The FacetedDBLP logo    Search for: in:

Disable automatic phrases ?     Syntactic query expansion: ?

Publications of "Kevin Sanchez" ( http://dblp.L3S.de/Authors/Kevin_Sanchez )

  Author page on DBLP  Author page in RDF  Community of Kevin Sanchez in ASPL-2

Publication years (Num. hits)
2003-2015 (15) 2016-2018 (6)
Publication types (Num. hits)
article(19) inproceedings(2)
GrowBag graphs for keyword ? (Num. hits/coverage)

Group by:
No Growbag Graphs found.

Results
Found 22 publication records. Showing 21 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
1Anthony Boscaro, Sabir Jacquir, Samuel Chef, Kevin Sanchez, Philippe Perdu, Stéphane Binczak Automatic localization of signal sources in photon emission images for integrated circuit analysis. Search on Bibsonomy Signal, Image and Video Processing The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Anthony Boscaro, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak Pattern image enhancement by automatic focus correction. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Anthony Boscaro, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak Automatic defect localization in VLSI circuits: A fusion approach based on the Dempster-Shafer theory. Search on Bibsonomy FUSION The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1C. T. Chua, Hock Guan Ong, Kevin Sanchez, Philippe Perdu, Chee Lip Gan Effects of voltage stress on the single event upset (SEU) response of 65 nm flip flop. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Anthony Boscaro, Sabir Jacquir, K. Melendez, Kevin Sanchez, Philippe Perdu, Stéphane Binczak Automatic process for time-frequency scan of VLSI. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Roberta Pilia, Guillaume Bascoul, Kevin Sanchez, Giovanna Mura, Fulvio Infante Single Event Transient acquisition and mapping for space device Characterization. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1K. Melendez, A. Desmoulin, Kevin Sanchez, Philippe Perdu, Dean Lewis A way to implement the electro-optical technique to inertial MEMS. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Samuel Chef, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak, Chee Lip Gan Unsupervised learning for signal mapping in dynamic photon emission. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Anthony Boscaro, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak Improvement of signal to noise ratio in electro optical probing technique by wavelets filtering. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Samuel Chef, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak Unsupervised image processing scheme for transistor photon emission analysis in order to identify defect location. Search on Bibsonomy J. Electronic Imaging The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Samuel Chef, Bastien Billiot, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak Pattern image enhancement by extended depth of field. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Mohamed Mehdi Rebaï, Frédéric Darracq, Jean-Paul Guillet, Elise Bernou, Kevin Sanchez, Philippe Perdu, Dean Lewis A comprehensive study of the application of the EOP techniques on bipolar devices. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Samuel Chef, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak Frequency mapping in dynamic light emission with wavelet transform. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1David Veyrié, Olivier Gilard, Kevin Sanchez, Sébastien Lhuillier, Frédéric Bourcier New methodology for the assessment of the thermal resistance of laser diodes and light emitting diodes. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1A. Deyine, Kevin Sanchez, Philippe Perdu, F. Battistella, Dean Lewis CADless laser assisted methodologies for failure analysis and device reliability. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1M. Sienkiewicz, Philippe Perdu, Abdellatif Firiti, Kevin Sanchez, Olivier Crépel, Dean Lewis Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Felix Beaudoin, Kevin Sanchez, Philippe Perdu Dynamic laser stimulation techniques for advanced failure analysis and design debug applications. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
1Julie Ferrigno, Philippe Perdu, Kevin Sanchez, Dean Lewis Identification of process/design issues during 0.18 µm technology qualification for space application. Search on Bibsonomy DATE The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
1Kevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, Dean Lewis NIR laser stimulation for dynamic timing analysis. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1Felix Beaudoin, Kevin Sanchez, Romain Desplats, Philippe Perdu, Jean Marc Nicot, J. P. Roux, M. Otte Dynamic Laser Stimulation Case Studies. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1Kevin Sanchez, Romain Desplats, Guy Perez, V. Pichetto, Felix Beaudoin, Philippe Perdu Solar Cell Analysis with Light Emission and OBIC Techniques. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
Displaying result #1 - #21 of 21 (100 per page; Change: )
Valid XHTML 1.1! Valid CSS! [Valid RSS]
Maintained by Jörg Diederich.
Based upon DBLP by Michael Ley.
open data data released under the ODC-BY 1.0 license