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Found 4 publication records. Showing 3 according to the selection in the facets
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1 | Helik Kanti Thacker, Sairam Jujjarapu, Adrita Barari, Damini, Paulami Das, Sudhanshu Gupta 0003, Akhilesh Sudhir Patankar, Keerthi Kiran Jagannathachar, Deokgu Yoon |
A scalable solution to AlphaZero based Redundancy Analysis for semiconductor chips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICMLA ![In: 21st IEEE International Conference on Machine Learning and Applications, ICMLA 2022, Nassau, Bahamas, December 12-14, 2022, pp. 119-125, 2022, IEEE, 978-1-6654-6283-9. The full citation details ...](Pics/full.jpeg) |
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1 | Ankit Gupta 0010, Adrita Barari, Damini, Keerthi Kiran Jagannathachar, Seungwoo Lee, Janghoon Oh, Jungha Kim, Min-Joo Kim |
Identifying Combination of Defects and Unknown Defects on Semiconductor Wafers using Deep Learning and Hierarchical Reclustering. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSID ![In: 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems, VLSID 2022, Bangalore, India, February 26 - March 2, 2022, pp. 150-155, 2022, IEEE, 978-1-6654-8505-0. The full citation details ...](Pics/full.jpeg) |
2022 |
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1 | Helik Kanti Thacker, Atishay Kumar, Adrita Barari, Damini, Ankit Gupta 0010, Keerthi Kiran Jagannathachar, Deokgu Yoon |
AlphaRA: An AlphaZero based approach to Redundancy Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICMLA ![In: 20th IEEE International Conference on Machine Learning and Applications, ICMLA 2021, Pasadena, CA, USA, December 13-16, 2021, pp. 477-483, 2021, IEEE, 978-1-6654-4337-1. The full citation details ...](Pics/full.jpeg) |
2021 |
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