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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 2 occurrences of 2 keywords
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Results
Found 4 publication records. Showing 4 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
96 | J. Bruce Millar, Peter Gillingham |
Two High-Bandwidth Memory Bus Structures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 16(1), pp. 42-52, 1999. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
SLDRAM, Direct Rambus, DRAM, memory design |
42 | Yasunobu Nakase, Yoshikazu Morooka, David J. Perlman, Daniel J. Kolor, Jae-Myoung Choi, Hyun J. Shin, Tsutomu Yoshimura, Naoya Watanabe, Yoshio Matsuda, Masaki Kumanoya, Michihiro Yamada |
Source-synchronization and timing vernier techniques for 1.2-GB/s SLDRAM interface. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE J. Solid State Circuits ![In: IEEE J. Solid State Circuits 34(4), pp. 494-501, 1999. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
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42 | Peter Gillingham, Bill Vogley |
SLDRAM: high-performance, open-standard memory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Micro ![In: IEEE Micro 17(6), pp. 29-39, 1997. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
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30 | Jim Anderson |
Integrated probe card/interface solutions for specific test applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998, pp. 282-283, 1998, IEEE Computer Society, 0-7803-5093-6. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
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