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Searching for WrenTR with no syntactic query expansion in all metadata.

Publication years (Num. hits)
1995 (1)
Publication types (Num. hits)
inproceedings(1)
Venues (Conferences, Journals, ...)
VLSI Design(1)
Authors
Jitendra Khare(1) Pranab K. Nag(1) Rob A. Rutenbar(1) Sujoy Mitra(1) U. Maly(1)
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Found 1 publication records. Showing 1 according to the selection in the facets
Hits ?▲ Authors Title Venue Year Link Author keywords
36Jitendra Khare, Sujoy Mitra, Pranab K. Nag, U. Maly, Rob A. Rutenbar Testability-oriented channel routing. Search on Bibsonomy VLSI Design The full citation details ... 1995 DBLP  DOI  BibTeX  RDF IC testing quality, testability-oriented channel routing, IC layout modification, test escape probability, iterative channel routing tool, fault undetectability, WrenTR, fault diagnosis, integrated circuit testing, design for testability, fault detectability, network routing, circuit layout CAD, bridging fault, circuit optimisation, integrated circuit layout, design strategies, yield loss, integrated circuit yield
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