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Publications of "Xiaoqing Wen" ( http://dblp.L3S.de/Authors/Xiaoqing_Wen )

  Author page on DBLP  Author page in RDF  Community of Xiaoqing Wen in ASPL-2

Publication years (Num. hits)
1990-2003 (15) 2004-2005 (15) 2006-2008 (30) 2009-2010 (17) 2011-2012 (20) 2013-2015 (15) 2016-2017 (16) 2018-2019 (7)
Publication types (Num. hits)
article(49) inproceedings(86)
Venues (Conferences, Journals, ...)
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The graphs summarize 36 occurrences of 32 keywords

Results
Found 136 publication records. Showing 135 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
1Aibin Yan, Zhen Wu, Jing Guo, Jie Song, Xiaoqing Wen Novel Double-Node-Upset-Tolerant Memory Cell Designs Through Radiation-Hardening-by-Design and Layout. Search on Bibsonomy IEEE Trans. Reliability The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Massimo Alioto, Magdy S. Abadir, Tughrul Arslan, Chirn Chye Boon, Andreas Burg, Chip-Hong Chang, Meng-Fan Chang, Yao-Wen Chang, Poki Chen, Pasquale Corsonello, Paolo Crovetti, Shiro Dosho, Rolf Drechsler, Ibrahim Abe M. Elfadel, Ruonan Han 0001, Masanori Hashimoto, Chun-Huat Heng, Deukhyoun Heo, Tsung-Yi Ho, Houman Homayoun, Yuh-Shyan Hwang, Ajay Joshi, Rajiv V. Joshi, Tanay Karnik, Chulwoo Kim, Tae-Hyoung Kim, Jaydeep Kulkarni, Volkan Kursun, Yoonmyung Lee, Hai Helen Li, Huawei Li, Prabhat Mishra, Baker Mohammad, Mehran Mozaffari Kermani, Makoto Nagata, Koji Nii, Partha Pratim Pande, Bipul C. Paul, Vasilis F. Pavlidis, José Pineda de Gyvez, Ioannis Savidis, Patrick Schaumont, Fabio Sebastiano, Anirban Sengupta, Mingoo Seok, Mircea R. Stan, Mark M. Tehranipoor, Aida Todri-Sanial, Marian Verhelst, Valerio Vignoli, Xiaoqing Wen, Jiang Xu 0001, Wei Zhang 0012, Zhengya Zhang, Jun Zhou, Mark Zwolinski, Stacey Weber Editorial TVLSI Positioning - Continuing and Accelerating an Upward Trajectory. Search on Bibsonomy IEEE Trans. VLSI Syst. The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Aibin Yan, Kang Yang, Zhengfeng Huang, Jiliang Zhang 0002, Jie Cui, Xiangsheng Fang, Maoxiang Yi, Xiaoqing Wen A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application. Search on Bibsonomy IEEE Trans. on Circuits and Systems The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Aibin Yan, Yuanjie Hu, Jie Song, Xiaoqing Wen Single-Event Double-Upset Self-Recoverable and Single-Event Transient Pulse Filterable Latch Design for Low Power Applications. Search on Bibsonomy DATE The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Ruijun Ma, Stefan Holst, Xiaoqing Wen, Aibin Yan, Hui Xu STAHL: A Novel Scan-Test-Aware Hardened Latch Design. Search on Bibsonomy ETS The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Infall Syafalni, Tsutomu Sasao, Xiaoqing Wen A Method to Detect Bit Flips in a Soft-Error Resilient TCAM. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Stefan Holst, Ruijun Ma, Xiaoqing Wen The impact of production defects on the soft-error tolerance of hardened latches. Search on Bibsonomy ETS The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Dong Xiang, Xiaoqing Wen, Laung-Terng Wang Low-Power Scan-Based Built-In Self-Test Based on Weighted Pseudorandom Test Pattern Generation and Reseeding. Search on Bibsonomy IEEE Trans. VLSI Syst. The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Krishnendu Chakrabarty, Massimo Alioto, Bevan M. Baas, Chirn Chye Boon, Meng-Fan Chang, Naehyuck Chang, Yao-Wen Chang, Chip-Hong Chang, Shih-Chieh Chang, Poki Chen, Masud H. Chowdhury, Pasquale Corsonello, Ibrahim Abe M. Elfadel, Said Hamdioui, Masanori Hashimoto, Tsung-Yi Ho, Houman Homayoun, Yuh-Shyan Hwang, Rajiv V. Joshi, Tanay Karnik, Mehran Mozaffari Kermani, Chulwoo Kim, Tae-Hyoung Kim, Jaydeep P. Kulkarni, Eren Kursun, Erik Larsson, Hai (Helen) Li, Huawei Li, Patrick P. Mercier, Prabhat Mishra, Makoto Nagata, Arun S. Natarajan, Koji Nii, Partha Pratim Pande, Ioannis Savidis, Mingoo Seok, Sheldon X.-D. Tan, Mark Mohammad Tehranipoor, Aida Todri-Sanial, Miroslav N. Velev, Xiaoqing Wen, Jiang Xu 0001, Wei Zhang 0012, Zhengya Zhang, Stacey Weber Jackson Editorial. Search on Bibsonomy IEEE Trans. VLSI Syst. The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Eric Schneider, Michael A. Kochte, Stefan Holst, Xiaoqing Wen, Hans-Joachim Wunderlich GPU-Accelerated Simulation of Small Delay Faults. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Tianming Ni, Mu Nie, Huaguo Liang, Jingchang Bian, Xiumin Xu, Xiangsheng Fang, Zhengfeng Huang, Xiaoqing Wen Vernier ring based pre-bond through silicon vias test in 3D ICs. Search on Bibsonomy IEICE Electronic Express The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Yucong Zhang, Stefan Holst, Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Jun Qian Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption. Search on Bibsonomy ATS The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Stefan Holst, Eric Schneider, Koshi Kawagoe, Michael A. Kochte, Kohei Miyase, Hans-Joachim Wunderlich, Seiji Kajihara, Xiaoqing Wen Analysis and mitigation or IR-Drop induced scan shift-errors. Search on Bibsonomy ITC The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Wei-Sheng Ding, Hung-Yi Hsieh, Cheng-Yu Han, James Chien-Mo Li, Xiaoqing Wen Test Pattern Modification for Average IR-Drop Reduction. Search on Bibsonomy IEEE Trans. VLSI Syst. The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Tian Chen, Dandan Shen, Xin Yi, Huaguo Liang, Xiaoqing Wen, Wei Wang Reseeding-Oriented Test Power Reduction for Linear-Decompression-Based Test Compression Architectures. Search on Bibsonomy IEICE Transactions The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Fuqiang Li, Xiaoqing Wen, Kohei Miyase, Stefan Holst, Seiji Kajihara Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation. Search on Bibsonomy IEICE Transactions The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Dong Xiang, Kele Shen, Bhargab B. Bhattacharya, Xiaoqing Wen, Xijiang Lin Thermal-Aware Small-Delay Defect Testing in Integrated Circuits for Mitigating Overkill. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Infall Syafalni, Tsutomu Sasao, Xiaoqing Wen Multiple-Bit-Flip Detection Scheme for a Soft-Error Resilient TCAM. Search on Bibsonomy ISVLSI The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Stephan Eggersglüß, Kohei Miyase, Xiaoqing Wen SAT-based post-processing for regional capture power reduction in at-speed scan test generation. Search on Bibsonomy ETS The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Stephan Eggersglüß, Stefan Holst, Daniel Tille, Kohei Miyase, Xiaoqing Wen Formal Test Point Insertion for Region-based Low-Capture-Power Compact At-Speed Scan Test. Search on Bibsonomy ATS The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Stefan Holst, Eric Schneider, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Hans-Joachim Wunderlich, Michael A. Kochte Timing-Accurate Estimation of IR-Drop Impact on Logic- and Clock-Paths During At-Speed Scan Test. Search on Bibsonomy ATS The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Matthias Sauer 0002, Jie Jiang, Sven Reimer, Kohei Miyase, Xiaoqing Wen, Bernd Becker 0001, Ilia Polian On Optimal Power-Aware Path Sensitization. Search on Bibsonomy ATS The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Takaaki Kato, Senling Wang, Yasuo Sato, Seiji Kajihara, Xiaoqing Wen A Flexible Power Control Method for Right Power Testing of Scan-Based Logic BIST. Search on Bibsonomy ATS The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Eric Schneider, Stefan Holst, Michael A. Kochte, Xiaoqing Wen, Hans-Joachim Wunderlich GPU-accelerated small delay fault simulation. Search on Bibsonomy DATE The full citation details ... 2015 DBLP  BibTeX  RDF
1Kohei Miyase, Matthias Sauer 0002, Bernd Becker 0001, Xiaoqing Wen, Seiji Kajihara Identification of high power consuming areas with gate type and logic level information. Search on Bibsonomy ETS The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Infall Syafalni, Tsutomu Sasao, Xiaoqing Wen, Stefan Holst, Kohei Miyase A soft-error tolerant TCAM using partial don't-care keys. Search on Bibsonomy ETS The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1K. Asada, Xiaoqing Wen, Stefan Holst, Kohei Miyase, Seiji Kajihara, Michael A. Kochte, Eric Schneider, Hans-Joachim Wunderlich, J. Qian Logic/Clock-Path-Aware At-Speed Scan Test Generation for Avoiding False Capture Failures and Reducing Clock Stretch. Search on Bibsonomy ATS The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Xiaoqing Wen Power supply noise and its reduction in at-speed scan testing. Search on Bibsonomy ASICON The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Akihiro Tomita, Xiaoqing Wen, Yasuo Sato, Seiji Kajihara, Kohei Miyase, Stefan Holst, Patrick Girard 0001, Mohammad Tehranipoor, Laung-Terng Wang On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST. Search on Bibsonomy IEICE Transactions The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Hongwei Yin, Xiaoyong Xiao, Xiaoqing Wen, Kai Liu Pattern analysis of a modified Leslie-Gower predator-prey model with Crowley-Martin functional response and diffusion. Search on Bibsonomy Computers & Mathematics with Applications The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Eric Schneider, Stefan Holst, Xiaoqing Wen, Hans-Joachim Wunderlich Data-parallel simulation for fast and accurate timing validation of CMOS circuits. Search on Bibsonomy ICCAD The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Infall Syafalni, Tsutomu Sasao, Xiaoqing Wen, Stefan Holst, Kohei Miyase Soft-error tolerant TCAMs for high-reliability packet classifications. Search on Bibsonomy APCCAS The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Kohei Miyase, Ryota Sakai, Xiaoqing Wen, Masao Aso, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara A Capture-Safety Checking Metric Based on Transition-Time-Relation for At-Speed Scan Testing. Search on Bibsonomy IEICE Transactions The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Hongwei Yin, Xiaoyong Xiao, Xiaoqing Wen, Tianshou Zhou Stability of regulatory protein Gradients induced by morphogen DPP in Drosophila wing Disc. Search on Bibsonomy I. J. Bifurcation and Chaos The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Yuta Yamato, Kohei Miyase, Seiji Kajihara, Xiaoqing Wen, Laung-Terng Wang, Michael A. Kochte LCTI-SS: Low-Clock-Tree-Impact Scan Segmentation for Avoiding Shift Timing Failures in Scan Testing. Search on Bibsonomy IEEE Design & Test The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Kohei Miyase, Matthias Sauer 0002, Bernd Becker 0001, Xiaoqing Wen, Seiji Kajihara Search Space Reduction for Low-Power Test Generation. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Akihiro Tomita, Xiaoqing Wen, Yasuo Sato, Seiji Kajihara, Patrick Girard 0001, Mohammad Tehranipoor, Laung-Terng Wang On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Kazunari Enokimoto, Xiaoqing Wen, Kohei Miyase, Jiun-Lang Huang, Seiji Kajihara, Laung-Terng Wang On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test Compression. Search on Bibsonomy VLSI Design The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Shianling Wu, Laung-Terng Wang, Xiaoqing Wen, Wen-Ben Jone, Michael S. Hsiao, Fangfang Li, James Chien-Mo Li, Jiun-Lang Huang Launch-on-Shift Test Generation for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains. Search on Bibsonomy ACM Trans. Design Autom. Electr. Syst. The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Hassan Salmani, Wei Zhao 0010, Mohammad Tehranipoor, Sreejit Chakravarty, Patrick Girard 0001, Xiaoqing Wen Layout-Aware Pattern Evaluation and Analysis for Power-Safe Application of Transition Delay Fault Patterns. Search on Bibsonomy J. Low Power Electronics The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Xiaoqing Wen Power-aware testing: The next stage. Search on Bibsonomy European Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Yi-Tsung Lin, Jiun-Lang Huang, Xiaoqing Wen A Transition Isolation Scan Cell Design for Low Shift and Capture Power. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Xiaoqing Wen, Sudhakar M. Reddy Session Summary III: Power-Aware Testing: Present and Future. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Kohei Miyase, Masao Aso, Ryou Ootsuka, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Kazunari Enokimoto, Seiji Kajihara A novel capture-safety checking method for multi-clock designs and accuracy evaluation with delay capture circuits. Search on Bibsonomy VTS The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Xiaoqing Wen, Y. Nishida, Kohei Miyase, Seiji Kajihara, Patrick Girard 0001, Mohammad Tehranipoor, Laung-Terng Wang On pinpoint capture power management in at-speed scan test generation. Search on Bibsonomy ITC The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Hiroshi Furukawa, Seiji Kajihara A GA-Based X-Filling for Reducing Launch Switching Activity toward Specific Objectives in At-Speed Scan Testing. Search on Bibsonomy IEICE Transactions The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing. Search on Bibsonomy IEICE Transactions The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Shianling Wu, Laung-Terng Wang, Xiaoqing Wen, Zhigang Jiang, Lang Tan, Yu Zhang, Yu Hu, Wen-Ben Jone, Michael S. Hsiao, James Chien-Mo Li, Jiun-Lang Huang, Lizhen Yu Using Launch-on-Capture for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Kohei Miyase, Xiaoqing Wen, Masao Aso, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara Transition-Time-Relation based capture-safety checking for at-speed scan test generation. Search on Bibsonomy DATE The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Michael A. Kochte, Sandip Kundu, Kohei Miyase, Xiaoqing Wen, Hans-Joachim Wunderlich Efficient BDD-based Fault Simulation in Presence of Unknown Values. Search on Bibsonomy Asian Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Kohei Miyase, Y. Uchinodan, Kazunari Enokimoto, Yuta Yamato, Xiaoqing Wen, Seiji Kajihara, Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard 0001, Arnaud Virazel Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling. Search on Bibsonomy Asian Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Xiaoqing Wen VLSI testing and test power. Search on Bibsonomy IGCC The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Michael A. Kochte, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Kazunari Enokimoto, Hans-Joachim Wunderlich SAT-based capture-power reduction for at-speed broadcast-scan-based test compression architectures. Search on Bibsonomy ISLPED The full citation details ... 2011 DBLP  BibTeX  RDF
1Xiaoqing Wen Towards the next generation of low-power test technologies. Search on Bibsonomy ASICON The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Xiaoqing Wen, Mohammad Tehranipoor, Rohit Kapur, Anand Bhat, Amitava Majumdar, LeRoy Winemberg Special session 5B: Panel How much toggle activity should we be testing with? Search on Bibsonomy VTS The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Xiaoqing Wen, Kazunari Enokimoto, Kohei Miyase, Yuta Yamato, Michael A. Kochte, Seiji Kajihara, Patrick Girard 0001, Mohammad Tehranipoor Power-aware test generation with guaranteed launch safety for at-speed scan testing. Search on Bibsonomy VTS The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Yuta Yamato, Xiaoqing Wen, Michael A. Kochte, Kohei Miyase, Seiji Kajihara, Laung-Terng Wang A novel scan segmentation design method for avoiding shift timing failure in scan testing. Search on Bibsonomy ITC The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Yi-Tsung Lin, Jiun-Lang Huang, Xiaoqing Wen Clock-gating-aware low launch WSA test pattern generation for at-speed scan testing. Search on Bibsonomy ITC The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Shinji Oku, Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen On Delay Test Quality for Test Cubes. Search on Bibsonomy IPSJ Trans. System LSI Design Methodology The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Atsushi Takashima, Hiroshi Furukawa, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja A Study of Capture-Safe Test Generation Flow for At-Speed Testing. Search on Bibsonomy IEICE Transactions The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Kohei Miyase, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara, Patrick Girard 0001, Laung-Terng Wang, Mohammad Tehranipoor High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme. Search on Bibsonomy IEICE Transactions The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Laung-Terng Wang, Xiaoqing Wen, Shianling Wu, Hiroshi Furukawa, Hao-Jan Chao, Boryau Sheu, Jianghao Guo, Wen-Ben Jone Using Launch-on-Capture for Testing BIST Designs Containing Synchronous and Asynchronous Clock Domains. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel, Mohammad Tehranipoor, Xiaoqing Wen, Nisar Ahmed A Comprehensive Analysis of Transition Fault Coverage and Test Power Dissipation for Launch-Off-Shift and Launch-Off-Capture Schemes. Search on Bibsonomy J. Low Power Electronics The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel, Junxia Ma, Wei Zhao 0010, Mohammad Tehranipoor, Xiaoqing Wen Analysis of power consumption and transition fault coverage for LOS and LOC testing schemes. Search on Bibsonomy DDECS The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Mitsumasa Noda, Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen, Yukiya Miura On estimation of NBTI-Induced delay degradation. Search on Bibsonomy European Test Symposium The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Nor Azura Zakaria, Edward V. Bautista Jr., Suhaimi Bahisham Jusoh, Weng Fook Lee, Xiaoqing Wen Case Studies on Transition Fault Test Generation for At-speed Scan Testing. Search on Bibsonomy DFT The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Lizhen Yu, Jeffrey Hung, Boryau Sheu, Bill Huynh, Loc Nguyen, Shianling Wu, Laung-Terng Wang, Xiaoqing Wen Hybrid Built-In Self-Test Architecture for Multi-port Static RAMs. Search on Bibsonomy DFT The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Shianling Wu, Laung-Terng Wang, Lizhen Yu, Hiroshi Furukawa, Xiaoqing Wen, Wen-Ben Jone, Nur A. Touba, FeiFei Zhao, Jinsong Liu, Hao-Jan Chao, Fangfang Li, Zhigang Jiang Logic BIST Architecture Using Staggered Launch-on-Shift for Testing Designs Containing Asynchronous Clock Domains. Search on Bibsonomy DFT The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Xiaoqing Wen Low-Power Testing for Low-Power Devices. Search on Bibsonomy DFT The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel, Mohammad Tehranipoor, Kohei Miyase, Xiaoqing Wen, Nisar Ahmed Is test power reduction through X-filling good enough? Search on Bibsonomy ITC The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Meng-Fan Wu, Jiun-Lang Huang, Xiaoqing Wen, Kohei Miyase Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Laung-Terng Wang, Ravi Apte, Shianling Wu, Boryau Sheu, Wen-Ben Jone, Jianghao Guo, Kuen-Jong Lee, Wei-Shin Wang, Xiaoqing Wen, Hao-Jan Chao, Jinsong Liu, Yanlong Niu, Yi-Chih Sung, Chi-Chun Wang, Fangfang Li Turbo1500: Core-Based Design for Test and Diagnosis. Search on Bibsonomy IEEE Design & Test of Computers The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Kazunari Enokimoto, Xiaoqing Wen, Yuta Yamato, Kohei Miyase, H. Sone, Seiji Kajihara, Masao Aso, Hiroshi Furukawa CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing. Search on Bibsonomy Asian Test Symposium The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Kohei Miyase, Yuta Yamato, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Xiaoqing Wen, Seiji Kajihara A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment. Search on Bibsonomy ICCAD The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Hiroshi Furukawa, Seiji Kajihara A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching Activity in At-speed Scan Testing. Search on Bibsonomy PRDC The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo Estimation of Delay Test Quality and Its Application to Test Generation. Search on Bibsonomy IPSJ Trans. System LSI Design Methodology The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Yuta Yamato, Yusuke Nakamura, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits. Search on Bibsonomy IEICE Transactions The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Kohei Miyase, Kenta Terashima, Xiaoqing Wen, Seiji Kajihara, Sudhakar M. Reddy On Detection of Bridge Defects with Stuck-at Tests. Search on Bibsonomy IEICE Transactions The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing. Search on Bibsonomy J. Electronic Testing The full citation details ... 2008 DBLP  DOI  BibTeX  RDF At-speed scan testing, Capture switching activity, X-filling, Test cube, ATPG, Low power testing
1C. P. Ravikumar, Mokhtar Hirech, Xiaoqing Wen Test Strategies for Low-Power Devices. Search on Bibsonomy J. Low Power Electronics The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Laung-Terng Wang, Xiaoqing Wen, Shianling Wu, Zhigang Wang, Zhigang Jiang, Boryau Sheu, Xinli Gu VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG. Search on Bibsonomy IEEE Design & Test of Computers The full citation details ... 2008 DBLP  DOI  BibTeX  RDF combinational broadcaster, combinational compactor, fault diagnosis, ATPG, test compression, low-power testing, scan testing
1Ilia Polian, Kohei Miyase, Yusuke Nakamura, Seiji Kajihara, Piet Engelke, Bernd Becker 0001, Stefan Spinner, Xiaoqing Wen Diagnosis of Realistic Defects Based on the X-Fault Model. Search on Bibsonomy DDECS The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1C. P. Ravikumar, Mokhtar Hirech, Xiaoqing Wen Test Strategies for Low Power Devices. Search on Bibsonomy DATE The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Dimitris Gizopoulos, Kaushik Roy 0001, Patrick Girard 0001, Nicola Nicolici, Xiaoqing Wen Power-Aware Testing and Test Strategies for Low Power Devices. Search on Bibsonomy DATE The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Hiroshi Furukawa, Yuta Yamato, Atsushi Takashima, Kenji Noda, H. Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja A Capture-Safe Test Generation Scheme for At-Speed Scan Testing. Search on Bibsonomy European Test Symposium The full citation details ... 2008 DBLP  DOI  BibTeX  RDF At-Speed Scan Testing, Test Relaxation, X-Filling, Capture Mode, Yield Loss
1Hiroshi Furukawa, Xiaoqing Wen, Kohei Miyase, Yuta Yamato, Seiji Kajihara, Patrick Girard 0001, Laung-Terng Wang, Mark Tehranipoor CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing. Search on Bibsonomy ATS The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Shianling Wu, Hiroshi Furukawa, Boryau Sheu, Laung-Terng Wang, Hao-Jan Chao, Lizhen Yu, Xiaoqing Wen, Michio Murakami Practical Challenges in Logic BIST Implementation. Search on Bibsonomy ATS The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification. Search on Bibsonomy ICCAD The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Shianling Wu, Laung-Terng Wang, Zhigang Jiang, Jiayong Song, Boryau Sheu, Xiaoqing Wen, Michael S. Hsiao, James Chien-Mo Li, Jiun-Lang Huang, Ravi Apte On Optimizing Fault Coverage, Pattern Count, and ATPG Run Time Using a Hybrid Single-Capture Scheme for Testing Scan Designs. Search on Bibsonomy DFT The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Meng-Fan Wu, Jiun-Lang Huang, Xiaoqing Wen, Kohei Miyase Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Scan Testing. Search on Bibsonomy ITC The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Laung-Terng Wang, Ravi Apte, Shianling Wu, Boryau Sheu, Kuen-Jong Lee, Xiaoqing Wen, Wen-Ben Jone, Chia-Hsien Yeh, Wei-Shin Wang, Hao-Jan Chao, Jianghao Guo, Jinsong Liu, Yanlong Niu, Yi-Chih Sung, Chi-Chun Wang, Fangfang Li Turbo1500: Toward Core-Based Design for Test and Diagnosis Using the IEEE 1500 Standard. Search on Bibsonomy ITC The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Tatsuya Suzuki, Kewal K. Saluja, Laung-Terng Wang, Kozo Kinoshita A Novel ATPG Method for Capture Power Reduction during Scan Testing. Search on Bibsonomy IEICE Transactions The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
1B. Cheon, E. Lee, Laung-Terng Wang, Xiaoqing Wen, P. Hsu, J. Cho, J. Park, H. Chao, Shianling Wu At-Speed Logic BIST for IP Cores Search on Bibsonomy CoRR The full citation details ... 2007 DBLP  BibTeX  RDF
1Nicola Nicolici, Xiaoqing Wen Embedded Tutorial on Low Power Test. Search on Bibsonomy European Test Symposium The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
1Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo Estimation of delay test quality and its application to test generation. Search on Bibsonomy ICCAD The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
1Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Tatsuya Suzuki, Yuta Yamato, Patrick Girard 0001, Yuji Ohsumi, Laung-Terng Wang A novel scheme to reduce power supply noise for high-quality at-speed scan testing. Search on Bibsonomy ITC The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
1Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Yuji Ohsumi, Kewal K. Saluja Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing. Search on Bibsonomy DAC The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
1Yu Hu, Yinhe Han, Xiaowei Li 0001, Huawei Li, Xiaoqing Wen Compression/Scan Co-design for Reducing Test Data Volume, Scan-in Power Dissipation, and Test Application Time. Search on Bibsonomy IEICE Transactions The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Yuta Yamato, Kewal K. Saluja, Laung-Terng Wang, Kozo Kinoshita A Per-Test Fault Diagnosis Method Based on the X-Fault Model. Search on Bibsonomy IEICE Transactions The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Xiaoqing Wen, Yoshiyuki Yamashita, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita A New Method for Low-Capture-Power Test Generation for Scan Testing. Search on Bibsonomy IEICE Transactions The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
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