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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 6 occurrences of 5 keywords
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Results
Found 10 publication records. Showing 10 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
99 | Ajoy Kumar Palit, Kishore K. Duganapalli, Walter Anheier |
Influence of Resistive Bridging Fault on Crosstalk Coupling Effects in On-Chip Aggressor-Victim Interconnects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA, pp. 336-344, 2006, IEEE Computer Society, 0-7695-2706-X. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
defective interconnects, defect’s severity, fault model, crosstalk, bridging fault |
53 | Ajoy Kumar Palit, Lei Wu, Kishore K. Duganapalli, Walter Anheier, Jürgen Schlöffel |
A New, Flexible and Very Accurate Crosstalk Fault Model to Analyze the Effects of Coupling Noise between the Interconnects on Signal Integrity Losses in Deep Submicron Chips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India, pp. 22-27, 2005, IEEE Computer Society, 0-7695-2481-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
crosstalk model, aggressor-victim, ABCD-model, crosstalk-hazards, signal integrity |
46 | Pascal Raiola, Dominik Erb, Sudhakar M. Reddy, Bernd Becker 0001 |
Accurate Diagnosis of Interconnect Open Defects Based on the Robust Enhanced Aggressor Victim Model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSID ![In: 30th International Conference on VLSI Design and 16th International Conference on Embedded Systems, VLSID 2017, Hyderabad, India, January 7-11, 2017, pp. 135-140, 2017, IEEE Computer Society, 978-1-5090-5740-5. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
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46 | Ravikishore Gandikota, Li Ding 0002, Peivand Tehrani, David T. Blaauw |
Worst-case aggressor-victim alignment with current-source driver models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 46th Design Automation Conference, DAC 2009, San Francisco, CA, USA, July 26-31, 2009, pp. 13-18, 2009, ACM, 978-1-60558-497-3. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
CSM, delay noise, crosstalk |
46 | Stefan Hillebrecht, Ilia Polian, Piet Engelke, Bernd Becker 0001, Martin Keim, Wu-Tung Cheng |
Extraction, Simulation and Test Generation for Interconnect Open Defects Based on Enhanced Aggressor-Victim Model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008, pp. 1-10, 2008, IEEE Computer Society, 978-1-4244-2403-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
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38 | Stefan Spinner, Ilia Polian, Piet Engelke, Bernd Becker 0001, Martin Keim, Wu-Tung Cheng |
Automatic Test Pattern Generation for Interconnect Open Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA, pp. 181-186, 2008, IEEE Computer Society, 978-0-7695-3123-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Interconnect opens, Open-via defects, ATPG |
34 | Ajoy Kumar Palit, Kishore K. Duganapalli, Walter Anheier |
Modeling of Crosstalk Fault in Defective Interconnects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PATMOS ![In: Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation, 16th International Workshop, PATMOS 2006, Montpellier, France, September 13-15, 2006, Proceedings, pp. 340-349, 2006, Springer, 3-540-39094-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
defect-based-crosstalk fault model, signal integrity losses, aggres-sor-victim, ABCD-model, crosstalk-hazards |
24 | Ken Tseng, Mark Horowitz |
False coupling exploration in timing analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(11), pp. 1795-1805, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
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24 | Marong Phadoongsidhi, Kewal K. Saluja |
Static Timing Analysis of Irreversible Crosstalk Noise Pulse Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 17th International Conference on VLSI Design (VLSI Design 2004), with the 3rd International Conference on Embedded Systems Design, 5-9 January 2004, Mumbai, India, pp. 437-442, 2004, IEEE Computer Society, 0-7695-2072-3. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
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24 | Michael A. Margolese, F. Joel Ferguson |
Using Temporal Constraints for Eliminating Crosstalk Candidates for Design and Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 17th IEEE VLSI Test Symposium (VTS '99), 25-30 April 1999, San Diego, CA, USA, pp. 80-85, 1999, IEEE Computer Society, 0-7695-0146-X. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
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