Search results for "EXTEST"

Found 11 publication records. Showing 11 according to the selection in the facets

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
76	Irith Pomeranz, Sudhakar M. Reddy	EXTEST: a method to extend test sequences of synchronous sequential circuits to increase the fault coverage.	VTS	1997	DBLP DOI BibTeX RDF	EXTEST, test generation procedure, logic testing, fault coverage, synchronous sequential circuits, test sequences
47	Chen Fu, Barbara G. Ryder	Navigating error recovery code in Java applications.	eTX	2005	DBLP DOI BibTeX RDF
40	Ran Wang 0002, Guoliang Li 0004, Rui Li 0084, Jun Qian, Krishnendu Chakrabarty	ExTest Scheduling and Optimization for 2.5-D SoCs With Wrapped Tiles.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2017	DBLP DOI BibTeX RDF
40	Ran Wang 0002, Guoliang Li 0004, Rui Li 0084, Jun Qian, Krishnendu Chakrabarty	ExTest scheduling for 2.5D system-on-chip integrated circuits.	VTS	2015	DBLP DOI BibTeX RDF
23	Erik Jan Marinissen, Bart Vermeulen, Henk D. L. Hollmann, Ben Bennetts	Minimizing Pattern Count for Interconnect Test under a Ground Bounce Constraint.	IEEE Des. Test Comput.	2003	DBLP DOI BibTeX RDF
23	Suzette Vandivier, Mark Wahl, Jeff Rearick	First IC Validation of IEEE Std. 1149.6.	ITC	2003	DBLP DOI BibTeX RDF	1149.6, test receiver
23	Dave Stang, Ramaswami Dandapani	An Implementation of IEEE 1149.1 to Avoid Timing Violations and Other Practical In-Compliance Improvements.	ITC	2002	DBLP DOI BibTeX RDF
23	Jin-Hua Hong, Chung-Hung Tsai, Cheng-Wen Wu	Hierarchical system test by an IEEE 1149.5 MTM-bus slave-module interface core.	IEEE Trans. Very Large Scale Integr. Syst.	2000	DBLP DOI BibTeX RDF
23	Sungju Park, Taehyung Kim	A New IEEE 1149.1 Boundary Scan Design for the Detection of Delay Defects.	DATE	2000	DBLP DOI BibTeX RDF
23	Kanad Chakraborty, Pinaki Mazumder	A programmable boundary scan technique for board-level, parallel functional duplex march testing of word-oriented multiport static RAMs.	ED&TC	1997	DBLP DOI BibTeX RDF
23	Jin-Hua Hong, Chung-Hung Tsai, Cheng-Wen Wu	Hierarchical Testing Using the IEEE Std 1149.5 Module Test and Maintenance Slave Interface Module.	Asian Test Symposium	1996	DBLP DOI BibTeX RDF	MTM Bus, Boundary Scan, Hierarchical Testing

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