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Publications of "Kohei Miyase" ( http://dblp.L3S.de/Authors/Kohei_Miyase )

  Author page on DBLP  Author page in RDF  Community of Kohei Miyase in ASPL-2

Publication years (Num. hits)
2001-2006 (16) 2007-2009 (15) 2010-2012 (18) 2013-2017 (16) 2018 (3)
Publication types (Num. hits)
article(20) inproceedings(48)
Venues (Conferences, Journals, ...)
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The graphs summarize 9 occurrences of 8 keywords

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Found 69 publication records. Showing 68 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
1Shyue-Kung Lu, Hui-Ping Li, Kohei Miyase Adaptive ECC Techniques for Reliability and Yield Enhancement of Phase Change Memory. Search on Bibsonomy IOLTS The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Shyue-Kung Lu, Hui-Ping Li, Kohei Miyase Progressive ECC Techniques for Phase Change Memory. Search on Bibsonomy ATS The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Yucong Zhang, Xiaoqin Wen, Stefan Holst, Kohei Miyase, Seiji Kajihara, Hans-Joachim Wunderlich, Jun Qian Clock-Skew-Aware Scan Chain Grouping for Mitigating Shift Timing Failures in Low-Power Scan Testing. Search on Bibsonomy ATS The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Yucong Zhang, Stefan Holst, Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Jun Qian Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption. Search on Bibsonomy ATS The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Stefan Holst, Eric Schneider, Koshi Kawagoe, Michael A. Kochte, Kohei Miyase, Hans-Joachim Wunderlich, Seiji Kajihara, Xiaoqing Wen Analysis and mitigation or IR-Drop induced scan shift-errors. Search on Bibsonomy ITC The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Fuqiang Li, Xiaoqing Wen, Kohei Miyase, Stefan Holst, Seiji Kajihara Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation. Search on Bibsonomy IEICE Transactions The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Matthias Sauer 0002, Jie Jiang, Sven Reimer, Kohei Miyase, Xiaoqing Wen, Bernd Becker 0001, Ilia Polian On Optimal Power-Aware Path Sensitization. Search on Bibsonomy ATS The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Stephan Eggersglüß, Stefan Holst, Daniel Tille, Kohei Miyase, Xiaoqing Wen Formal Test Point Insertion for Region-based Low-Capture-Power Compact At-Speed Scan Test. Search on Bibsonomy ATS The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Stephan Eggersglüß, Kohei Miyase, Xiaoqing Wen SAT-based post-processing for regional capture power reduction in at-speed scan test generation. Search on Bibsonomy ETS The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1K. Asada, Xiaoqing Wen, Stefan Holst, Kohei Miyase, Seiji Kajihara, Michael A. Kochte, Eric Schneider, Hans-Joachim Wunderlich, J. Qian Logic/Clock-Path-Aware At-Speed Scan Test Generation for Avoiding False Capture Failures and Reducing Clock Stretch. Search on Bibsonomy ATS The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Infall Syafalni, Tsutomu Sasao, Xiaoqing Wen, Stefan Holst, Kohei Miyase A soft-error tolerant TCAM using partial don't-care keys. Search on Bibsonomy ETS The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Kohei Miyase, Matthias Sauer 0002, Bernd Becker 0001, Xiaoqing Wen, Seiji Kajihara Identification of high power consuming areas with gate type and logic level information. Search on Bibsonomy ETS The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Akihiro Tomita, Xiaoqing Wen, Yasuo Sato, Seiji Kajihara, Kohei Miyase, Stefan Holst, Patrick Girard 0001, Mohammad Tehranipoor, Laung-Terng Wang On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST. Search on Bibsonomy IEICE Transactions The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Infall Syafalni, Tsutomu Sasao, Xiaoqing Wen, Stefan Holst, Kohei Miyase Soft-error tolerant TCAMs for high-reliability packet classifications. Search on Bibsonomy APCCAS The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Yuta Yamato, Kohei Miyase, Seiji Kajihara, Xiaoqing Wen, Laung-Terng Wang, Michael A. Kochte LCTI-SS: Low-Clock-Tree-Impact Scan Segmentation for Avoiding Shift Timing Failures in Scan Testing. Search on Bibsonomy IEEE Design & Test The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Kohei Miyase, Ryota Sakai, Xiaoqing Wen, Masao Aso, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara A Capture-Safety Checking Metric Based on Transition-Time-Relation for At-Speed Scan Testing. Search on Bibsonomy IEICE Transactions The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Senling Wang, Yasuo Sato, Seiji Kajihara, Kohei Miyase Scan-Out Power Reduction for Logic BIST. Search on Bibsonomy IEICE Transactions The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Kazunari Enokimoto, Xiaoqing Wen, Kohei Miyase, Jiun-Lang Huang, Seiji Kajihara, Laung-Terng Wang On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test Compression. Search on Bibsonomy VLSI Design The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Kohei Miyase, Matthias Sauer 0002, Bernd Becker 0001, Xiaoqing Wen, Seiji Kajihara Search Space Reduction for Low-Power Test Generation. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Kohei Miyase, Masao Aso, Ryou Ootsuka, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Kazunari Enokimoto, Seiji Kajihara A novel capture-safety checking method for multi-clock designs and accuracy evaluation with delay capture circuits. Search on Bibsonomy VTS The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Yasuo Sato, Senling Wang, Takaaki Kato, Kohei Miyase, Seiji Kajihara Low Power BIST for Scan-Shift and Capture Power. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Senling Wang, Yasuo Sato, Kohei Miyase, Seiji Kajihara A Scan-Out Power Reduction Method for Multi-cycle BIST. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Xiaoqing Wen, Y. Nishida, Kohei Miyase, Seiji Kajihara, Patrick Girard 0001, Mohammad Tehranipoor, Laung-Terng Wang On pinpoint capture power management in at-speed scan test generation. Search on Bibsonomy ITC The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Hiroshi Furukawa, Seiji Kajihara A GA-Based X-Filling for Reducing Launch Switching Activity toward Specific Objectives in At-Speed Scan Testing. Search on Bibsonomy IEICE Transactions The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing. Search on Bibsonomy IEICE Transactions The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Kohei Miyase, Xiaoqing Wen, Masao Aso, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara Transition-Time-Relation based capture-safety checking for at-speed scan test generation. Search on Bibsonomy DATE The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Xiaoqing Wen, Kazunari Enokimoto, Kohei Miyase, Yuta Yamato, Michael A. Kochte, Seiji Kajihara, Patrick Girard 0001, Mohammad Tehranipoor Power-aware test generation with guaranteed launch safety for at-speed scan testing. Search on Bibsonomy VTS The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Michael A. Kochte, Sandip Kundu, Kohei Miyase, Xiaoqing Wen, Hans-Joachim Wunderlich Efficient BDD-based Fault Simulation in Presence of Unknown Values. Search on Bibsonomy Asian Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Kohei Miyase, Y. Uchinodan, Kazunari Enokimoto, Yuta Yamato, Xiaoqing Wen, Seiji Kajihara, Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard 0001, Arnaud Virazel Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling. Search on Bibsonomy Asian Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Alberto Bosio, Luigi Dilillo, Patrick Girard 0001, Aida Todri, Arnaud Virazel, Kohei Miyase, X. Wen Power-Aware Test Pattern Generation for At-Speed LOS Testing. Search on Bibsonomy Asian Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Yuta Yamato, Xiaoqing Wen, Michael A. Kochte, Kohei Miyase, Seiji Kajihara, Laung-Terng Wang A novel scan segmentation design method for avoiding shift timing failure in scan testing. Search on Bibsonomy ITC The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Michael A. Kochte, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Kazunari Enokimoto, Hans-Joachim Wunderlich SAT-based capture-power reduction for at-speed broadcast-scan-based test compression architectures. Search on Bibsonomy ISLPED The full citation details ... 2011 DBLP  BibTeX  RDF
1Shinji Oku, Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen On Delay Test Quality for Test Cubes. Search on Bibsonomy IPSJ Trans. System LSI Design Methodology The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Atsushi Takashima, Hiroshi Furukawa, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja A Study of Capture-Safe Test Generation Flow for At-Speed Testing. Search on Bibsonomy IEICE Transactions The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Kohei Miyase, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara, Patrick Girard 0001, Laung-Terng Wang, Mohammad Tehranipoor High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme. Search on Bibsonomy IEICE Transactions The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Mitsumasa Noda, Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen, Yukiya Miura On estimation of NBTI-Induced delay degradation. Search on Bibsonomy European Test Symposium The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel, Mohammad Tehranipoor, Kohei Miyase, Xiaoqing Wen, Nisar Ahmed Is test power reduction through X-filling good enough? Search on Bibsonomy ITC The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Meng-Fan Wu, Jiun-Lang Huang, Xiaoqing Wen, Kohei Miyase Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Hiroshi Furukawa, Seiji Kajihara A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching Activity in At-speed Scan Testing. Search on Bibsonomy PRDC The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Kohei Miyase, Yuta Yamato, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Xiaoqing Wen, Seiji Kajihara A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment. Search on Bibsonomy ICCAD The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Kazunari Enokimoto, Xiaoqing Wen, Yuta Yamato, Kohei Miyase, H. Sone, Seiji Kajihara, Masao Aso, Hiroshi Furukawa CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing. Search on Bibsonomy Asian Test Symposium The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Kohei Miyase, Kenta Terashima, Xiaoqing Wen, Seiji Kajihara, Sudhakar M. Reddy On Detection of Bridge Defects with Stuck-at Tests. Search on Bibsonomy IEICE Transactions The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Yuta Yamato, Yusuke Nakamura, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits. Search on Bibsonomy IEICE Transactions The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing. Search on Bibsonomy J. Electronic Testing The full citation details ... 2008 DBLP  DOI  BibTeX  RDF At-speed scan testing, Capture switching activity, X-filling, Test cube, ATPG, Low power testing
1Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification. Search on Bibsonomy ICCAD The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Hiroshi Furukawa, Xiaoqing Wen, Kohei Miyase, Yuta Yamato, Seiji Kajihara, Patrick Girard 0001, Laung-Terng Wang, Mark Tehranipoor CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing. Search on Bibsonomy ATS The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Ilia Polian, Kohei Miyase, Yusuke Nakamura, Seiji Kajihara, Piet Engelke, Bernd Becker 0001, Stefan Spinner, Xiaoqing Wen Diagnosis of Realistic Defects Based on the X-Fault Model. Search on Bibsonomy DDECS The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Hiroshi Furukawa, Yuta Yamato, Atsushi Takashima, Kenji Noda, H. Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja A Capture-Safe Test Generation Scheme for At-Speed Scan Testing. Search on Bibsonomy European Test Symposium The full citation details ... 2008 DBLP  DOI  BibTeX  RDF At-Speed Scan Testing, Test Relaxation, X-Filling, Capture Mode, Yield Loss
1Meng-Fan Wu, Jiun-Lang Huang, Xiaoqing Wen, Kohei Miyase Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Scan Testing. Search on Bibsonomy ITC The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Tatsuya Suzuki, Kewal K. Saluja, Laung-Terng Wang, Kozo Kinoshita A Novel ATPG Method for Capture Power Reduction during Scan Testing. Search on Bibsonomy IEICE Transactions The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
1Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Yuji Ohsumi, Kewal K. Saluja Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing. Search on Bibsonomy DAC The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
1Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Tatsuya Suzuki, Yuta Yamato, Patrick Girard 0001, Yuji Ohsumi, Laung-Terng Wang A novel scheme to reduce power supply noise for high-quality at-speed scan testing. Search on Bibsonomy ITC The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
1Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Yuta Yamato, Kewal K. Saluja, Laung-Terng Wang, Kozo Kinoshita A Per-Test Fault Diagnosis Method Based on the X-Fault Model. Search on Bibsonomy IEICE Transactions The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Tatsuya Suzuki, Kewal K. Saluja, Laung-Terng Wang, Khader S. Abdel-Hafez, Kozo Kinoshita A New ATPG Method for Efficient Capture Power Reduction During Scan Testing. Search on Bibsonomy VTS The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Yuta Yamato, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation. Search on Bibsonomy ICCD The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Xiaoqing Wen, Tatsuya Suzuki, Seiji Kajihara, Kohei Miyase, Yoshihiro Minamoto, Laung-Terng Wang, Kewal K. Saluja Efficient Test Set Modification for Capture Power Reduction. Search on Bibsonomy J. Low Power Electronics The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1Kohei Miyase, Kenta Terashima, Seiji Kajihara, Xiaoqing Wen, Sudhakar M. Reddy On Improving Defect Coverage of Stuck-at Fault Tests. Search on Bibsonomy Asian Test Symposium The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1Seiji Kajihara, Kenjiro Taniguchi, Kohei Miyase, Irith Pomeranz, Sudhakar M. Reddy Don't Care Identification and Statistical Encoding for Test Data Compression. Search on Bibsonomy IEICE Transactions The full citation details ... 2004 DBLP  BibTeX  RDF
1Kohei Miyase, Seiji Kajihara XID: Don't care identification of test patterns for combinational circuits. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
1Kohei Miyase, Seiji Kajihara, Sudhakar M. Reddy Multiple Scan Tree Design with Test Vector Modification. Search on Bibsonomy Asian Test Symposium The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
1Sudhakar M. Reddy, Kohei Miyase, Seiji Kajihara, Irith Pomeranz On test data volume reduction for multiple scan chain designs. Search on Bibsonomy ACM Trans. Design Autom. Electr. Syst. The full citation details ... 2003 DBLP  DOI  BibTeX  RDF Decompressor, Don't care identification, Encoding techniques, Design for testability, Test data compression
1Kohei Miyase, Seiji Kajihara Optimal Scan Tree Construction with Test Vector Modification for Test Compression. Search on Bibsonomy Asian Test Symposium The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
1Kohei Miyase, Seiji Kajihara, Sudhakar M. Reddy A Method of Static Test Compaction Based on Don't Care Identification. Search on Bibsonomy DELTA The full citation details ... 2002 DBLP  DOI  BibTeX  RDF Coloring Problem, Don't Care Identification, ATPG, Static Test Compaction
1Seiji Kajihara, Koji Ishida, Kohei Miyase Test Vector Modification for Power Reduction during Scan Testing. Search on Bibsonomy VTS The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
1Sudhakar M. Reddy, Kohei Miyase, Seiji Kajihara, Irith Pomeranz On Test Data Volume Reduction for Multiple Scan Chain Designs. Search on Bibsonomy VTS The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
1Seiji Kajihara, Kenjiro Taniguchi, Kohei Miyase, Irith Pomeranz, Sudhakar M. Reddy Test Data Compression Using Don?t-Care Identification and Statistical Encoding. Search on Bibsonomy Asian Test Symposium The full citation details ... 2002 DBLP  DOI  BibTeX  RDF don´t care identification, Huffman´s algorithm, test generation, test compression
1Kohei Miyase, Seiji Kajihara, Irith Pomeranz, Sudhakar M. Reddy Don't-Care Identification on Specific Bits of Test Patterns. Search on Bibsonomy ICCD The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
1Seiji Kajihara, Kohei Miyase On Identifying Don't Care Inputs of Test Patterns for Combinational Circuits. Search on Bibsonomy ICCAD The full citation details ... 2001 DBLP  DOI  BibTeX  RDF
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