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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 6 occurrences of 6 keywords
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Results
Found 5 publication records. Showing 5 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
59 | Jacques J. A. Fournier, Philippe Loubet-Moundi |
Memory Address Scrambling Revealed Using Fault Attacks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FDTC ![In: 2010 Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2010, Santa Barbara, California, USA, 21 August 2010, pp. 30-36, 2010, IEEE Computer Society, 978-0-7695-4169-3. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
Floating Gate memories, address scrambling, EEPROM, reverse-engineering, Fault Injections, Flash |
33 | Ad J. van de Goor, Ivo Schanstra |
Address and Data Scrambling: Causes and Impact on Memory Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DELTA ![In: 1st IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2002), 29-31 January 2002, Christchurch, New Zealand, pp. 128-136, 2002, IEEE Computer Society, 0-7695-1453-7. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
Address-scrambling, data-scrambling, fault models, memory tests, data backgrounds |
26 | Shyue-Kung Lu, Tsu-Lin Li, Masaki Hashizume, Jiann-Liang Chen |
Address Scrambling and Data Inversion Techniques for Yield Enhancement of NROM-Based ROMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 64(5), pp. 1230-1240, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
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26 | Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine |
On using address scrambling to implement defect tolerance in SRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011, pp. 1-8, 2011, IEEE Computer Society, 978-1-4577-0153-5. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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15 | Carolina Selva, Cosimo Torelli, Danilo Rimondi, Rita Zappa, Stefano Corbani, Giovanni Mastrodomenico, Lara Albani |
A Programmable Built-in Self-Diagnosis for Embedded SRAM. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MTDT ![In: 12th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2004), 9-10 August 2004, San Jose, CA, USA, pp. 84-89, 2004, IEEE Computer Society, 0-7695-2193-2. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
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