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Publications of "Piet Engelke" ( http://dblp.L3S.de/Authors/Piet_Engelke )

  Author page on DBLP  Author page in RDF  Community of Piet Engelke in ASPL-2

Publication years (Num. hits)
2002-2008 (18) 2009-2017 (11)
Publication types (Num. hits)
article(7) inproceedings(22)
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The graphs summarize 18 occurrences of 9 keywords

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Found 30 publication records. Showing 29 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
1Artur Jutman, Christophe Lotz, Erik Larsson, Matteo Sonza Reorda, Maksim Jenihhin, Jaan Raik, Hans G. Kerkhoff, Rene Krenz-Baath, Piet Engelke BASTION: Board and SoC test instrumentation for ageing and no failure found. Search on Bibsonomy DATE The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Ulrich Abelein, Alejandro Cook, Piet Engelke, Michael Glaß, Felix Reimann, Laura Rodríguez Gómez, Thomas Russ, Jürgen Teich, Dominik Ull, Hans-Joachim Wunderlich Non-intrusive integration of advanced diagnosis features in automotive E/E-architectures. Search on Bibsonomy DATE The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Felix Reimann, Michael Glaß, Jürgen Teich, Alejandro Cook, Laura Rodríguez Gómez, Dominik Ull, Hans-Joachim Wunderlich, Piet Engelke, Ulrich Abelein Advanced Diagnosis: SBST and BIST Integration in Automotive E/E Architectures. Search on Bibsonomy DAC The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Tobias Koal, Markus Ulbricht, Piet Engelke, Heinrich Theodor Vierhaus On the feasibility of combining on-line-test and self repair for logic circuits. Search on Bibsonomy DDECS The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Christian Gleichner, Heinrich Theodor Vierhaus, Piet Engelke Scan Based Tests via Standard Interfaces. Search on Bibsonomy DSD The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Piet Engelke, Hermann Obermeir Funding project DIANA - Integrated diagnostics for the analysis of electronic failures in vehicles. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Alejandro Czutro, Ilia Polian, Matthew D. T. Lewis, Piet Engelke, Sudhakar M. Reddy, Bernd Becker 0001 Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability Analysis. Search on Bibsonomy International Journal of Parallel Programming The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Piet Engelke, Bernd Becker 0001, Michel Renovell, Jürgen Schlöffel, Bettina Braitling, Ilia Polian SUPERB: Simulator utilizing parallel evaluation of resistive bridges. Search on Bibsonomy ACM Trans. Design Autom. Electr. Syst. The full citation details ... 2009 DBLP  DOI  BibTeX  RDF PPSFP, SPPFP, fault mapping, Resistive bridging faults, bridging fault simulation
1Alejandro Czutro, Ilia Polian, Piet Engelke, Sudhakar M. Reddy, Bernd Becker 0001 Dynamic Compaction in SAT-Based ATPG. Search on Bibsonomy Asian Test Symposium The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Nicolas Houarche, Mariane Comte, Michel Renovell, Alejandro Czutro, Piet Engelke, Ilia Polian, Bernd Becker 0001 An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects. Search on Bibsonomy VTS The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Alejandro Czutro, Ilia Polian, Matthew D. T. Lewis, Piet Engelke, Sudhakar M. Reddy, Bernd Becker 0001 TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis. Search on Bibsonomy VLSI Design The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Piet Engelke, Ilia Polian, Michel Renovell, Sandip Kundu, Bharath Seshadri, Bernd Becker 0001 On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Ilia Polian, Kohei Miyase, Yusuke Nakamura, Seiji Kajihara, Piet Engelke, Bernd Becker 0001, Stefan Spinner, Xiaoqing Wen Diagnosis of Realistic Defects Based on the X-Fault Model. Search on Bibsonomy DDECS The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Piet Engelke, Ilia Polian, Jürgen Schlöffel, Bernd Becker 0001 Resistive Bridging Fault Simulation of Industrial Circuits. Search on Bibsonomy DATE The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, Michel Renovell, Bernd Becker 0001 A Simulator of Small-Delay Faults Caused by Resistive-Open Defects. Search on Bibsonomy European Test Symposium The full citation details ... 2008 DBLP  DOI  BibTeX  RDF Small-delay defects, resistive opens, probabilistic fault coverage, bridging fault simulation
1Stefan Spinner, Ilia Polian, Piet Engelke, Bernd Becker 0001, Martin Keim, Wu-Tung Cheng Automatic Test Pattern Generation for Interconnect Open Defects. Search on Bibsonomy VTS The full citation details ... 2008 DBLP  DOI  BibTeX  RDF Interconnect opens, Open-via defects, ATPG
1Stefan Hillebrecht, Ilia Polian, Piet Engelke, Bernd Becker 0001, Martin Keim, Wu-Tung Cheng Extraction, Simulation and Test Generation for Interconnect Open Defects Based on Enhanced Aggressor-Victim Model. Search on Bibsonomy ITC The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Yuyi Tang, Hans-Joachim Wunderlich, Piet Engelke, Ilia Polian, Bernd Becker 0001, Jürgen Schlöffel, Friedrich Hapke, Michael Wittke X-masking during logic BIST and its impact on defect coverage. Search on Bibsonomy IEEE Trans. VLSI Syst. The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker 0001 Simulating Resistive-Bridging and Stuck-At Faults. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker 0001 Automatic Test Pattern Generation for Resistive Bridging Faults. Search on Bibsonomy J. Electronic Testing The full citation details ... 2006 DBLP  DOI  BibTeX  RDF resistive short defects, ATPG, SAT, bridging faults
1Ilia Polian, Piet Engelke, Michel Renovell, Bernd Becker 0001 Modeling Feedback Bridging Faults with Non-Zero Resistance. Search on Bibsonomy J. Electronic Testing The full citation details ... 2005 DBLP  DOI  BibTeX  RDF feedback bridging faults, resistive bridging faults, bridging fault simulation
1Gang Chen 0011, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski, Piet Engelke, Bernd Becker 0001 A unified fault model and test generation procedure for interconnect opens and bridges. Search on Bibsonomy European Test Symposium The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1Sandip Kundu, Piet Engelke, Ilia Polian, Bernd Becker 0001 On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing. Search on Bibsonomy Asian Test Symposium The full citation details ... 2005 DBLP  DOI  BibTeX  RDF Temperature testing, Resistive defects, Early-life failures, Low-voltage testing
1Ilia Polian, Sandip Kundu, Jean Marc Gallière, Piet Engelke, Michel Renovell, Bernd Becker 0001 Resistive Bridge Fault Model Evolution from Conventional to Ultra Deep Submicron Technologies. Search on Bibsonomy VTS The full citation details ... 2005 DBLP  DOI  BibTeX  RDF Deep submicron technology modeling, Resistive bridging faults
1Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker 0001 Automatic test pattern generation for resistive bridging faults. Search on Bibsonomy European Test Symposium The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
1Piet Engelke, Ilia Polian, Michel Renovell, Bharath Seshadri, Bernd Becker 0001 The Pros and Cons of Very-Low-Voltage Testing: An Analysis based on Resistive Bridging Faults. Search on Bibsonomy VTS The full citation details ... 2004 DBLP  DOI  BibTeX  RDF Very-Low-Voltage testing, Resistive short defects
1Yuyi Tang, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Piet Engelke, Ilia Polian, Bernd Becker 0001 X-Masking During Logic BIST and Its Impact on Defect Coverage. Search on Bibsonomy ITC The full citation details ... 2004 DBLP  DOI  BibTeX  RDF X-Masking, Resistive Bridging Faults, Defect Coverage, Logic BIST
1Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker 0001 Simulating Resistive Bridging and Stuck-At Faults. Search on Bibsonomy ITC The full citation details ... 2003 DBLP  DOI  BibTeX  RDF Resistive stuck-at faults, probabilistic fault coverage, Resistive bridging faults, bridging fault simulation
1Ilia Polian, Piet Engelke, Bernd Becker 0001 Efficient Bridging Fault Simulation of Sequential Circuits Based on Multi-Valued Logics. Search on Bibsonomy ISMVL The full citation details ... 2002 DBLP  DOI  BibTeX  RDF Voting models, Fault simulation, Bridging faults
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