0005, Mark Kassab, Nilanjan Mukherjee 0001, Janusz Rajski, Y. Dong, G. Giles EDT bandwidth management - Practical scenarios for large SoC designs. Search on Bibsonomy ITC The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Jakub Janicki, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer EDT Bandwidth Management in SoC Designs. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Jakub Janicki, Jerzy Tyszer, Grzegorz Mrugalski, Janusz Rajski Bandwidth-aware test compression logic for SoC designs. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Xijiang Lin, Janusz Rajski On Utilizing Test Cube Properties to Reduce Test Data Volume Further. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Benoit Nadeau-Dostie Test generator with preselected toggling for low power built-in self-test. Search on Bibsonomy VTS The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Jedrzej Solecki, Jerzy Tyszer, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski Low power programmable PRPG with enhanced fault coverage gradient. Search on Bibsonomy ITC The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Dariusz Czysz, Janusz Rajski, Jerzy Tyszer Low power test application with selective compaction in VLSI designs. Search on Bibsonomy ITC The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Friedrich Hapke, Michael Reese, Jason Rivers, A. Over, V. Ravikumar, Wilfried Redemund, Andreas Glowatz, Jürgen Schlöffel, Janusz Rajski Cell-aware Production test results from a 32-nm notebook processor. Search on Bibsonomy ITC The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Nilanjan Mukherjee 0001, Janusz Rajski, Grzegorz Mrugalski, Artur Pogiel, Jerzy Tyszer Ring Generator: An Ultimate Linear Feedback Shift Register. Search on Bibsonomy IEEE Computer The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, P. Szczerbicki, Jerzy Tyszer Deterministic Clustering of Incompatible Test Cubes for Higher Power-Aware EDT Compression. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Nilanjan Mukherjee 0001, Artur Pogiel, Janusz Rajski, Jerzy Tyszer BIST-Based Fault Diagnosis for Read-Only Memories. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs. Search on Bibsonomy J. Electronic Testing The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer Reduced ATE Interface for High Test Data Compression. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF channel bandwidth management, embedded deterministic test, test interface, tri-modal compression, test data compression, scan-based designs
1Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer Diagnosis of Failing Scan Cells through Orthogonal Response Compaction. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Michal Filipek, Yoshiaki Fukui, Hiroyuki Iwata, Grzegorz Mrugalski, Janusz Rajski, Masahiro Takakura, Jerzy Tyszer Low Power Decompressor and PRPG with Constant Value Broadcast. Search on Bibsonomy Asian Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Xijiang Lin, Elham K. Moghaddam, Nilanjan Mukherjee 0001, Benoit Nadeau-Dostie, Janusz Rajski, Jerzy Tyszer Power Aware Embedded Test. Search on Bibsonomy Asian Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Grzegorz Mrugalski, Artur Pogiel, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer, Pawel Urbanek Fault Diagnosis in Memory BIST Environment with Non-march Tests. Search on Bibsonomy Asian Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Jakub Janicki Low Test Data Volume Low Power At-Speed Delay Tests Using Clock-Gating. Search on Bibsonomy Asian Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Friedrich Hapke, Jürgen Schlöffel, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, Michael Reese, J. Rearick, Jason Rivers Cell-aware analysis for small-delay effects and production test results from different fault models. Search on Bibsonomy ITC The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Jakub Janicki, Jerzy Tyszer, Avijit Dutta, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski EDT channel bandwidth management in SoC designs with pattern-independent test access mechanism. Search on Bibsonomy ITC The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Janusz Rajski, Elham K. Moghaddam, Sudhakar M. Reddy Low power compression utilizing clock-gating. Search on Bibsonomy ITC The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Nilanjan Mukherjee 0001, Artur Pogiel, Janusz Rajski, Jerzy Tyszer High Volume Diagnosis in Memory BIST Based on Compressed Failure Data. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer On Compaction Utilizing Inter and Intra-Correlation of Unknown States. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer Diagnosis of failing scan cells through orthogonal response compaction. Search on Bibsonomy European Test Symposium The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Xijiang Lin, Janusz Rajski Adaptive Low Shift Power Test Pattern Generator for Logic BIST. Search on Bibsonomy Asian Test Symposium The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Mark Kassab At-speed scan test with low switching activity. Search on Bibsonomy VTS The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, P. Szczerbicki, Jerzy Tyszer Low power compression of incompatible test cubes. Search on Bibsonomy ITC The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jakub Janicki, Jerzy Tyszer Dynamic channel allocation for higher EDT compression in SoC designs. Search on Bibsonomy ITC The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Xijiang Lin, Nilanjan Mukherjee 0001, Mark Kassab Low capture power at-speed test in EDT environment. Search on Bibsonomy ITC The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Vishal J. Mehta, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski Timing-Aware Multiple-Delay-Fault Diagnosis. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Dariusz Czysz, Mark Kassab, Xijiang Lin, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer Low-Power Scan Operation in Test Compression Environment. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Santiago Remersaro, Janusz Rajski, Sudhakar M. Reddy, Irith Pomeranz A scalable method for the generation of small test sets. Search on Bibsonomy DATE The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Janusz Rajski We Have Got Compression, What Next? Search on Bibsonomy European Test Symposium The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Gang Chen 0011, Janusz Rajski, Sudhakar M. Reddy, Irith Pomeranz N-distinguishing Tests for Enhanced Defect Diagnosis. Search on Bibsonomy Asian Test Symposium The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer Highly X-Tolerant Selective Compaction of Test Responses. Search on Bibsonomy VTS The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer Compression based on deterministic vector clustering of incompatible test cubes. Search on Bibsonomy ITC The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Nilanjan Mukherjee 0001, Artur Pogiel, Janusz Rajski, Jerzy Tyszer Fault diagnosis for embedded read-only memories. Search on Bibsonomy ITC The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer Defect Aware to Power Conscious Tests - The New DFT Landscape. Search on Bibsonomy VLSI Design The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Nilanjan Mukherjee 0001, Artur Pogiel, Janusz Rajski, Jerzy Tyszer High-Speed On-Chip Event Counters for Embedded Systems. Search on Bibsonomy VLSI Design The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Vishal J. Mehta, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski Improving the Resolution of Single-Delay-Fault Diagnosis. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Wu-Tung Cheng, Nilanjan Mukherjee 0001, Mark Kassab X-Press: Two-Stage X-Tolerant Compactor With Programmable Selector. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer Low-Power Test Data Application in EDT Environment Through Decompressor Freeze. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Xijiang Lin, Janusz Rajski Test Power Reduction by Blocking Scan Cell Outputs. Search on Bibsonomy ATS The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Santiago Remersaro, Janusz Rajski, Thomas Rinderknecht, Sudhakar M. Reddy, Irith Pomeranz ATPG Heuristics Dependant Observation Point Insertion for Enhanced Compaction and Data Volume Reduction. Search on Bibsonomy DFT The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Vishal J. Mehta, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski Timing-Aware Multiple-Delay-Fault Diagnosis. Search on Bibsonomy ISQED The full citation details ... 2008 DBLP  DOI  BibTeX  RDF defect-diagnosis, diagnosis, ATPG, DFT, delay-testing
1Nilanjan Mukherjee 0001, Artur Pogiel, Janusz Rajski, Jerzy Tyszer High Throughput Diagnosis via Compression of Failure Data in Embedded Memory BIST. Search on Bibsonomy ITC The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Dariusz Czysz, Mark Kassab, Xijiang Lin, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer Low Power Scan Shift and Capture in the EDT Environment. Search on Bibsonomy ITC The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Xijiang Lin, Janusz Rajski Test Generation for Interconnect Opens. Search on Bibsonomy ITC The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Zhuo Zhang, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski, Bashir M. Al-Hashimi Enhancing delay fault coverage through low-power segmented scan. Search on Bibsonomy IET Computers & Digital Techniques The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
1Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer Fault Diagnosis With Convolutional Compactors. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
1Grzegorz Mrugalski, Janusz Rajski, Chen Wang 0014, Artur Pogiel, Jerzy Tyszer Isolation of Failing Scan Cells through Convolutional Test Response Compaction. Search on Bibsonomy J. Electronic Testing The full citation details ... 2007 DBLP  DOI  BibTeX  RDF convolutional compactors, fault diagnosis, test response compaction, scan-based designs
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