Search results for "BISER"

Found 14 publication records. Showing 12 according to the selection in the facets

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
74	Ming Zhang 0017, Subhasish Mitra, T. M. Mak, Norbert Seifert, Nicholas J. Wang, Quan Shi, Kee Sup Kim, Naresh R. Shanbhag, Sanjay J. Patel	Sequential Element Design With Built-In Soft Error Resilience.	IEEE Trans. Very Large Scale Integr. Syst.	2006	DBLP DOI BibTeX RDF
74	Subhasish Mitra, Ming Zhang 0017, Norbert Seifert, T. M. Mak, Kee Sup Kim	Soft Error Resilient System Design through Error Correction.	VLSI-SoC	2006	DBLP DOI BibTeX RDF
49	Markus Lassnig, Mark Markus	Usage of e-Government Services in European Regions.	EGOV	2003	DBLP DOI BibTeX RDF
45	Mostafa Kamal Mallick, Sarah Biser, Aathira Haridas, Vaishnavi Umesh, Olaf Tönsing, Imrana Abdullahi Yari, Malte Ollenschläger, Maria Heckel, Christoph Ostgathe, Felix Kluge 0001, Björn M. Eskofier, Tobias Steigleder	Improving Dyspnoea Symptom Control of Patients in Palliative Care Using a Smart Patch-A Proof of Concept Study.	Frontiers Digit. Health	2021	DBLP DOI BibTeX RDF
45	Jivko Jeliazkov, Biser Tsvetkov, Hristo Kostadinov	Research Incentivization based on Smart Contract Platform.	ACCT	2020	DBLP DOI BibTeX RDF
45	Biser Tsvetkov, Jivko Jeliazkov, Hristo Kostadinov	Modern Software Lifecycle Management leveraging the power of Blockchain.	ACCT	2020	DBLP DOI BibTeX RDF
42	Hamza Iseric, Can Alkan, Faraz Hach, Ibrahim Numanagic	BISER: Fast Characterization of Segmental Duplication Structure in Multiple Genome Assemblies.	WABI	2021	DBLP DOI BibTeX RDF
42	Laung-Terng Wang, Nur A. Touba, Zhigang Jiang, Shianling Wu, Jiun-Lang Huang, James Chien-Mo Li	CSER: BISER-based concurrent soft-error resilience.	VTS	2010	DBLP DOI BibTeX RDF
36	Subhasish Mitra	Robust System Design.	VLSI Design	2010	DBLP DOI BibTeX RDF	Robust systems, IFRA, BISER, Built-In Soft Error Resilience, Circuit Failure Prediction, On-line Self-Test, Reliability, Validation, aging, soft errors, post-silicon validation
25	Subhasish Mitra	Globally Optimized Robust Systems to Overcome Scaled CMOS Reliability Challenges.	DATE	2008	DBLP DOI BibTeX RDF
25	Ming Zhang 0017, T. M. Mak, James W. Tschanz, Kee Sup Kim, Norbert Seifert, Davia Lu	Design for Resilience to Soft Errors and Variations.	IOLTS	2007	DBLP DOI BibTeX RDF
25	T. M. Mak, Subhasish Mitra	Should Logic SER be Solved at the Circuit Level?	IOLTS	2006	DBLP DOI BibTeX RDF