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Publications at "Microelectronics Reliability"( http://dblp.L3S.de/Venues/Microelectronics_Reliability )

URL (DBLP): http://dblp.uni-trier.de/db/journals/mr

Publication years (Num. hits)
2001 (282) 2002 (273) 2003 (287) 2004 (269) 2005 (302) 2006 (276) 2007 (370) 2008 (301) 2009 (247) 2010 (349) 2011 (382) 2012 (470) 2013 (322) 2014 (429) 2015 (422) 2016 (428) 2017 (413) 2018 (485)
Publication types (Num. hits)
article(6307)
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Found 6307 publication records. Showing 6307 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
1Tao Hu, Shurong Dong, Hao Jin, Hei Wong, Zekun Xu, Xiang Li, Juin J. Liou A double snapback SCR ESD protection scheme for 28 nm CMOS process. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1John W. Evans, Koustav Sinha Applications of fracture mechanics to quantitative accelerated life testing of plastic encapsulated microelectronics. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1M. Balmont, Isabelle Bord-Majek, B. Poupard, Laurent Béchou, Yves Ousten Highlighting two integration technologies based on vias: Through silicon vias and embedded components into PCB. Strengths and weaknesses for manufacturing and reliability. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Marco Buonomo, L. Torto, Marco Barbato, Nicola Wrachien, A. Rizzo, S. A. Gevorgyan, F. C. Krebs, Andrea Cester Analysis of the effects of voltage pulses on P3HT: PCBM polymeric solar cells by means of TLP technique. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Patrick M. Lenahan, M. A. Anders, R. J. Waskiewicz, Aivars J. Lelis Bias temperature instabilities in 4H SiC metal oxide semiconductor field effect transistors: Insight provided by electrically detected magnetic resonance. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Ying Pang, Mauro Ciappa Charge and energy deposition in thick silicon depletion layers by environmental ionizing radiation and terrestrial cosmic rays. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Jianfei Wu, Wei Zhu, Binhong Li, Yafei Li, Hongyi Wang, Mengjun Wang Investigations on immunity of interfaces between intelligent media processor and DDR3 SDRAM memory. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Sascha Heinssen, Theodor Hillebrand, Maike Taddiken, Konstantin Tscherkaschin, Steffen Paul, Dagmar Peters-Drolshagen Design for reliability of generic sensor interface circuits. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Pham Luu Trung Duong, Xuechu Xu, Qing Yang, Nagarajan Raghavan Gaussian process regression approach for robust design and yield enhancement of self-assembled nanostructures. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Brice Rogié, Lorenzo Codecasa, Eric Monier-Vinard, Valentin Bissuel, Najib Laraqi, Olivier Daniel, Dario D'Amore, Alessandro Magnani, Vincenzo d'Alessandro, Niccolò Rinaldi Multi-port dynamic compact thermal models of dual-chip package using model order reduction and metaheuristic optimization. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Giulia Marcello, E. Meda, Matteo Medda Complex automotive ICs defect localization driven by quiescent power supply current: Three cases study. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Fausto Stella, Olufisayo Olanrewaju, Zineng Yang, Alberto Castellazzi, Gianmario Pellegrino Experimentally validated methodology for real-time temperature cycle tracking in SiC power modules. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Chanyang Choe, Seungjun Noh, Chuantong Chen, Dongjin Kim 0002, Katsuaki Suganuma Influence of thermal exposure upon mechanical/electrical properties and microstructure of sintered micro-porous silver. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Vinicius Fratin, Daniel A. G. de Oliveira, Philippe O. A. Navaux, Luigi Carro, Paolo Rech Energy-Delay-FIT Product to compare processors and algorithm implementations. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1T. Walter, Golta Khatibi, Michael Nelhiebel, M. Stefenelli Characterization of cyclic delamination behavior of thin film multilayers. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Eun-Ki Hong, Won-Ju Cho Effect of microwave annealing on SOI MOSFETs: Post-metal annealing with low thermal budget. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Donald A. Gajewski, Satyaki Ganguly, Scott Sheppard, Simon Wood, Jeff B. Barner, Jim Milligan, John Palmour Reliability comparison of 28V-50V GaN-on-SiC S-band and X-band technologies. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Jung-Chuan Chou, Siao-Jie Yan, Yi-Hung Liao, Chih-Hsien Lai, Jian-Syun Chen, Hsiang-Yi Chen, Cian-Yi Wu, You-Xiang Wu Reaction of NiO film on flexible substrates with buffer solutions and application to flexible arrayed lactate biosensor. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Wei-Ting Kary Chien, Atman Yong Zhao, Liwen Zhang, Zhijuan Wang Investigations and detections on a new BEOL dielectric failure mechanism at advanced technologies. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1C. Kawahara, Y. Wada, S. Kinouchi, H. Kobayashi Non-destructive estimation method on cosmic ray ruggedness of power semiconductors using repetitive monitoring technique. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Fei Mei, Liu Ning, Miao Huiyu, Pan Yi, Haoyuan Sha, Jianyong Zheng On-line fault diagnosis model for locomotive traction inverter based on wavelet transform and support vector machine. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Wolfgang Granig, Lisa-Marie Faller, Hubert Zangl Sensor system optimization to meet reliability targets. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Xingji Li, Jianqun Yang, Chaoming Liu, Gang Bai, Wenbo Luo, Pengwei Li Synergistic effects of NPN transistors caused by combined proton irradiations with different energies. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Chunlei Wu Electrically induced physical damage (EIPD) cases study: From electrical overstress (EOS) to product defects. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Elham Amini, Anne Beyreuther, Norbert Herfurth, Alexander Steigert, R. Muydinov, Bernd Szyszka, Christian Boit IC security and quality improvement by protection of chip backside against hardware attacks. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Yiming Lei, Hitoshi Wakabayashi, Kazuo Tsutsui, Hiroshi Iwai, Masayuki Furuhashi, Shingo Tomohisa, Satoshi Yamakawa, Kuniyuki Kakushima Improvement of SiO2/4H-SiC Interface properties by post-metallization annealing. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Ranjith Kumar Gatla, Wei Chen, Guorong Zhu, Dingjun Zeng, Ramchander Nirudi Lifetime estimation of modular cascaded H-bridge MLPVI for grid-connected PV systems considering mission profile. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1S. Ahsan, K. Niazi, H. A. Khan, Y. Yang Hotspots and performance evaluation of crystalline-silicon and thin-film photovoltaic modules. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Lukasz Wozniak, Pawel Kalinowski, Grzegorz Jasinski, Piotr Jasinski FFT analysis of temperature modulated semiconductor gas sensor response for the prediction of ammonia concentration under humidity interference. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Pham Luu Trung Duong, Nagarajan Raghavan Heuristic Kalman optimized particle filter for remaining useful life prediction of lithium-ion battery. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Qi Qin, Shuai Zhao 0003, Shaowei Chen, Dengshan Huang, Jian Liang Adaptive and robust prediction for the remaining useful life of electrolytic capacitors. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Lorenzo Codecasa, Robin Bornoff, James Dyson, Vincenzo d'Alessandro, Alessandro Magnani, Niccolò Rinaldi Versatile MOR-based boundary condition independent compact thermal models with multiple heat sources. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Nausicaa Dornic, Ali Ibrahim, Zoubir Khatir, Son-Ha Tran, J. P. Ousten, Jeffrey Ewanchuk, Stefan Mollov Analysis of the degradation mechanisms occurring in the topside interconnections of IGBT power devices during power cycling. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Julien Coutet, François Marc, Flavien Dozolme, Romain Guétard, Aurélien Janvresse, Pierre Lebossé, Antonin Pastre, Jean-Claude Clement Influence of temperature of storage, write and read operations on multiple level cells NAND flash memories. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Guo-Lun Huang, Wei-Hao Fu, Chun-Yu Lin Investigation and application of vertical NPN devices for RF ESD protection in BiCMOS technology. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1M. D. Hook, S. Hunter, M. Mayer Deriving lifetime predictions for wire bonds at high temperatures. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Paul Pfäffli, H. Y. Wong, X. Xu, L. Silvestri, X. W. Lin, T. Yang, Ravi Tiwari, S. Mahapatra, S. Motzny, V. Moroz, T. Ma TCAD modeling for reliability. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Tommaso Cilento, Chan-Su Yun, Arsen Terterian, Chang Hwi Lee, Jung Eon Moon, Si Woo Lee, Hyoungcheol Kwon, Manho Seung, Seokkiu Lee Investigation of layout effects in diode-triggered SCRs under very-fast TLP stress through full-size, calibrated 3D TCAD simulation. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1A. Rodriguez-Fernandez, J. Muñoz-Gorriz, Jordi Suñé, Enrique Miranda 0002 A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1D. Nouguier, X. Federspiel, G. Ghibaudo, M. Rafik, David Roy 0001 New NBTI models for degradation and relaxation kinetics valid over extended temperature and stress/recovery ranges. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Jing Wang 0027, Yi-xi Cai, Xiao-hua Li, Yun-fei Shi, Ya-chao Bao, Jun Wang, Yun-xi Shi Experimental study on optical-thermal associated characteristics of LED car lamps under the action of ionic wind. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Devyani Patra, Ahmed Kamal Reza, Mohammad Khaled Hassan, Mehdi Katoozi, Ethan H. Cannon, Kaushik Roy 0001, Yu Cao Adaptive accelerated aging for 28 nm HKMG technology. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Philip Y. Chung, Suresh K. Sitaraman Random vibration analysis of 3-Arc-Fan compliant interconnects. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Mingyao Ma, Kaiqi Chu, Mingyue Zhan, Ye Wang, Fang Liu Statistical analysis of characteristic of ageing precursor of IGBT based on synthetic effect of multi-physical fields. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Riikka Mikkonen, Matti Mäntysalo Evaluation of screen printed silver trace performance and long-term reliability against environmental stress on a low surface energy substrate. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Ke-Jing Lee, Yu-Chi Chang, Cheng-Jung Lee, Li-Wen Wang, Yeong-Her Wang Resistive switching properties of alkaline earth oxide-based memory devices. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Carmine Abbate, Giovanni Busatto, Annunziata Sanseverino, D. Tedesco, Francesco Velardi Measure of high frequency input impedance to study the instability of power devices in short circuit. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Tun Wang, Baoming Wang, Aman Haque, Michael Snure, Eric Heller, Nicholas Glavin Mechanical stress effects on electrical breakdown of freestanding GaN thin films. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Ivo Vogt, T. Nakamura, Ingrid De Wolf, Christian Boit Detection of failure mechanisms in 24-40 nm FinFETs with (spectral) photon emission techniques using InGaAs camera. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Paula Diaz Reigosa, Francesco Iannuzzo, Lorenzo Ceccarelli Effect of short-circuit stress on the degradation of the SiO2 dielectric in SiC power MOSFETs. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Sarah Azimi, Luca Sterpone, Boyang Du, Luca Boragno On the analysis of radiation-induced Single Event Transients on SRAM-based FPGAs. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Stephen M. Ramey, Chetan Prasad, A. Rahman Technology scaling implications for BTI reliability. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Mingyao Ma, Zhiyu Sun, Ye Wang, Jianing Wang, Rui Wang Method of junction temperature estimation and over temperature protection used for electric vehicle's IGBT power modules. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Jie Mei, R. Haug, O. Lanier, Tobias Grözinger, André Zimmermann Effect of Joule heating on the reliability of solder joints under power cycling conditions. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Xavier Garros, Antoine Laurent, Alexandre Subirats, X. Federspiel, E. Vincent, Gilles Reimbold Characterization and modeling of dynamic variability induced by BTI in nano-scaled transistors. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Xianqiang Liu, Xiaodi Xu, Chenjie Gu, Renyuan Gu, Weiwei Wang, Wenjun Liu, Tianli Duan Investigating the impact of the defect dynamic characteristics on the PBTI in the high-κ gate device. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Hosung Lee, Sanghyeon Baeg Signal characteristic and test exploitation for intermittent nanometer-scale cracks. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Jongkyun Kim, Namhyun Lee, Gang-Jun Kim, Young-Yun Lee, Jung-Eun Seok, Yunsung Lee Effect of OFF-state stress on reliability of nMOSFET in SWD circuits of DRAM. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Maryam Gholamirad, Siavash Soltani, Panthea Sepehrband Dislocation assisted diffusion: A mechanism for growth of intermetallic compounds in copper ball bonds. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Jinxin Zhang, Qi Guo, Hongxia Guo, Wu Lu, Chaohui He, Xin Wang, Pei Li, Lin Wen Investigation of enhanced low dose rate sensitivity in SiGe HBTs by 60Co γ irradiation under different biases. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Bahar Ahmadi, Bahram Javidi, Sina Shahbazmohamadi Automated detection of counterfeit ICs using machine learning. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1A. George, J. Zipprich, M. Breitenbach, M. Klingler, M. Nowottnick Reliability investigation of large area solder joints in power electronics modules and its simulative representation. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Sebastián Matías Pazos, Fernando L. Aguirre, Felix Palumbo, F. Silveira Performance-reliability trade-offs in short range RF power amplifier design. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1S. Zanella, A. Lecavelier des Etangs-Levallois, E. Charkaluk, W. C. Maia Filho, A. Constantinescu Importance of electric resistance monitoring in shear test. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Oriol Avino-Salvado, Hervé Morel, Cyril Buttay, Denis Labrousse, Stéphane Lefebvre Threshold voltage instability in SiC MOSFETs as a consequence of current conduction in their body diode. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Shaalini Chithambaram, Pik Kee Tan, Yuzhe Zhao, Binghai Liu, Yinzhe Ma, Alfred Quah, Dayanand Nagalingam, Yanlin Pan, Zhihong Mai Failure analysis on 14 nm FinFET devices with ESD CDM failure. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Tzu-Yu Yu, Liang-Shuan Peng, Chun-Wei Lin, Yue-Ming Hsin GaAsSb/InGaAs tunnel field effect transistor with a pocket layer. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Carmine Abbate, Giovanni Busatto, Annunziata Sanseverino, D. Tedesco, Francesco Velardi Failure analysis of 650 V enhancement mode GaN HEMT after short circuit tests. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Kenneth Chimezie Nwanoro, Hua Lu 0003, Chunyan Yin, Chris Bailey An analysis of the reliability and design optimization of aluminium ribbon bonds in power electronics modules using computer simulation method. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1S. Pin, Alexandrine Guédon-Gracia, Jean-Yves Delétage, Hélène Frémont Creep measurement and choice of creep laws for BGA assemblies' reliability simulation. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Tomasz Raszkowski, Agnieszka Samson, Mariusz Zubert Influence of temperature and heat flux time lags on the temperature distribution in modern GAAFET structure based on Dual-Phase-Lag thermal model. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Shi-Qian Liu, Stuart D. McDonald, Keith W. Sweatman, Kazuhiro Nogita The effects of precipitation strengthening and solid solution strengthening on strain rate sensitivity of lead-free solders: Review. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Teng Ma, Xuefeng Yu, Jiangwei Cui, Qiwen Zheng, Hang Zhou, Dandan Su, Qi Guo Investigating the TDDB lifetime growth mechanism caused by proton irradiation in partially depleted SOI devices. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Ivo Halecek, Petr Fiser, Jan Schmidt Towards AND/XOR balanced synthesis: Logic circuits rewriting with XOR. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Rainer Dudek, M. Hildebrand, Sven Rzepka, T. Fries, Ralf Döring, Bettina Seiler, R. W. Ortmann Combined simulation and optical measurement technique for investigation of system effects on components solder fatigue. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Fei Chong Ng, Aizat Abas, Mohd Zulkifly Abdullah Effect of solder bump shapes on underfill flow in flip-chip encapsulation using analytical, numerical and PIV experimental approaches. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Yiming Lei, Hitoshi Wakabayashi, Kazuo Tsutsui, Hiroshi Iwai, Masayuki Furuhashi, Shingo Tomohisa, Satoshi Yamakawa, Kuniyuki Kakushima Effect of lanthanum silicate interface layer on the electrical characteristics of 4H-SiC metal-oxide-semiconductor capacitors. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Shawki Douzi, Moncef Kadi, Habib Boulzazen, Mohamed Tlig, Jaleleddine Ben Hadj Slama Conducted EMI evolution of power SiC MOSFET in a Buck converter after short-circuit aging tests. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Guoning Xu, Xiaowei Du, Zhaojie Li, Xiaojun Zhang, Minxin Zheng, Ying Miao, Yang Gao, Qianshi Liu Reliability design of battery management system for power battery. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Yu Peng, Y. J. Zhang, Datong Liu, L. S. Liu Degradation estimation using feature increment stepwise linear regression for PWM Inverter of Electro-Mechanical Actuator. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Cheryl Selvanayagam, Rathin Mandal, Nagarajan Raghavan Comparison of experimental, analytical and simulation methods to estimate substrate material properties for warpage reliability analysis. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Minjung Jin, Kangjung Kim, Yoohwan Kim, Hyewon Shim, Jinju Kim, Gunrae Kim, Sangwoo Pae Investigation of BTI characteristics and its behavior on 10 nm SRAM with high-k/metal gate FinFET technology having multi-VT gate stack. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Nabil El Belghiti Alaoui, Alexandre Boyer, Patrick Tounsi, Arnaud Viard New defect detection approach using near electromagnetic field probing of high density PCBAs. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Besar Asllani, Asad Fayyaz, Alberto Castellazzi, Hervé Morel, Dominique Planson VTH subthreshold hysteresis technology and temperature dependence in commercial 4H-SiC MOSFETs. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Haibin Wang, Xixi Dai, Yangsheng Wang, Issam Nofal, Li Cai, Zicai Shen, Wanxiu Sun, Jinshun Bi, Bo Li 0051, Gang Guo, Li Chen, Sang H. Baeg A single event upset tolerant latch design. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Ramin Parvari, M. Zarghani, Shahriyar Kaboli RCD snubber design based on reliability consideration: A case study for thermal balancing in power electronic converters. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Ting Li, Zebin Li, Ke Zhao, Boan Pan, Zhiyuan Wang, Xiping Yang Reliability analysis of a mini-instrument for simultaneous monitoring water content, deep tissue temperature, and hemodynamic parameters. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Ping Liu, Huai Wang, Yi Liu 0030, Frede Blaabjerg Thermal stress reduction of quasi-Z source inverter drive by model predictive control. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Roberto S. Aga, Eric B. Kreit, Steven R. Dooley, Carrie M. Bartsch, Emily M. Heckman, Rachel S. Aga Considerations in printing conductive traces for high pulsed power applications. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Gady Golan, Moshe Azoulay, Tsuriel Avraham, Ilan Kremenetsky, Joseph B. Bernstein An improved reliability model for Si and GaN power FET. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1M. Antonini, Paolo Cova, Nicola Delmonte, Alberto Castellazzi GaN transistors efficient cooling by graphene foam. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Yuanqing Li, Li Chen 0001, Issam Nofal, Mo Chen, Haibin Wang, Rui Liu, Qingyu Chen, Milos Krstic, Shuting Shi, Gang Guo, Sang H. Baeg, Shi-Jie Wen, Richard Wong Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Charalampos Papadopoulos, Chiara Corvasce, Arnost Kopta, Daniel Schneider, Gontran Pâques, Munaf Rahimo The influence of humidity on the high voltage blocking reliability of power IGBT modules and means of protection. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Zhaozhao Xu, Donghua Liu, Wei Xiong, Jun Hu, Wenting Duan, Hualun Chen, Wensheng Qian, Weiran Kong, Shichang Zou Investigation and impact of LDD variations on the drain disturb in normally-on SONOS NOR flash device. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1C. Batunlu, A. Albarbar Strategy for enhancing reliability and lifetime of DC-AC inverters used for wind turbines. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Bat-Otgon Bat-Ochir, Battuvshin Bayarkhuu, Kazunori Hasegawa, Masanori Tsukuda, Bayasgalan Dugarjav, Ichiro Omura Envelop tracking based embedded current measurement for monitoring of IGBT and power converter system. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Junji Sakamoto, Ryoma Hirata, Tadahiro Shibutani Potential failure mode identification of operational amplifier circuit board by using high accelerated limit test. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Daniel Monteiro Diniz Reis, Sven Rzepka, Karla Hiller Reliability testing of integrated low-temperature PVD PZT films. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Moustafa Zerarka, Olivier Crépel Radiation robustness of normally-off GaN/HEMT power transistors (COTS). Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Junyeap Kim, Hanbin Yoo, Heesung Lee, Seong Kwang Kim, Sungju Choi, Sung-Jin Choi, Dae Hwan Kim, Dong Myong Kim Comprehensive separate extraction of parasitic resistances in MOSFETs considering the gate bias-dependence and the asymmetric overlap length. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
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