Search results for "broadside"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
156	Irith Pomeranz, Sudhakar M. Reddy	Synthesis for Broadside Testability of Transition Faults.	VTS	2008	DBLP DOI BibTeX RDF	broadside tests, standard scan, transition faults, test synthesis, full-scan circuits
129	Hangkyu Lee, Irith Pomeranz, Sudhakar M. Reddy	On Complete Functional Broadside Tests for Transition Faults.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2008	DBLP DOI BibTeX RDF
111	Irith Pomeranz, Sudhakar M. Reddy	Improving the Transition Fault Coverage of Functional Broadside Tests by Observation Point Insertion.	IEEE Trans. Very Large Scale Integr. Syst.	2008	DBLP DOI BibTeX RDF
111	Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara	A New Test Generation Model for Broadside Transition Testing of Partial Scan Circuits.	VLSI-SoC	2006	DBLP DOI BibTeX RDF
75	Irith Pomeranz, Sudhakar M. Reddy	Functional Broadside Tests with Different Levels of Reachability.	VLSI Design	2007	DBLP DOI BibTeX RDF
75	Chao-Hsing Hsu, Wen-Jye Shyr	Optimizing Linear Adaptive Broadside Array Antenna by Amplitude-Position Perturbations Using Memetic Algorithms.	KES (1)	2005	DBLP DOI BibTeX RDF
72	Irith Pomeranz, Sudhakar M. Reddy	Scan-Based Delay Fault Tests for Diagnosis of Transition Faults.	DFT	2006	DBLP DOI BibTeX RDF
66	Bo Yao, Irith Pomeranz, Sudhakar M. Reddy	Deterministic broadside test generation for transition path delay faults.	ACM Great Lakes Symposium on VLSI	2010	DBLP DOI BibTeX RDF	broadside test, deterministic test generation, path delay fault, transition fault
66	Irith Pomeranz, Sudhakar M. Reddy	Expanded Definition of Functional Operation Conditions and its Effects on the Computation of Functional Broadside Tests.	VTS	2008	DBLP DOI BibTeX RDF	functional broadside tests, test generation, transition faults, reachable states, full-scan circuits
58	Irith Pomeranz, Sudhakar M. Reddy, Sandip Kundu	On Common-Mode Skewed-Load and Broadside Tests.	VLSI Design	2008	DBLP DOI BibTeX RDF
58	Qiang Xu 0001, Nicola Nicolici	DFT Infrastructure for Broadside Two-Pattern Test of Core-Based SOCs.	IEEE Trans. Computers	2006	DBLP DOI BibTeX RDF	embedded core delay test, System-on-a-chip
58	Xiao Liu 0010, Michael S. Hsiao	Constrained ATPG for Broadside Transition Testing.	DFT	2003	DBLP DOI BibTeX RDF
54	Zhen Chen, Boxue Yin, Dong Xiang	Conflict driven scan chain configuration for high transition fault coverage and low test power.	ASP-DAC	2009	DBLP DOI BibTeX RDF
48	Irith Pomeranz	On Transition Fault Diagnosis Using Multicycle At-Speed Broadside Tests.	ETS	2011	DBLP DOI BibTeX RDF	Broadside tests, multicycle tests, fault diagnosis, transition faults
45	N. E. Doren, Charles V. Jakowatz Jr., Daniel E. Wahl, Paul A. Thompson	General Formulation for Wavefront Curvature Correction in Polar-Formatted Spotlight-Mode SAR Images Using Space-Variant Post-Filtering.	ICIP (1)	1997	DBLP DOI BibTeX RDF	wavefront curvature correction, polar-formatted spotlight-mode SAR images, space-variant post-filtering, polar-formatting algorithm, image domain space-variant filter, SAR collection modes, close range imaging, low center frequency, squinted collection mode, broadside modes, squint-mode images, range migration technique, seismic migration, frequency domain replication, computer simulation results, space-variant restoration, algorithms, synthetic aperture radar, post-processing
43	Irith Pomeranz	Using piecewise-functional broadside tests for functional broadside test compaction.	VTS	2017	DBLP DOI BibTeX RDF
43	Irith Pomeranz	Transition Fault Simulation Considering Broadside Tests as Partially-Functional Broadside Tests.	IEEE Trans. Very Large Scale Integr. Syst.	2013	DBLP DOI BibTeX RDF
43	Irith Pomeranz, Sudhakar M. Reddy	Broadside and Functional Broadside Tests for Partial-Scan Circuits.	IEEE Trans. Very Large Scale Integr. Syst.	2011	DBLP DOI BibTeX RDF
43	Charlotte Becker, Shannon Meyer	Extending the Life of the Broadside Ballad: The English Broadside Ballad Archive from Microfilm to Color Photography.	DH	2011	DBLP BibTeX RDF
40	Irith Pomeranz, Sudhakar M. Reddy	Functional Broadside Tests Under an Expanded Definition of Functional Operation Conditions.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2009	DBLP DOI BibTeX RDF
40	Ho Fai Ko, Nicola Nicolici	Automated Scan Chain Division for Reducing Shift and Capture Power During Broadside At-Speed Test.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2008	DBLP DOI BibTeX RDF
40	Matteo Pardini, Fabrizio Lombardini, Fulvio Gini	The Hybrid Cramér-Rao Bound on Broadside DOA Estimation of Extended Sources in Presence of Array Errors.	IEEE Trans. Signal Process.	2008	DBLP DOI BibTeX RDF
40	Irith Pomeranz, Sudhakar M. Reddy	Generation of Functional Broadside Tests for Transition Faults.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2006	DBLP DOI BibTeX RDF
36	Irith Pomeranz, Sudhakar M. Reddy	Scan-Based Delay Test Types and Their Effect on Power Dissipation During Test.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2008	DBLP DOI BibTeX RDF
36	Irith Pomeranz, Sudhakar M. Reddy	Test compaction for transition faults under transparent-scan.	DATE	2006	DBLP DOI BibTeX RDF
36	Narendra Devta-Prasanna, Sudhakar M. Reddy, Arun Gunda, P. Krishnamurthy, Irith Pomeranz	Improved Delay Fault Coverage Using Subsets of Flip-flops to Launch Transitions.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF
27	Irith Pomeranz, Sudhakar M. Reddy	State persistence: a property for guiding test generation.	ACM Great Lakes Symposium on VLSI	2009	DBLP DOI BibTeX RDF	broadside tests, test generation, transition faults, scan-based tests
27	Seongmoon Wang, Wenlong Wei	Low Overhead Partial Enhanced Scan Technique for Compact and High Fault Coverage Transition Delay Test Patterns.	ETS	2008	DBLP DOI BibTeX RDF	Transition delay fault, broadside, skewed-load, enhanced scan
22	Jean Temga, Takashi Shiba, Noriharu Suematsu	A Compact Broadside Coupled Stripline 2-D Beamforming Network and Its Application to a 2-D Beam Scanning Array Antenna Using Panasonic Megtron 6 Substrate.	Sensors	2024	DBLP DOI BibTeX RDF
22	Muhammad Nasir, Adnan Iftikhar, Syed Muzahir Abbas, Rashid Saleem 0001, Muhammad Farhan Shafique, Moath Alathbah	A Wideband Broadside Coupled Yagi Antenna and Arrays System for Ku Band Applications.	IEEE Access	2023	DBLP DOI BibTeX RDF
22	Jean Temga, Tomoyuki Furuichi, Takashi Shiba, Noriharu Suematsu	A 2-D Beam Scanning Array Antenna Fed by a Compact 16-Way 2-D Beamforming Network in Broadside Coupled Stripline.	IEICE Trans. Commun.	2023	DBLP DOI BibTeX RDF
22	Yuhui Deng, Guang-Cai Sun, Liang Han, Yuqi Wang, Yu Zhang, Mengdao Xing	2-D Wavenumber Domain Autofocusing for High-Resolution Highly Squinted SAR Imaging Based on Equivalent Broadside Model.	IEEE Trans. Geosci. Remote. Sens.	2023	DBLP DOI BibTeX RDF
22	Kourosh Parsaei, Rasool Keshavarz, Rashid Mirzavand, Negin Shariati	Compact Pixelated Microstrip Forward Broadside Coupler Using Binary Particle Swarm Optimization.	IEEE Trans. Circuits Syst. I Regul. Pap.	2023	DBLP DOI BibTeX RDF
22	Kai Da Xu 0001, Yiqun Liu 0011	Millimeter-Wave On-Chip Bandpass Filter Using Complementary-Broadside-Coupled Structure.	IEEE Trans. Circuits Syst. II Express Briefs	2023	DBLP DOI BibTeX RDF
22	Harbinder Singh 0001, Simrandeep Singh, Amit Gupta	Real-time linear antenna array synthesis of broadside pattern using improved dwarf mongoose optimization algorithm.	Telecommun. Syst.	2023	DBLP DOI BibTeX RDF
22	Kola Thirupathaiah, Montasir Qasymeh, A. Ramakrishna	Nanoplasmonic Broadband Filters Using Broadside Edge Coupled Coplanar Waveguide.	ITNAC	2023	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Compact Set of Functional Broadside Tests with Fault Detection on Primary Outputs.	VTS	2023	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Compaction of Functional Broadside Tests for Path Delay Faults Using Clusters of Propagation Lines.	ITC	2023	DBLP DOI BibTeX RDF
22	Yankai Zhang, Jiayi Mao, Yefeng Cai, Chao Ye, Qiaoxi Zhu	Broadband Frequency-Invariant Broadside Beamforming with a Differential Loudspeaker Array.	EUSIPCO	2023	DBLP DOI BibTeX RDF
22	Linping Feng, Jine Chen, Xinhua Yu, Lei Zhu 0009, Haiwen Liu	A Novel Wideband 90° Filtering Phase Shifter Using Broadside-Coupled MSLs.	IEEE Trans. Circuits Syst. II Express Briefs	2022	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Partitioning Functional Test Sequences Into Multicycle Functional Broadside Tests.	IEEE Trans. Very Large Scale Integr. Syst.	2021	DBLP DOI BibTeX RDF
22	Irith Pomeranz, Xijiang Lin	Single Test Type to Replace Broadside and Skewed-Load Tests for Transition Faults.	IEEE Trans. Very Large Scale Integr. Syst.	2021	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Covering Test Holes of Functional Broadside Tests.	ACM Trans. Design Autom. Electr. Syst.	2021	DBLP DOI BibTeX RDF
22	Pedram Sohrabi, Pejman Rezaei, Sina Kiani, Mina Fakhr	A symmetrical SIW-based leaky-wave antenna with continuous beam scanning from backward-to-forward through broadside.	Wirel. Networks	2021	DBLP DOI BibTeX RDF
22	Irith Pomeranz	LFSR-based generation of boundary-functional broadside tests.	IET Comput. Digit. Tech.	2020	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Broadside Tests for Transition and Stuck-At Faults.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2020	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Direct Computation of LFSR-Based Stored Tests for Broadside and Skewed-Load Tests.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2020	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Multicycle Broadside and Skewed-Load Tests for Test Compaction.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2020	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Reverse Low-Power Broadside Tests.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2020	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Functional Broadside Tests Under Broadcast Scan.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2020	DBLP DOI BibTeX RDF
22	Julian Potschka, Julian Zuber, Katharina Kolb, Tim Maiwald, Marco Dietz, Amelie Hagelauer, Klaus Aufinger, Robert Weigel	A Switchable, Passively Tuneable 28 GHz to 39 GHz Upconversion Link for a 5G Repeater using a Broadside Coupler and Analog Predistortion in a 130 nm BiCMOS Technology.	NEWCAS	2020	DBLP DOI BibTeX RDF
22	Allan Pen, Marc Le Roy, Raafat Lababidi, Denis Le Jeune, André Pérennec, Jean-Luc Issler, Kevin Elis, Adrien Gay, Jean-Hervé Corre	Broadside FD Antenna Topologies for Nanosat Intersatellite Link.	NEWCAS	2020	DBLP DOI BibTeX RDF
22	Sagiru Gaya, Oludayo Sokunbi, Sharif Iqbal Mitu Sheikh, Hussein Attia	Monopole Antenna with Beam Scanning in Both End-fire and Broadside Directions.	RWS	2020	DBLP DOI BibTeX RDF
22	Peh Tee Howe, Nor Muzlifah Mahyuddin, José M. de la Rosa	Analysis of Parasitic Effects on Capacitor-Loaded Broadside-Coupled Split-Ring Resonator RF Filters.	ISCAS	2020	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Storage Based Built-In Test Pattern Generation Method for Close-to-Functional Broadside Tests.	IOLTS	2020	DBLP DOI BibTeX RDF
22	Basim Shanyour, Spyros Tragoudas	Broadside ATPG for Low Power Trojans Detection using Built-in Current Sensors.	IOLTS	2020	DBLP DOI BibTeX RDF
22	Davide Comite, Symon K. Podilchak, Paolo Baccarelli, Paolo Burghignoli, Alessandro Galli, Alois P. Freundorfer, Yahia M. M. Antar	Design of a Polarization-Diverse Planar Leaky-Wave Antenna for Broadside Radiation.	IEEE Access	2019	DBLP DOI BibTeX RDF
22	Yunjie Geng, Junhong Wang, Zheng Li 0009, Yujian Li, Meie Chen, Zhan Zhang	Dual-Beam and Tri-Band SIW Leaky-Wave Antenna With Wide Beam Scanning Range Including Broadside Direction.	IEEE Access	2019	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Padding of Multicycle Broadside and Skewed-Load Tests.	IEEE Trans. Very Large Scale Integr. Syst.	2019	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Extracting a Close-to-Minimum Multicycle Functional Broadside Test Set From a Functional Test Sequence.	IEEE Trans. Very Large Scale Integr. Syst.	2019	DBLP DOI BibTeX RDF
22	Shaofang Gong, Xin Xu, Magnus Karlsson 0003	Broadside-Coupled Microstrip Lines as Low Loss Metamaterial for Microwave Circuit Design.	Wirel. Commun. Mob. Comput.	2019	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Boundary-Functional Broadside and Skewed-Load Tests.	ACM Trans. Design Autom. Electr. Syst.	2019	DBLP DOI BibTeX RDF
22	Xuexia Yang, Naida Zhu, Ningjie Xie, Meng Hou, Steven Gao	Broadband Dual-Polarized Phased Array with Broadside and Endfire Radiation for 5G Millimeter Wave Communications.	ComComAP	2019	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Compaction of a Functional Broadside Test Set through the Compaction of a Functional Test Sequence without Sequential Fault Simulation.	ITC	2019	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Static test compaction procedure for large pools of multicycle functional broadside tests.	IET Comput. Digit. Tech.	2018	DBLP DOI BibTeX RDF
22	Irith Pomeranz	On-chip generation of primary input sequences for multicycle functional broadside tests.	IET Comput. Digit. Tech.	2018	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Partially Invariant Patterns for LFSR-Based Generation of Close-to-Functional Broadside Tests.	ACM Trans. Design Autom. Electr. Syst.	2018	DBLP DOI BibTeX RDF
22	Zhang Ju Hou, Yang Yang 0034, Leung Chiu, Xi Zhu 0001, Eryk Dutkiewicz, John C. Vardaxoglou, Quan Xue	A W-Band Balanced Power Amplifier Using Broadside Coupled Strip-Line Coupler in SiGe BiCMOS 0.13-µm Technology.	IEEE Trans. Circuits Syst. I Regul. Pap.	2018	DBLP DOI BibTeX RDF
22	Rakesh Chowdhury, Naveen Mishra, Mohammed Muzammil Sani, Raghvendra Kumar Chaudhary	Analysis of a Wideband Circularly Polarized Cylindrical Dielectric Resonator Antenna With Broadside Radiation Coupled With Simple Microstrip Feeding.	IEEE Access	2017	DBLP DOI BibTeX RDF
22	Hiroshi Iwata, Nanami Katayama, Ken-ichi Yamaguchi	Formal Verification-Based Redundancy Identification of Transition Faults with Broadside Scan Tests.	IEICE Trans. Inf. Syst.	2017	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Close-to-Functional Broadside Tests With a Safety Margin.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2017	DBLP DOI BibTeX RDF
22	Naixing Wang, Bo Yao, Xijiang Lin, Irith Pomeranz	Functional Broadside Test Generation Using a Commercial ATPG Tool.	ISVLSI	2017	DBLP DOI BibTeX RDF
22	David Alan Garren	Effects of speed difference on accelerating target imagery signatures for broadside SAR.	IGARSS	2017	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Combined input test data volume reduction for mixed broadside and skewed-load test sets.	IET Comput. Digit. Tech.	2016	DBLP DOI BibTeX RDF
22	Irith Pomeranz	LFSR-Based Generation of Partially-Functional Broadside Tests.	IEEE Trans. Computers	2016	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Design-for-Testability for Functional Broadside Tests under Primary Input Constraints.	ACM Trans. Design Autom. Electr. Syst.	2016	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Periodic Scan-In States to Reduce the Input Test Data Volume for Partially Functional Broadside Tests.	ACM Trans. Design Autom. Electr. Syst.	2016	DBLP DOI BibTeX RDF
22	Richard W. Ziolkowski	Low Profile, Broadside Radiating, Electrically Small Huygens Source Antennas.	IEEE Access	2015	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Skewed-Load Test Cubes Based on Functional Broadside Tests for a Low-Power Test Set.	IEEE Trans. Very Large Scale Integr. Syst.	2015	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Piecewise-Functional Broadside Tests Based on Reachable States.	IEEE Trans. Computers	2015	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Enhanced Test Compaction for Multicycle Broadside Tests by Using State Complementation.	ACM Trans. Design Autom. Electr. Syst.	2015	DBLP DOI BibTeX RDF
22	Keun-Kwan Ryu, Sung-Chan Kim	Push-Push Voltage Controlled Dielectric Resonator Oscillator Using a Broadside Coupler.	J. Inform. and Commun. Convergence Engineering	2015	DBLP DOI BibTeX RDF
22	Yiran Cui, Long Jin, Zhengheng Zhang, Lei Li	Novel design of substrate integrated waveguide filter employing broadside-coupled complementary split ring resonators.	IEICE Electron. Express	2015	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Piecewise-functional broadside tests based on intersections of reachable states.	DFTS	2015	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Generation of close-to-functional broadside tests with equal primary input vectors.	DAC	2015	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Low-Power Test Generation by Merging of Functional Broadside Test Cubes.	IEEE Trans. Very Large Scale Integr. Syst.	2014	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Low-Power Diagnostic Test Sets for Transition Faults Based on Functional Broadside Tests.	IEEE Trans. Very Large Scale Integr. Syst.	2014	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Multi-cycle broadside tests with runs of constant primary input vectors.	IET Comput. Digit. Tech.	2014	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Sharing Logic for Built-In Generationof Functional Broadside Tests.	IEEE Trans. Computers	2014	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Functional Broadside Tests for Multistep Defect Diagnosis.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2014	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Simultaneous Generation of Functional and Low-Power Non-Functional Broadside Tests.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2014	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Low-power skewed-load tests based on functional broadside tests.	ACM Trans. Design Autom. Electr. Syst.	2014	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Design-for-testability for multi-cycle broadside tests by holding of state variables.	ACM Trans. Design Autom. Electr. Syst.	2014	DBLP DOI BibTeX RDF
22	Bo Yao, Irith Pomeranz, Srikanth Venkataraman, M. Enamul Amyeen	Built-in generation of functional broadside tests considering primary input constraints.	ACM Great Lakes Symposium on VLSI	2014	DBLP DOI BibTeX RDF
22	Irith Pomeranz	On the use of multi-cycle tests for storage of two-cycle broadside tests.	VTS	2014	DBLP DOI BibTeX RDF
22	Hassiba Louazene, M'Hamed Boulakroune, Mouloud Challal	The Broadside-coupled Microstrip Structure using Open Loop Resonator DGS.	ISNCC	2014	DBLP DOI BibTeX RDF
22	Manuel J. Freire, Marcos A. Lopez, Florian Meise, Jose M. Algarin, Peter M. Jakob, Michael Bock, Ricardo Marqués	A Broadside-Split-Ring Resonator-Based Coil for MRI at 7 T.	IEEE Trans. Medical Imaging	2013	DBLP DOI BibTeX RDF
22	Geliang Yang, Zhigong Wang, Zhiqun Li, Qin Li, Fa-en Liu, Zhu Li	Ka-band ultra low voltage miniature sub-harmonic resistive mixer with a new broadside coupled Marchand balun in 0.18-μm CMOS technology.	J. Zhejiang Univ. Sci. C	2013	DBLP DOI BibTeX RDF
22	Irith Pomeranz	On Test Compaction of Broadside and Skewed-Load Test Cubes.	IEEE Trans. Very Large Scale Integr. Syst.	2013	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Broadside and Skewed-Load Tests Under Primary Input Constraints.	IEEE Trans. Very Large Scale Integr. Syst.	2013	DBLP DOI BibTeX RDF