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Publications of "Jerzy Tyszer" ( http://dblp.L3S.de/Authors/Jerzy_Tyszer )

  Author page on DBLP  Author page in RDF  Community of Jerzy Tyszer in ASPL-2

Publication years (Num. hits)
1984-1995 (19) 1996-1999 (18) 2000-2004 (17) 2005-2008 (18) 2009-2011 (21) 2012-2014 (16) 2015-2017 (16) 2018-2019 (7)
Publication types (Num. hits)
article(54) inproceedings(78)
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The graphs summarize 71 occurrences of 39 keywords

Results
Found 133 publication records. Showing 132 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
1Elham K. Moghaddam, Nilanjan Mukherjee 0001, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Justyna Zawada Logic BIST With Capture-Per-Clock Hybrid Test Points. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Wu-Tung Cheng, Grzegorz Mrugalski, Janusz Rajski, Maciej Trawka, Jerzy Tyszer On Cyclic Scan Integrity Tests for EDT-based Compression. Search on Bibsonomy VTS The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Michael Chen, Elham K. Moghaddam, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer, Justyna Zawada Hardware Protection via Logic Locking Test Points. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Yingdi Liu, Janusz Rajski, Sudhakar M. Reddy, Jedrzej Solecki, Jerzy Tyszer Staggered ATPG with capture-per-cycle observation test points. Search on Bibsonomy VTS The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Yingdi Liu, Nilanjan Mukherjee 0001, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer Deterministic Stellar BIST for In-System Automotive Test. Search on Bibsonomy ITC The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Janusz Rajski, Jerzy Tyszer, Justyna Zawada On New Class of Test Points and Their Applications. Search on Bibsonomy ITC The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Yu Huang 0005, Sylwester Milewski, Janusz Rajski, Jerzy Tyszer, Chen Wang 0014 Hypercompression of Test Patterns. Search on Bibsonomy ITC The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Cesar Acero, Derek Feltham, Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee 0001, Marek Patyra, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Justyna Zawada Embedded Deterministic Test Points. Search on Bibsonomy IEEE Trans. VLSI Syst. The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Grzegorz Mrugalski, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Chen Wang 0014 Trimodal Scan-Based Test Paradigm. Search on Bibsonomy IEEE Trans. VLSI Syst. The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Grzegorz Mrugalski, Janusz Rajski, Lukasz Rybak, Jedrzej Solecki, Jerzy Tyszer Star-EDT: Deterministic On-Chip Scheme Using Compressed Test Patterns. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Artur Pogiel, Janusz Rajski, Jerzy Tyszer ROM fault diagnosis for O(n2) test algorithms. Search on Bibsonomy ETS The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Sylwester Milewski, Nilanjan Mukherjee 0001, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Justyna Zawada Full-scan LBIST with capture-per-cycle hybrid test points. Search on Bibsonomy ITC The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Cesar Acero, Derek Feltham, Marek Patyra, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee 0001, Vidya Neerkundar, Janusz Rajski, Jerzy Tyszer, Justyna Zawada On New Test Points for Compact Cell-Aware Tests. Search on Bibsonomy IEEE Design & Test The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Elham K. Moghaddam, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer, Justyna Zawada On Test Points Enhancing Hardware Security. Search on Bibsonomy ATS The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee 0001, Sudhakar M. Reddy, Janusz Rajski, Jerzy Tyszer Minimal area test points for deterministic patterns. Search on Bibsonomy ITC The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Elham K. Moghaddam, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer, Justyna Zawada Test point insertion in hybrid test compression/LBIST architectures. Search on Bibsonomy ITC The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Michal Filipek, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Benoit Nadeau-Dostie, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer Low-Power Programmable PRPG With Test Compression Capabilities. Search on Bibsonomy IEEE Trans. VLSI Syst. The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Wu-Tung Cheng, Yan Dong, Grady Giles, Yu Huang 0005, Jakub Janicki, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer Scan Test Bandwidth Management for Ultralarge-Scale System-on-Chip Architectures. Search on Bibsonomy IEEE Trans. VLSI Syst. The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Amit Kumar 0004, Mark Kassab, Elham K. Moghaddam, Nilanjan Mukherjee 0001, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Chen Wang 0014 Isometric Test Data Compression. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Haluk Konuk, Elham K. Moghaddam, Nilanjan Mukherjee 0001, Janusz Rajski, Deepak Solanki, Jerzy Tyszer, Justyna Zawada Design for low test pattern counts. Search on Bibsonomy DAC The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Grzegorz Mrugalski, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Chen Wang 0014 TestExpress - New Time-Effective Scan-Based Deterministic Test Paradigm. Search on Bibsonomy ATS The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Cesar Acero, Derek Feltham, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee 0001, Vidya Neerkundar, Marek Patyra, Janusz Rajski, Jerzy Tyszer, Justyna Zawada Embedded deterministic test points for compact cell-aware tests. Search on Bibsonomy ITC The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Grzegorz Mrugalski, Janusz Rajski, Lukasz Rybak, Jedrzej Solecki, Jerzy Tyszer A deterministic BIST scheme based on EDT-compressed test patterns. Search on Bibsonomy ITC The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Jakub Janicki, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer Erratum to "Test Time Reduction in EDT Bandwidth Management for SoC Designs". Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Marcin Gebala, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer On Using Implied Values in EDT-based Test Compression. Search on Bibsonomy DAC The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Maciej Trawka, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Artur Pogiel, Janusz Rajski, Jakub Janicki, Jerzy Tyszer High-Speed Serial Embedded Deterministic Test for System-on-Chip Designs. Search on Bibsonomy ATS The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Sylwester Milewski, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer Low Power Test Compression with Programmable Broadcast-Based Control. Search on Bibsonomy ATS The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Albert Au, Artur Pogiel, Janusz Rajski, Piotr Sydow, Jerzy Tyszer, Justyna Zawada Quality assurance in memory built-in self-test tools. Search on Bibsonomy DDECS The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Amit Kumar 0004, Mark Kassab, Elham K. Moghaddam, Nilanjan Mukherjee 0001, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Chen Wang 0014 Isometric test compression with low toggling activity. Search on Bibsonomy ITC The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer On Deploying Scan Chains for Data Storage in Test Compression Environment. Search on Bibsonomy IEEE Design & Test The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Jakub Janicki, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer Test Time Reduction in EDT Bandwidth Management for SoC Designs. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Jerzy Tyszer, Michal Filipek, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski New test compression scheme based on low power BIST. Search on Bibsonomy ETS The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Janusz Rajski, Jerzy Tyszer Fault diagnosis of TSV-based interconnects in 3-D stacked designs. Search on Bibsonomy ITC The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Jakub Janicki, Jerzy Tyszer, Wu-Tung Cheng, Yu Huang 0005, Mark Kassab, Nilanjan Mukherjee 0001, Janusz Rajski, Y. Dong, G. Giles EDT bandwidth management - Practical scenarios for large SoC designs. Search on Bibsonomy ITC The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Jakub Janicki, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer EDT Bandwidth Management in SoC Designs. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Benoit Nadeau-Dostie Test generator with preselected toggling for low power built-in self-test. Search on Bibsonomy VTS The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Jakub Janicki, Jerzy Tyszer, Grzegorz Mrugalski, Janusz Rajski Bandwidth-aware test compression logic for SoC designs. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Jedrzej Solecki, Jerzy Tyszer, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski Low power programmable PRPG with enhanced fault coverage gradient. Search on Bibsonomy ITC The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Dariusz Czysz, Janusz Rajski, Jerzy Tyszer Low power test application with selective compaction in VLSI designs. Search on Bibsonomy ITC The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Nilanjan Mukherjee 0001, Janusz Rajski, Grzegorz Mrugalski, Artur Pogiel, Jerzy Tyszer Ring Generator: An Ultimate Linear Feedback Shift Register. Search on Bibsonomy IEEE Computer The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs. Search on Bibsonomy J. Electronic Testing The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Nilanjan Mukherjee 0001, Artur Pogiel, Janusz Rajski, Jerzy Tyszer BIST-Based Fault Diagnosis for Read-Only Memories. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, P. Szczerbicki, Jerzy Tyszer Deterministic Clustering of Incompatible Test Cubes for Higher Power-Aware EDT Compression. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Xijiang Lin, Elham K. Moghaddam, Nilanjan Mukherjee 0001, Benoit Nadeau-Dostie, Janusz Rajski, Jerzy Tyszer Power Aware Embedded Test. Search on Bibsonomy Asian Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Michal Filipek, Yoshiaki Fukui, Hiroyuki Iwata, Grzegorz Mrugalski, Janusz Rajski, Masahiro Takakura, Jerzy Tyszer Low Power Decompressor and PRPG with Constant Value Broadcast. Search on Bibsonomy Asian Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Grzegorz Mrugalski, Artur Pogiel, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer, Pawel Urbanek Fault Diagnosis in Memory BIST Environment with Non-march Tests. Search on Bibsonomy Asian Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer Reduced ATE Interface for High Test Data Compression. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF channel bandwidth management, embedded deterministic test, test interface, tri-modal compression, test data compression, scan-based designs
1Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer Diagnosis of Failing Scan Cells through Orthogonal Response Compaction. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Jakub Janicki, Jerzy Tyszer, Avijit Dutta, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski EDT channel bandwidth management in SoC designs with pattern-independent test access mechanism. Search on Bibsonomy ITC The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Nilanjan Mukherjee 0001, Artur Pogiel, Janusz Rajski, Jerzy Tyszer High Volume Diagnosis in Memory BIST Based on Compressed Failure Data. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer On Compaction Utilizing Inter and Intra-Correlation of Unknown States. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer Diagnosis of failing scan cells through orthogonal response compaction. Search on Bibsonomy European Test Symposium The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jakub Janicki, Jerzy Tyszer Dynamic channel allocation for higher EDT compression in SoC designs. Search on Bibsonomy ITC The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, P. Szczerbicki, Jerzy Tyszer Low power compression of incompatible test cubes. Search on Bibsonomy ITC The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Dariusz Czysz, Mark Kassab, Xijiang Lin, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer Low-Power Scan Operation in Test Compression Environment. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Nilanjan Mukherjee 0001, Artur Pogiel, Janusz Rajski, Jerzy Tyszer High-Speed On-Chip Event Counters for Embedded Systems. Search on Bibsonomy VLSI Design The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer Defect Aware to Power Conscious Tests - The New DFT Landscape. Search on Bibsonomy VLSI Design The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer Highly X-Tolerant Selective Compaction of Test Responses. Search on Bibsonomy VTS The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Nilanjan Mukherjee 0001, Artur Pogiel, Janusz Rajski, Jerzy Tyszer Fault diagnosis for embedded read-only memories. Search on Bibsonomy ITC The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer Compression based on deterministic vector clustering of incompatible test cubes. Search on Bibsonomy ITC The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Wu-Tung Cheng, Nilanjan Mukherjee 0001, Mark Kassab X-Press: Two-Stage X-Tolerant Compactor With Programmable Selector. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer Low-Power Test Data Application in EDT Environment Through Decompressor Freeze. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Nilanjan Mukherjee 0001, Artur Pogiel, Janusz Rajski, Jerzy Tyszer High Throughput Diagnosis via Compression of Failure Data in Embedded Memory BIST. Search on Bibsonomy ITC The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Dariusz Czysz, Mark Kassab, Xijiang Lin, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer Low Power Scan Shift and Capture in the EDT Environment. Search on Bibsonomy ITC The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Jerzy Tyszer, Janusz Rajski, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Mark Kassab, Wu-Tung Cheng, Manish Sharma, Liyang Lai X-Tolerant Compactor with On-Chip Registration and Signature-Based Diagnosis. Search on Bibsonomy IEEE Design & Test of Computers The full citation details ... 2007 DBLP  DOI  BibTeX  RDF on-chip collection of test data, selective compaction of test responses, fault diagnosis, DFT, embedded test, scan-based designs
1Grzegorz Mrugalski, Janusz Rajski, Chen Wang 0014, Artur Pogiel, Jerzy Tyszer Isolation of Failing Scan Cells through Convolutional Test Response Compaction. Search on Bibsonomy J. Electronic Testing The full citation details ... 2007 DBLP  DOI  BibTeX  RDF convolutional compactors, fault diagnosis, test response compaction, scan-based designs
1Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer Fault Diagnosis With Convolutional Compactors. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
1Grzegorz Mrugalski, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer New Test Data Decompressor for Low Power Applications. Search on Bibsonomy DAC The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
1Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer Low Power Embedded Deterministic Test. Search on Bibsonomy VTS The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
1Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer High Performance Dense Ring Generators. Search on Bibsonomy IEEE Trans. Computers The full citation details ... 2006 DBLP  DOI  BibTeX  RDF ring generators, Built-in self-test, design for testability, linear feedback shift registers, phase shifters
1Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer Test response compactor with programmable selector. Search on Bibsonomy DAC The full citation details ... 2006 DBLP  DOI  BibTeX  RDF scan chain selection, unknown states, compression, VLSI test
1Artur Pogiel, Janusz Rajski, Jerzy Tyszer Convolutional Compactors with Variable Polynomials. Search on Bibsonomy European Test Symposium The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Wu-Tung Cheng, Nilanjan Mukherjee 0001, Mark Kassab X-Press Compactor for 1000x Reduction of Test Data. Search on Bibsonomy ITC The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Janusz Rajski, Jerzy Tyszer, Chen Wang 0014, Sudhakar M. Reddy Finite memory test response compactors for embedded test applications. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1Huaxing Tang, Chen Wang 0014, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Irith Pomeranz On Efficient X-Handling Using a Selective Compaction Scheme to Achieve High Test Response Compaction Ratios. Search on Bibsonomy VLSI Design The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1Janusz Rajski, Jerzy Tyszer Synthesis of X-Tolerant Convolutional Compactors. Search on Bibsonomy VTS The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer, Chen Wang 0014 Convolutional compaction-driven diagnosis of scan failures. Search on Bibsonomy European Test Symposium The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer Diagnosis with convolutional compactors in presence of unknown states. Search on Bibsonomy ITC The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer Ring generators - new devices for embedded test applications. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
1Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee 0001 Embedded deterministic test. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
1Janusz Rajski, Nilanjan Mukherjee 0001, Jerzy Tyszer, Thomas Rinderknecht Embedded Test for Low Cost Manufacturing. Search on Bibsonomy VLSI Design The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
1Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer Planar High Performance Ring Generators. Search on Bibsonomy VTS The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
1Grzegorz Mrugalski, Chen Wang 0014, Artur Pogiel, Jerzy Tyszer, Janusz Rajski Fault Diagnosis in Designs with Convolutional Compactors. Search on Bibsonomy ITC The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
1Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski 2D Test Sequence Generators. Search on Bibsonomy IEEE Design & Test of Computers The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
1Janusz Rajski, Mark Kassab, Nilanjan Mukherjee 0001, Nagesh Tamarapalli, Jerzy Tyszer, Jun Qian Embedded Deterministic Test for Low-Cost Manufacturing. Search on Bibsonomy IEEE Design & Test of Computers The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
1Janusz Rajski, Jerzy Tyszer Primitive Polynomials Over GF(2) of Degree up to 660 with Uniformly Distributed Coefficients. Search on Bibsonomy J. Electronic Testing The full citation details ... 2003 DBLP  DOI  BibTeX  RDF ring generators, linear feedback shift registers, primitive polynomials
1Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer High Speed Ring Generators and Compactors of Test Data. Search on Bibsonomy VTS The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
1Chen Wang 0014, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski, Jerzy Tyszer On Compacting Test Response Data Containing Unknown Values. Search on Bibsonomy ICCAD The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
1Janusz Rajski, Jerzy Tyszer Test Data Compression and Compaction for Embedded Test of Nanometer Technology Designs. Search on Bibsonomy ICCD The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
1Janusz Rajski, Jerzy Tyszer, Chen Wang 0014, Sudhakar M. Reddy Convolutional Compaction of Test Responses. Search on Bibsonomy ITC The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
1Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee 0001, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski, Geir Eide, Jun Qian Embedded Deterministic Test for Low-Cost Manufacturing Test. Search on Bibsonomy ITC The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
1Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer Testing Schemes for FIR Filter Structures. Search on Bibsonomy IEEE Trans. Computers The full citation details ... 2001 DBLP  DOI  BibTeX  RDF Complex multipliers, sign-extended adders, trees of adders, design for testability, FIR filters, state coverage, pseudoexhaustive testing, cell fault model
1Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer Cellular automata-based test pattern generators with phase shifters. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2000 DBLP  DOI  BibTeX  RDF
1Janusz Rajski, Nagesh Tamarapalli, Jerzy Tyszer Automated synthesis of phase shifters for built-in self-testapplications. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2000 DBLP  DOI  BibTeX  RDF
1Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski Linear Independence as Evaluation Criterion for Two-Dimensional Test Pattern Generators. Search on Bibsonomy VTS The full citation details ... 2000 DBLP  DOI  BibTeX  RDF Linear Dependencies, Built-In Self-Test, Test Pattern Generators, Phase Shifters
1Janusz Rajski, Jerzy Tyszer Diagnosis of Scan Cells in BIST Environment. Search on Bibsonomy IEEE Trans. Computers The full citation details ... 1999 DBLP  DOI  BibTeX  RDF multiple scan chains, fault diagnosis, Built-in self-test, design for testability, test-response compaction, scan-based design
1Janusz Rajski, Jerzy Tyszer Testing of telecommunications hardware [Guest Editorial]. Search on Bibsonomy IEEE Communications Magazine The full citation details ... 1999 DBLP  DOI  BibTeX  RDF
1Janusz Rajski, Jerzy Tyszer, Sanjay Patel Built-In Self-Test for Systems on Silicon. Search on Bibsonomy VLSI Design The full citation details ... 1999 DBLP  BibTeX  RDF
1Janusz Rajski, Grzegorz Mrugalski, Jerzy Tyszer Comparative Study of CA-based PRPGs and LFSRs with Phase Shifters. Search on Bibsonomy VTS The full citation details ... 1999 DBLP  DOI  BibTeX  RDF
1Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski Synthesis of pattern generators based on cellular automata with phase shifters. Search on Bibsonomy ITC The full citation details ... 1999 DBLP  DOI  BibTeX  RDF
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