Search results for "BILBO"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
102	Jiaoyan Chen, Dilip P. Vasudevan, Emanuel M. Popovici, Michel P. Schellekens	Reversible online BIST using bidirectional BILBO.	Conf. Computing Frontiers	2010	DBLP DOI BibTeX RDF	bilbo, bist, testing, reversible logic
102	Sen-Pin Lin, Charles Njinda, Melvin A. Breuer	Generating a family of testable designs using the BILBO methodology.	J. Electron. Test.	1993	DBLP DOI BibTeX RDF	BILBO design system, built-in self-test, test scheduling, synthesis for testability
63	G. M. Beumer, Qian Tao, Asker M. Bazen, Raymond N. J. Veldhuis	A Landmark Paper in Face Recognition.	FGR	2006	DBLP DOI BibTeX RDF	face registration, Viola-Jones, landmark correction, face recognition, landmarking, likelihood ratio
63	O. A. Petlin, Stephen B. Furber	Built-In Self-Testing of Micropipelines.	ASYNC	1997	DBLP DOI BibTeX RDF	Built-in self-test, Design for test, Asynchronous design, Micropipelines
63	Mohammed Fadle Abdulla, C. P. Ravikumar, Anshul Kumar	A Novel BIST Architecture With Built-in Self Check.	VLSI Design	1996	DBLP DOI BibTeX RDF
51	Rachel Bilbo, Zhi Li, Kendal Norman, Gautam Golwala, Sathya Sundaram, Perry Lee, Jan P. Allebach	Understanding fashion aesthetics: training a neural network based predictor using popularity scores.	IQSP	2019	DBLP DOI BibTeX RDF
42	Albrecht P. Stroele, Hans-Joachim Wunderlich	Hardware-optimal test register insertion.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1998	DBLP DOI BibTeX RDF
42	Kwanghyun Kim, Joseph G. Tront, Dong Sam Ha	Automatic Insertion of BIST Hardware Using VHDL.	DAC	1988	DBLP BibTeX RDF
42	Andrzej Krasniewski, Alexander Albicki	Simulation-free estimation of speed degradation in NMOS self-testing circuits for CAD applications.	DAC	1985	DBLP DOI BibTeX RDF
32	Xuedong Li, Walter Yuan, Dezhong Peng, Qiaozhu Mei, Yue Wang 0035	When BERT meets Bilbo: a learning curve analysis of pretrained language model on disease classification.	BMC Medical Informatics Decis. Mak.	2021	DBLP DOI BibTeX RDF
32	Xuedong Li, Walter Yuan, Dezhong Peng, Qiaozhu Mei, Yue Wang 0035	When BERT Meets Bilbo: A Learning Curve Analysis of Pretrained Language Model on Disease Classification.	ICHI	2020	DBLP DOI BibTeX RDF
32	Elaheh Sadredini, Mohammadreza Najafi, Mahmood Fathy, Zainalabedin Navabi	BILBO-friendly Hybrid BIST Architecture with Asymmetric Polynomial Reseeding.	CoRR	2017	DBLP BibTeX RDF
32	Amal Htait, Sébastien Fournier, Patrice Bellot	Bilbo-Val: Automatic Identification of Bibliographical Zone in Papers.	LREC	2016	DBLP BibTeX RDF
32	Abdelhakim Latoui, Farid Djahli	An Optical BILBO for Online Testing of Embedded Systems.	IEEE Des. Test	2013	DBLP DOI BibTeX RDF
32	Young-Min Kim, Patrice Bellot, Jade Tavernier, Elodie Faath, Marin Dacos	Evaluation of BILBO reference parsing in digital humanities via a comparison of different tools.	ACM Symposium on Document Engineering	2012	DBLP DOI BibTeX RDF
32	Kazuteru Namba, Hideo Ito	Construction of BILBO FF with Soft-Error-Tolerant Capability.	IEICE Trans. Inf. Syst.	2011	DBLP DOI BibTeX RDF
32	Kazuteru Namba, Hideo Ito	Soft Error Tolerant BILBO FF.	DFT	2010	DBLP DOI BibTeX RDF
32	Ioannis Voyiatzis, Dimitris Kehagias	A SiC Pair Generator for a Bilbo Environment.	J. Circuits Syst. Comput.	2006	DBLP DOI BibTeX RDF
32	Anupam Basu, Thomas Charles Wilson, Dilip K. Banerji, Jayanti C. Majithia	An Approach to Minimize Testability Overhead for BILBO based Built-In-Self-Test.	VLSI Design	1992	DBLP DOI BibTeX RDF
32	M. Martinez, N. P. Cagigal, Salvador Bracho	Arithmetical logical unit design for a processor with BILBO techniques: Functional simulation and test strategies.	Microprocessing and Microprogramming	1990	DBLP DOI BibTeX RDF
32	Andrzej Krasniewski, Alexander Albicki	Automatic Design of Exhaustively Self-Testing Chips with Bilbo Modules.	ITC	1985	DBLP BibTeX RDF
28	Albrecht P. Stroele, Hans-Joachim Wunderlich	Test register insertion with minimum hardware cost.	ICCAD	1995	DBLP DOI BibTeX RDF	test register insertion, BILBO, CBILBO, Built-in self-test
28	Peter D. Hortensius, Robert D. McLeod, Howard C. Card	Cellular Automata-Based Signature analysis for Built-in Self-Test.	IEEE Trans. Computers	1990	DBLP DOI BibTeX RDF	signature analysis properties, one-dimensional cellular automata, cyclic-group rules, CALBO, cellular automata-based logic block observation, BILBO, built-in block observation, logic testing, built-in self-test, built-in self test, LFSR, linear feedback shift register, finite automata, test pattern generation
28	Thomas W. Williams, Kenneth P. Parker	Design for Testability - A Survey.	IEEE Trans. Computers	1982	DBLP DOI BibTeX RDF	Built-In Logic Block Observation (BILBO), Level Sensitive Scan Design (LSSD), Random Access Scan, Scan/Set Logic, testing, test generation, self test, Signature Analysis, Scan Path
21	Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu	An Improved Soft-Error Rate Measurement Technique.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2009	DBLP DOI BibTeX RDF
21	Doaa A. Nassar, Aly E. Salama	A heuristic DSP BIST insertion algorithm with minimum area overhead.	ISCAS (1)	2002	DBLP DOI BibTeX RDF
21	Aiman H. El-Maleh, Yahya E. Osais	A retiming-based test pattern generator design for built-in self test of data path architectures.	ISCAS (4)	2001	DBLP DOI BibTeX RDF
21	Mohammed Fadle Abdulla, C. P. Ravikumar, Anshul Kumar	Efficient Implementation of Multiple On-Chip Signature Checking.	VLSI Design	1997	DBLP DOI BibTeX RDF
21	Kwanghyun Kim, Joseph G. Tront, Dong Sam Ha	BIDES: A BIST design expert system.	J. Electron. Test.	1991	DBLP DOI BibTeX RDF	knowledge-based expert system, Built-in self-test, design for testability, pseudorandom testing
21	Andrzej Krasniewski, Slawomir Pilarski	Circular self-test path: a low-cost BIST technique for VLSI circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1989	DBLP DOI BibTeX RDF
21	Paolo Camurati, Paolo Gianoglio, Renato Gianoglio, Paolo Prinetto	ESTA: an expert system for DFT rule verification.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1988	DBLP DOI BibTeX RDF