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Publications of "Zhiyuan Hu" ( http://dblp.L3S.de/Authors/Zhiyuan_Hu )

  Author page on DBLP  Author page in RDF  Community of Zhiyuan Hu in ASPL-2

Publication years (Num. hits)
2004-2017 (15) 2018-2019 (6)
Publication types (Num. hits)
article(13) inproceedings(8)
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Found 22 publication records. Showing 21 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
1Fanshuang Kong, Richong Zhang, Hongyu Guo, Samuel Mensah, Zhiyuan Hu, Yongyi Mao A Neural Bag-of-Words Modelling Framework for Link Prediction in Knowledge Bases with Sparse Connectivity. Search on Bibsonomy WWW The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Richong Zhang, Xinyu Liu, Xinwei Chen, Zhiyuan Hu, Zhaoqing Xu, Yongyi Mao Generating Chinese Ci with Designated Metrical Structure. Search on Bibsonomy AAAI The full citation details ... 2019 DBLP  BibTeX  RDF
1Bin Xu 0014, Yong Tang, Zhengshan Wang, Liang Shi, Jin Qi, Zhiyuan Hu Cloud manufacturing service composition with service cooperation level evaluation. Search on Bibsonomy IJWMC The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Zhiyuan Hu, Lihua Dai, Zhengxuan Zhang, Xiaoyun Li, Shichang Zou Total dose radiation induced changes of the floating body effects in the partially depleted SOI NMOS with ultrathin gate oxide. Search on Bibsonomy IEICE Electronic Express The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Cunjun Zhang, Kehua Lei, Jia Jia, Yihui Ma, Zhiyuan Hu AI Painting: An Aesthetic Painting Generation System. Search on Bibsonomy ACM Multimedia The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
1Richong Zhang, Zhiyuan Hu, Hongyu Guo, Yongyi Mao Syntax Encoding with Application in Authorship Attribution. Search on Bibsonomy EMNLP The full citation details ... 2018 DBLP  BibTeX  RDF
1Lei Song, Zhiyuan Hu, Mengying Zhang, Xiaonian Liu, Lihua Dai, Zhengxuan Zhang, Shichang Zou Influences of silicon-rich shallow trench isolation on total ionizing dose hardening and gate oxide integrity in a 130 nm partially depleted SOI CMOS technology. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Lihua Dai, Xiaonian Liu, Mengying Zhang, Leqing Zhang, Zhiyuan Hu, Dawei Bi, Zhengxuan Zhang, Shichang Zou Degradation induced by TID radiation and hot-carrier stress in 130-nm short channel PDSOI NMOSFETs. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Xiaoliang Yang, Zihua Wang, Zhichu Xiang, Dan Li, Zhiyuan Hu, Wei Cui, Lingling Geng, Qiaojun Fang Peptide probes derived from pertuzumab by molecular dynamics modeling for HER2 positive tumor imaging. Search on Bibsonomy PLoS Computational Biology The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Zhiyuan Hu, Yueming Yin A framework for security on demand. Search on Bibsonomy IWCMC The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Mingyu Zhao, Zhiyuan Hu An RNS-based forwarding approach to implement SFC. Search on Bibsonomy ICTC The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
1Shuang Fan, Bingxu Ning, Zhiyuan Hu, Zhengxuan Zhang, Dawei Bi, Chao Peng, Lei Song, Lihua Dai Bias dependence of TID induced single transistor latch for 0.13 μm partially depleted SOI input/output NMOSFETs. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
1Zhiyuan Hu, Mingwen Wang, Xueqiang Yan, Yueming Yin, Zhigang Luo A comprehensive security architecture for SDN. Search on Bibsonomy ICIN The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
1Chao Peng, Zhiyuan Hu, Zhengxuan Zhang, Huixiang Huang, Bingxu Ning, Dawei Bi Total ionizing dose effect in 0.2 μm PDSOI NMOSFETs with shallow trench isolation. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
1Bingxu Ning, Dawei Bi, Huixiang Huang, Zhengxuan Zhang, Zhiyuan Hu, Ming Chen 0007, Shichang Zou Bias dependence of TID radiation responses of 0.13 μm partially depleted SOI NMOSFETs. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
1Bingxu Ning, Zhengxuan Zhang, Zhangli Liu, Zhiyuan Hu, Ming Chen 0007, Dawei Bi, Shichang Zou Radiation-induced shallow trench isolation leakage in 180-nm flash memory technology. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Zhiyuan Hu, Zhangli Liu, Hua Shao, Zhengxuan Zhang, Bingxu Ning, Ming Chen 0007, Dawei Bi, Shichang Zou Impact of within-wafer process variability on radiation response. Search on Bibsonomy Microelectronics Journal The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Bingxu Ning, Zhiyuan Hu, Zhengxuan Zhang, Zhangli Liu, Ming Chen 0007, Dawei Bi, Shichang Zou The impact of total ionizing radiation on body effect. Search on Bibsonomy Microelectronics Journal The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Zhiyuan Hu, Zhangli Liu, Hua Shao, Zhengxuan Zhang, Bingxu Ning, Ming Chen 0007, Dawei Bi, Shichang Zou Total ionizing dose effects in elementary devices for 180-nm flash technologies. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Zhangli Liu, Zhiyuan Hu, Zhengxuan Zhang, Hua Shao, Ming Chen 0007, Dawei Bi, Bingxu Ning, Shichang Zou Comparison of TID response in core, input/output and high voltage transistors for flash memory. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Zhiyuan Hu, Yaowei Liu, Xiao Hu, Jianhua Li Anonymous Micropayments Authentication(AMA) in Mobile Data Network. Search on Bibsonomy INFOCOM The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
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