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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 3 occurrences of 3 keywords
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Results
Found 4 publication records. Showing 3 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
102 | Franz X. Ruckerbauer, Georg Georgakos |
Soft Error Rates in 65nm SRAMs--Analysis of new Phenomena. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece, pp. 203-204, 2007, IEEE Computer Society, 0-7695-2918-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
NSER, ASER, multi-bit upset, soft errors and radiation, CMOS, SRAM, SEU |
51 | Khairia Belghet, Amer Zraig, Nser Azroug |
Performance comparison of class E RF power amplifier with different load netwok configuration. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CCECE ![In: Proceedings of the 24th Canadian Conference on Electrical and Computer Engineering, CCECE 2011, Niagara Falls, Ontario, Canada, 8-11 May, 2011, pp. 219-222, 2011, IEEE, 978-1-4244-9788-1. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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46 | Min Zhang, Xuanqin Mou, Lei Zhang 0006 |
Non-Shift Edge Based Ratio (NSER): An Image Quality Assessment Metric Based on Early Vision Features. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Signal Process. Lett. ![In: IEEE Signal Process. Lett. 18(5), pp. 315-318, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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