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Publications of "Jochen Rivoir" ( http://dblp.L3S.de/Authors/Jochen_Rivoir )

  Author page on DBLP  Author page in RDF  Community of Jochen Rivoir in ASPL-2

Publication years (Num. hits)
2001-2019 (13)
Publication types (Num. hits)
article(2) inproceedings(11)
Venues (Conferences, Journals, ...)
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Found 14 publication records. Showing 13 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
1Ghada Sokar, Yassien Zakaria, Asmaa Rabie, Kareem Madkour, Ira Leventhal, Jochen Rivoir, Xinli Gu, Haralampos-G. D. Stratigopoulos IP Session on Machine Learning Applications in IC Test-Related Tasks. Search on Bibsonomy VTS The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Felix Neubauer, Jan Burchard, Pascal Raiola, Jochen Rivoir, Bernd Becker 0001, Matthias Sauer 0002 Efficient generation of parametric test conditions for AMS chips with an interval constraint solver. Search on Bibsonomy VTS The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Nicolas Pous, Florence Azaïs, Laurent Latorre, Jochen Rivoir A Level-Crossing Approach for the Analysis of RF Modulated Signals Using Only Digital Test Resources. Search on Bibsonomy J. Electronic Testing The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Nicolas Pous, Florence Azaïs, Laurent Latorre, Jochen Rivoir On the use of standard digital ATE for the analysis of RF signals. Search on Bibsonomy European Test Symposium The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Nicolas Pous, Florence Azaïs, Laurent Latorre, Pascal Nouet, Jochen Rivoir Exploiting Zero-Crossing for the Analysis of FM Modulated Analog/RF Signals Using Digital ATE. Search on Bibsonomy Asian Test Symposium The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Jochen Rivoir Fully-Digital Time-To-Digital Converter for ATE with Autonomous Calibration. Search on Bibsonomy ITC The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Jochen Rivoir Low-Cost Analog Signal Generation Using a Pulse-Density Modulated Digital ATE Channel. Search on Bibsonomy Asian Test Symposium The full citation details ... 2004 DBLP  DOI  BibTeX  RDF low-cost ATE, multi-site test, mixed-signal test, concurrent test, low-cost test, test resource partitioning
1Erik H. Volkerink, Ajay Khoche, Jochen Rivoir, Klaus D. Hilliges Modern Test Techniques: Tradeoffs, Synergies, and Scalable Benefits. Search on Bibsonomy J. Electronic Testing The full citation details ... 2003 DBLP  DOI  BibTeX  RDF reduced pin-count, bandwidth matching, probecard, compression, BIST, DFT, ATE, test economics, low cost test, multi-site
1Jochen Rivoir Lowering Cost of Test: Parallel Test or Low-Cost ATE? Search on Bibsonomy Asian Test Symposium The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
1Ajay Khoche, Erik H. Volkerink, Jochen Rivoir, Subhasish Mitra Test Vector Compression Using EDA-ATE Synergies. Search on Bibsonomy VTS The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
1Erik H. Volkerink, Ajay Khoche, Jochen Rivoir, Klaus D. Hilliges Test Economics for Multi-site Test with Modern Cost Reduction Techniques. Search on Bibsonomy VTS The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
1Ajay Khoche, Rohit Kapur, David Armstrong, Thomas W. Williams, Mick Tegethoff, Jochen Rivoir A new methodology for improved tester utilization. Search on Bibsonomy ITC The full citation details ... 2001 DBLP  DOI  BibTeX  RDF
1Erik H. Volkerink, Ajay Khoche, Linda A. Kamas, Jochen Rivoir, Hans G. Kerkhoff Tackling test trade-offs from design, manufacturing to market using economic modeling. Search on Bibsonomy ITC The full citation details ... 2001 DBLP  DOI  BibTeX  RDF
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