Search results for "Kohei Miyase"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
1	Shyue-Kung Lu, Hung-Kai Huang, Chun-Lung Hsu, Chi-Tien Sun, Kohei Miyase	Retention-Aware Refresh Techniques for Reducing Power and Mitigation of Data Retention Faults in DRAM.	J. Electronic Testing	2019	DBLP DOI BibTeX RDF
1	Kohei Miyase, Yudai Kawano, Shyue-Kung Lu, Xiaoqing Wen, Seiji Kajihara	A Static Method for Analyzing Hotspot Distribution on the LSI.	ITC-Asia	2019	DBLP DOI BibTeX RDF
1	Yucong Zhang, Xiaoqin Wen, Stefan Holst, Kohei Miyase, Seiji Kajihara, Hans-Joachim Wunderlich, Jun Qian	Clock-Skew-Aware Scan Chain Grouping for Mitigating Shift Timing Failures in Low-Power Scan Testing.	ATS	2018	DBLP DOI BibTeX RDF
1	Shyue-Kung Lu, Hui-Ping Li, Kohei Miyase	Progressive ECC Techniques for Phase Change Memory.	ATS	2018	DBLP DOI BibTeX RDF
1	Shyue-Kung Lu, Hui-Ping Li, Kohei Miyase	Adaptive ECC Techniques for Reliability and Yield Enhancement of Phase Change Memory.	IOLTS	2018	DBLP DOI BibTeX RDF
1	Yucong Zhang, Stefan Holst, Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Jun Qian	Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption.	ATS	2017	DBLP DOI BibTeX RDF
1	Stefan Holst, Eric Schneider, Koshi Kawagoe, Michael A. Kochte, Kohei Miyase, Hans-Joachim Wunderlich, Seiji Kajihara, Xiaoqing Wen	Analysis and mitigation or IR-Drop induced scan shift-errors.	ITC	2017	DBLP DOI BibTeX RDF
1	Fuqiang Li, Xiaoqing Wen, Kohei Miyase, Stefan Holst, Seiji Kajihara	Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation.	IEICE Transactions	2016	DBLP DOI BibTeX RDF
1	Stephan Eggersglüß, Kohei Miyase, Xiaoqing Wen	SAT-based post-processing for regional capture power reduction in at-speed scan test generation.	ETS	2016	DBLP DOI BibTeX RDF
1	Stephan Eggersglüß, Stefan Holst, Daniel Tille, Kohei Miyase, Xiaoqing Wen	Formal Test Point Insertion for Region-based Low-Capture-Power Compact At-Speed Scan Test.	ATS	2016	DBLP DOI BibTeX RDF
1	Matthias Sauer 0002, Jie Jiang, Sven Reimer, Kohei Miyase, Xiaoqing Wen, Bernd Becker 0001, Ilia Polian	On Optimal Power-Aware Path Sensitization.	ATS	2016	DBLP DOI BibTeX RDF
1	Kohei Miyase, Matthias Sauer 0002, Bernd Becker 0001, Xiaoqing Wen, Seiji Kajihara	Identification of high power consuming areas with gate type and logic level information.	ETS	2015	DBLP DOI BibTeX RDF
1	Infall Syafalni, Tsutomu Sasao, Xiaoqing Wen, Stefan Holst, Kohei Miyase	A soft-error tolerant TCAM using partial don't-care keys.	ETS	2015	DBLP DOI BibTeX RDF
1	K. Asada, Xiaoqing Wen, Stefan Holst, Kohei Miyase, Seiji Kajihara, Michael A. Kochte, Eric Schneider, Hans-Joachim Wunderlich, J. Qian	Logic/Clock-Path-Aware At-Speed Scan Test Generation for Avoiding False Capture Failures and Reducing Clock Stretch.	ATS	2015	DBLP DOI BibTeX RDF
1	Akihiro Tomita, Xiaoqing Wen, Yasuo Sato, Seiji Kajihara, Kohei Miyase, Stefan Holst, Patrick Girard 0001, Mohammad Tehranipoor, Laung-Terng Wang	On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST.	IEICE Transactions	2014	DBLP DOI BibTeX RDF
1	Infall Syafalni, Tsutomu Sasao, Xiaoqing Wen, Stefan Holst, Kohei Miyase	Soft-error tolerant TCAMs for high-reliability packet classifications.	APCCAS	2014	DBLP DOI BibTeX RDF
1	Senling Wang, Yasuo Sato, Seiji Kajihara, Kohei Miyase	Scan-Out Power Reduction for Logic BIST.	IEICE Transactions	2013	DBLP DOI BibTeX RDF
1	Kohei Miyase, Ryota Sakai, Xiaoqing Wen, Masao Aso, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara	A Capture-Safety Checking Metric Based on Transition-Time-Relation for At-Speed Scan Testing.	IEICE Transactions	2013	DBLP DOI BibTeX RDF
1	Yuta Yamato, Kohei Miyase, Seiji Kajihara, Xiaoqing Wen, Laung-Terng Wang, Michael A. Kochte	LCTI-SS: Low-Clock-Tree-Impact Scan Segmentation for Avoiding Shift Timing Failures in Scan Testing.	IEEE Design & Test	2013	DBLP DOI BibTeX RDF
1	Kohei Miyase, Matthias Sauer 0002, Bernd Becker 0001, Xiaoqing Wen, Seiji Kajihara	Search Space Reduction for Low-Power Test Generation.	Asian Test Symposium	2013	DBLP DOI BibTeX RDF
1	Kazunari Enokimoto, Xiaoqing Wen, Kohei Miyase, Jiun-Lang Huang, Seiji Kajihara, Laung-Terng Wang	On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test Compression.	VLSI Design	2013	DBLP DOI BibTeX RDF
1	Senling Wang, Yasuo Sato, Kohei Miyase, Seiji Kajihara	A Scan-Out Power Reduction Method for Multi-cycle BIST.	Asian Test Symposium	2012	DBLP DOI BibTeX RDF
1	Yasuo Sato, Senling Wang, Takaaki Kato, Kohei Miyase, Seiji Kajihara	Low Power BIST for Scan-Shift and Capture Power.	Asian Test Symposium	2012	DBLP DOI BibTeX RDF
1	Kohei Miyase, Masao Aso, Ryou Ootsuka, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Kazunari Enokimoto, Seiji Kajihara	A novel capture-safety checking method for multi-clock designs and accuracy evaluation with delay capture circuits.	VTS	2012	DBLP DOI BibTeX RDF
1	Xiaoqing Wen, Y. Nishida, Kohei Miyase, Seiji Kajihara, Patrick Girard 0001, Mohammad Tehranipoor, Laung-Terng Wang	On pinpoint capture power management in at-speed scan test generation.	ITC	2012	DBLP DOI BibTeX RDF
1	Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Hiroshi Furukawa, Seiji Kajihara	A GA-Based X-Filling for Reducing Launch Switching Activity toward Specific Objectives in At-Speed Scan Testing.	IEICE Transactions	2011	DBLP DOI BibTeX RDF
1	Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara	Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing.	IEICE Transactions	2011	DBLP DOI BibTeX RDF
1	Kohei Miyase, Xiaoqing Wen, Masao Aso, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara	Transition-Time-Relation based capture-safety checking for at-speed scan test generation.	DATE	2011	DBLP DOI BibTeX RDF
1	Michael A. Kochte, Sandip Kundu, Kohei Miyase, Xiaoqing Wen, Hans-Joachim Wunderlich	Efficient BDD-based Fault Simulation in Presence of Unknown Values.	Asian Test Symposium	2011	DBLP DOI BibTeX RDF
1	Kohei Miyase, Y. Uchinodan, Kazunari Enokimoto, Yuta Yamato, Xiaoqing Wen, Seiji Kajihara, Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard 0001, Arnaud Virazel	Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling.	Asian Test Symposium	2011	DBLP DOI BibTeX RDF
1	Alberto Bosio, Luigi Dilillo, Patrick Girard 0001, Aida Todri, Arnaud Virazel, Kohei Miyase, X. Wen	Power-Aware Test Pattern Generation for At-Speed LOS Testing.	Asian Test Symposium	2011	DBLP DOI BibTeX RDF
1	Michael A. Kochte, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Kazunari Enokimoto, Hans-Joachim Wunderlich	SAT-based capture-power reduction for at-speed broadcast-scan-based test compression architectures.	ISLPED	2011	DBLP BibTeX RDF
1	Xiaoqing Wen, Kazunari Enokimoto, Kohei Miyase, Yuta Yamato, Michael A. Kochte, Seiji Kajihara, Patrick Girard 0001, Mohammad Tehranipoor	Power-aware test generation with guaranteed launch safety for at-speed scan testing.	VTS	2011	DBLP DOI BibTeX RDF
1	Yuta Yamato, Xiaoqing Wen, Michael A. Kochte, Kohei Miyase, Seiji Kajihara, Laung-Terng Wang	A novel scan segmentation design method for avoiding shift timing failure in scan testing.	ITC	2011	DBLP DOI BibTeX RDF
1	Shinji Oku, Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen	On Delay Test Quality for Test Cubes.	IPSJ Trans. System LSI Design Methodology	2010	DBLP DOI BibTeX RDF
1	Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Atsushi Takashima, Hiroshi Furukawa, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja	A Study of Capture-Safe Test Generation Flow for At-Speed Testing.	IEICE Transactions	2010	DBLP DOI BibTeX RDF
1	Kohei Miyase, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara, Patrick Girard 0001, Laung-Terng Wang, Mohammad Tehranipoor	High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme.	IEICE Transactions	2010	DBLP DOI BibTeX RDF
1	Mitsumasa Noda, Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen, Yukiya Miura	On estimation of NBTI-Induced delay degradation.	European Test Symposium	2010	DBLP DOI BibTeX RDF
1	Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel, Mohammad Tehranipoor, Kohei Miyase, Xiaoqing Wen, Nisar Ahmed	Is test power reduction through X-filling good enough?	ITC	2010	DBLP DOI BibTeX RDF
1	Meng-Fan Wu, Jiun-Lang Huang, Xiaoqing Wen, Kohei Miyase	Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment.	IEEE Trans. on CAD of Integrated Circuits and Systems	2009	DBLP DOI BibTeX RDF
1	Kazunari Enokimoto, Xiaoqing Wen, Yuta Yamato, Kohei Miyase, H. Sone, Seiji Kajihara, Masao Aso, Hiroshi Furukawa	CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing.	Asian Test Symposium	2009	DBLP DOI BibTeX RDF
1	Kohei Miyase, Yuta Yamato, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Xiaoqing Wen, Seiji Kajihara	A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment.	ICCAD	2009	DBLP DOI BibTeX RDF
1	Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Hiroshi Furukawa, Seiji Kajihara	A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching Activity in At-speed Scan Testing.	PRDC	2009	DBLP DOI BibTeX RDF
1	Yuta Yamato, Yusuke Nakamura, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara	A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits.	IEICE Transactions	2008	DBLP DOI BibTeX RDF
1	Kohei Miyase, Kenta Terashima, Xiaoqing Wen, Seiji Kajihara, Sudhakar M. Reddy	On Detection of Bridge Defects with Stuck-at Tests.	IEICE Transactions	2008	DBLP DOI BibTeX RDF
1	Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita	Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing.	J. Electronic Testing	2008	DBLP DOI BibTeX RDF	At-speed scan testing, Capture switching activity, X-filling, Test cube, ATPG, Low power testing
1	Ilia Polian, Kohei Miyase, Yusuke Nakamura, Seiji Kajihara, Piet Engelke, Bernd Becker 0001, Stefan Spinner, Xiaoqing Wen	Diagnosis of Realistic Defects Based on the X-Fault Model.	DDECS	2008	DBLP DOI BibTeX RDF
1	Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Hiroshi Furukawa, Yuta Yamato, Atsushi Takashima, Kenji Noda, H. Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja	A Capture-Safe Test Generation Scheme for At-Speed Scan Testing.	European Test Symposium	2008	DBLP DOI BibTeX RDF	At-Speed Scan Testing, Test Relaxation, X-Filling, Capture Mode, Yield Loss
1	Hiroshi Furukawa, Xiaoqing Wen, Kohei Miyase, Yuta Yamato, Seiji Kajihara, Patrick Girard 0001, Laung-Terng Wang, Mark Tehranipoor	CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing.	ATS	2008	DBLP DOI BibTeX RDF
1	Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara	Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification.	ICCAD	2008	DBLP DOI BibTeX RDF
1	Meng-Fan Wu, Jiun-Lang Huang, Xiaoqing Wen, Kohei Miyase	Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Scan Testing.	ITC	2008	DBLP DOI BibTeX RDF
1	Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Tatsuya Suzuki, Kewal K. Saluja, Laung-Terng Wang, Kozo Kinoshita	A Novel ATPG Method for Capture Power Reduction during Scan Testing.	IEICE Transactions	2007	DBLP DOI BibTeX RDF
1	Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Tatsuya Suzuki, Yuta Yamato, Patrick Girard 0001, Yuji Ohsumi, Laung-Terng Wang	A novel scheme to reduce power supply noise for high-quality at-speed scan testing.	ITC	2007	DBLP DOI BibTeX RDF
1	Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Yuji Ohsumi, Kewal K. Saluja	Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing.	DAC	2007	DBLP DOI BibTeX RDF
1	Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Yuta Yamato, Kewal K. Saluja, Laung-Terng Wang, Kozo Kinoshita	A Per-Test Fault Diagnosis Method Based on the X-Fault Model.	IEICE Transactions	2006	DBLP DOI BibTeX RDF
1	Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Yuta Yamato, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja	Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation.	ICCD	2006	DBLP DOI BibTeX RDF
1	Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Tatsuya Suzuki, Kewal K. Saluja, Laung-Terng Wang, Khader S. Abdel-Hafez, Kozo Kinoshita	A New ATPG Method for Efficient Capture Power Reduction During Scan Testing.	VTS	2006	DBLP DOI BibTeX RDF
1	Xiaoqing Wen, Tatsuya Suzuki, Seiji Kajihara, Kohei Miyase, Yoshihiro Minamoto, Laung-Terng Wang, Kewal K. Saluja	Efficient Test Set Modification for Capture Power Reduction.	J. Low Power Electronics	2005	DBLP DOI BibTeX RDF
1	Kohei Miyase, Kenta Terashima, Seiji Kajihara, Xiaoqing Wen, Sudhakar M. Reddy	On Improving Defect Coverage of Stuck-at Fault Tests.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF
1	Seiji Kajihara, Kenjiro Taniguchi, Kohei Miyase, Irith Pomeranz, Sudhakar M. Reddy	Don't Care Identification and Statistical Encoding for Test Data Compression.	IEICE Transactions	2004	DBLP BibTeX RDF
1	Kohei Miyase, Seiji Kajihara	XID: Don't care identification of test patterns for combinational circuits.	IEEE Trans. on CAD of Integrated Circuits and Systems	2004	DBLP DOI BibTeX RDF
1	Kohei Miyase, Seiji Kajihara, Sudhakar M. Reddy	Multiple Scan Tree Design with Test Vector Modification.	Asian Test Symposium	2004	DBLP DOI BibTeX RDF
1	Sudhakar M. Reddy, Kohei Miyase, Seiji Kajihara, Irith Pomeranz	On test data volume reduction for multiple scan chain designs.	ACM Trans. Design Autom. Electr. Syst.	2003	DBLP DOI BibTeX RDF	Decompressor, Don't care identification, Encoding techniques, Design for testability, Test data compression
1	Kohei Miyase, Seiji Kajihara	Optimal Scan Tree Construction with Test Vector Modification for Test Compression.	Asian Test Symposium	2003	DBLP DOI BibTeX RDF
1	Seiji Kajihara, Kenjiro Taniguchi, Kohei Miyase, Irith Pomeranz, Sudhakar M. Reddy	Test Data Compression Using Don?t-Care Identification and Statistical Encoding.	Asian Test Symposium	2002	DBLP DOI BibTeX RDF	don´t care identification, Huffman´s algorithm, test generation, test compression
1	Kohei Miyase, Seiji Kajihara, Irith Pomeranz, Sudhakar M. Reddy	Don't-Care Identification on Specific Bits of Test Patterns.	ICCD	2002	DBLP DOI BibTeX RDF
1	Seiji Kajihara, Koji Ishida, Kohei Miyase	Test Vector Modification for Power Reduction during Scan Testing.	VTS	2002	DBLP DOI BibTeX RDF
1	Sudhakar M. Reddy, Kohei Miyase, Seiji Kajihara, Irith Pomeranz	On Test Data Volume Reduction for Multiple Scan Chain Designs.	VTS	2002	DBLP DOI BibTeX RDF
1	Kohei Miyase, Seiji Kajihara, Sudhakar M. Reddy	A Method of Static Test Compaction Based on Don't Care Identification.	DELTA	2002	DBLP DOI BibTeX RDF	Coloring Problem, Don't Care Identification, ATPG, Static Test Compaction
1	Seiji Kajihara, Kohei Miyase	On Identifying Don't Care Inputs of Test Patterns for Combinational Circuits.	ICCAD	2001	DBLP DOI BibTeX RDF

Publications of "Kohei Miyase" ( http://dblp.L3S.de/Authors/Kohei_Miyase )