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Found 5 publication records. Showing 4 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
1 | Utpreksh Patbhaje, Rupali Verma, Jeevesh Kumar, Ansh, Mayank Shrivastava |
Unveiling Field Driven Performance Unreliabilities Governed by Channel Dynamics in MoSe2 FETs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023, pp. 1-6, 2023, IEEE, 978-1-6654-5672-2. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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1 | Ansh, Gaurav Sheoran, Jeevesh Kumar, Mayank Shrivastava |
First Insights into Electro-Thermal Stress Driven Time-Dependent Permanent Degradation Failure of CVD Monolayer MoS2 Channel. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020, pp. 1-4, 2020, IEEE, 978-1-7281-3199-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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1 | Jeevesh Kumar, Ansh, Asha Yadav, Anant Singh, Andrew Naclerio, Dmitri N. Zakharov, Piran Kidambi, Mayank Shrivastava |
Physical Insights into Phosphorene Transistor Degradation Under Exposure to Atmospheric Conditions and Electrical Stress. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020, pp. 1-4, 2020, IEEE, 978-1-7281-3199-3. The full citation details ...](Pics/full.jpeg) |
2020 |
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1 | Jeevesh Kumar, Ansh, Hemanjaneyulu Kuruva, Mayank Shrivastava |
Defect Assisted Metal-TMDs Interface Engineering: A First Principle Insight. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DRC ![In: 2020 Device Research Conference, DRC 2020, Columbus, OH, USA, June 21-24, 2020, pp. 1-2, 2020, IEEE, 978-1-7281-7047-3. The full citation details ...](Pics/full.jpeg) |
2020 |
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