Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
156 | Irith Pomeranz, Sudhakar M. Reddy |
Synthesis for Broadside Testability of Transition Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA, pp. 221-226, 2008, IEEE Computer Society, 978-0-7695-3123-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
broadside tests, standard scan, transition faults, test synthesis, full-scan circuits |
129 | Hangkyu Lee, Irith Pomeranz, Sudhakar M. Reddy |
On Complete Functional Broadside Tests for Transition Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(3), pp. 583-587, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
111 | Irith Pomeranz, Sudhakar M. Reddy |
Improving the Transition Fault Coverage of Functional Broadside Tests by Observation Point Insertion. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 16(7), pp. 931-936, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
111 | Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara |
A New Test Generation Model for Broadside Transition Testing of Partial Scan Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI-SoC ![In: IFIP VLSI-SoC 2006, IFIP WG 10.5 International Conference on Very Large Scale Integration of System-on-Chip, Nice, France, 16-18 October 2006, pp. 308-313, 2006, IEEE. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
75 | Irith Pomeranz, Sudhakar M. Reddy |
Functional Broadside Tests with Different Levels of Reachability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India, pp. 799-804, 2007, IEEE Computer Society, 0-7695-2762-0. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
75 | Chao-Hsing Hsu, Wen-Jye Shyr |
Optimizing Linear Adaptive Broadside Array Antenna by Amplitude-Position Perturbations Using Memetic Algorithms. ![Search on Bibsonomy](Pics/bibsonomy.png) |
KES (1) ![In: Knowledge-Based Intelligent Information and Engineering Systems, 9th International Conference, KES 2005, Melbourne, Australia, September 14-16, 2005, Proceedings, Part I, pp. 568-574, 2005, Springer, 3-540-28894-5. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
72 | Irith Pomeranz, Sudhakar M. Reddy |
Scan-Based Delay Fault Tests for Diagnosis of Transition Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA, pp. 419-427, 2006, IEEE Computer Society, 0-7695-2706-X. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
66 | Bo Yao, Irith Pomeranz, Sudhakar M. Reddy |
Deterministic broadside test generation for transition path delay faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 20th ACM Great Lakes Symposium on VLSI 2009, Providence, Rhode Island, USA, May 16-18 2010, pp. 135-138, 2010, ACM, 978-1-4503-0012-4. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
broadside test, deterministic test generation, path delay fault, transition fault |
66 | Irith Pomeranz, Sudhakar M. Reddy |
Expanded Definition of Functional Operation Conditions and its Effects on the Computation of Functional Broadside Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA, pp. 317-322, 2008, IEEE Computer Society, 978-0-7695-3123-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
functional broadside tests, test generation, transition faults, reachable states, full-scan circuits |
58 | Irith Pomeranz, Sudhakar M. Reddy, Sandip Kundu |
On Common-Mode Skewed-Load and Broadside Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 21st International Conference on VLSI Design (VLSI Design 2008), 4-8 January 2008, Hyderabad, India, pp. 151-156, 2008, IEEE Computer Society, 0-7695-3083-4. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
58 | Qiang Xu 0001, Nicola Nicolici |
DFT Infrastructure for Broadside Two-Pattern Test of Core-Based SOCs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 55(4), pp. 470-485, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
embedded core delay test, System-on-a-chip |
58 | Xiao Liu 0010, Michael S. Hsiao |
Constrained ATPG for Broadside Transition Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings, pp. 175-, 2003, IEEE Computer Society, 0-7695-2042-1. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
54 | Zhen Chen, Boxue Yin, Dong Xiang |
Conflict driven scan chain configuration for high transition fault coverage and low test power. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASP-DAC ![In: Proceedings of the 14th Asia South Pacific Design Automation Conference, ASP-DAC 2009, Yokohama, Japan, January 19-22, 2009, pp. 666-671, 2009, IEEE, 978-1-4244-2748-2. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
48 | Irith Pomeranz |
On Transition Fault Diagnosis Using Multicycle At-Speed Broadside Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 16th European Test Symposium, ETS 2011, Trondheim, Norway, May 23-27, 2011, pp. 189-194, 2011, IEEE Computer Society, 978-0-7695-4433-5. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
Broadside tests, multicycle tests, fault diagnosis, transition faults |
45 | N. E. Doren, Charles V. Jakowatz Jr., Daniel E. Wahl, Paul A. Thompson |
General Formulation for Wavefront Curvature Correction in Polar-Formatted Spotlight-Mode SAR Images Using Space-Variant Post-Filtering. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICIP (1) ![In: Proceedings 1997 International Conference on Image Processing, ICIP '97, Santa Barbara, California, USA, October 26-29, 1997, pp. 861-864, 1997, IEEE Computer Society, 0-8186-8183-7. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
wavefront curvature correction, polar-formatted spotlight-mode SAR images, space-variant post-filtering, polar-formatting algorithm, image domain space-variant filter, SAR collection modes, close range imaging, low center frequency, squinted collection mode, broadside modes, squint-mode images, range migration technique, seismic migration, frequency domain replication, computer simulation results, space-variant restoration, algorithms, synthetic aperture radar, post-processing |
43 | Irith Pomeranz |
Using piecewise-functional broadside tests for functional broadside test compaction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 35th IEEE VLSI Test Symposium, VTS 2017, Las Vegas, NV, USA, April 9-12, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5090-4482-5. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
43 | Irith Pomeranz |
Transition Fault Simulation Considering Broadside Tests as Partially-Functional Broadside Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 21(7), pp. 1359-1363, 2013. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
43 | Irith Pomeranz, Sudhakar M. Reddy |
Broadside and Functional Broadside Tests for Partial-Scan Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 19(6), pp. 1104-1108, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
43 | Charlotte Becker, Shannon Meyer |
Extending the Life of the Broadside Ballad: The English Broadside Ballad Archive from Microfilm to Color Photography. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DH ![In: 6th Annual International Conference of the Alliance of Digital Humanities Organizations, DH 2011, Stanford, CA, USA, June 19-22, 2011, Conference Abstracts, pp. 272, 2011, Stanford University Library, 978-0-911221-47-3. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP BibTeX RDF |
|
40 | Irith Pomeranz, Sudhakar M. Reddy |
Functional Broadside Tests Under an Expanded Definition of Functional Operation Conditions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(1), pp. 121-129, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
40 | Ho Fai Ko, Nicola Nicolici |
Automated Scan Chain Division for Reducing Shift and Capture Power During Broadside At-Speed Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(11), pp. 2092-2097, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
40 | Matteo Pardini, Fabrizio Lombardini, Fulvio Gini |
The Hybrid Cramér-Rao Bound on Broadside DOA Estimation of Extended Sources in Presence of Array Errors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Signal Process. ![In: IEEE Trans. Signal Process. 56(4), pp. 1726-1730, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
40 | Irith Pomeranz, Sudhakar M. Reddy |
Generation of Functional Broadside Tests for Transition Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(10), pp. 2207-2218, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
36 | Irith Pomeranz, Sudhakar M. Reddy |
Scan-Based Delay Test Types and Their Effect on Power Dissipation During Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(2), pp. 398-403, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
36 | Irith Pomeranz, Sudhakar M. Reddy |
Test compaction for transition faults under transparent-scan. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006, pp. 1264-1269, 2006, European Design and Automation Association, Leuven, Belgium, 3-9810801-1-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
36 | Narendra Devta-Prasanna, Sudhakar M. Reddy, Arun Gunda, P. Krishnamurthy, Irith Pomeranz |
Improved Delay Fault Coverage Using Subsets of Flip-flops to Launch Transitions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India, pp. 202-207, 2005, IEEE Computer Society, 0-7695-2481-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
27 | Irith Pomeranz, Sudhakar M. Reddy |
State persistence: a property for guiding test generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 19th ACM Great Lakes Symposium on VLSI 2009, Boston Area, MA, USA, May 10-12 2009, pp. 523-528, 2009, ACM, 978-1-60558-522-2. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
broadside tests, test generation, transition faults, scan-based tests |
27 | Seongmoon Wang, Wenlong Wei |
Low Overhead Partial Enhanced Scan Technique for Compact and High Fault Coverage Transition Delay Test Patterns. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 13th European Test Symposium, ETS 2008, Verbania, Italy, May 25-29, 2008, pp. 125-130, 2008, IEEE Computer Society, 978-0-7695-3150-2. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Transition delay fault, broadside, skewed-load, enhanced scan |
22 | Jean Temga, Takashi Shiba, Noriharu Suematsu |
A Compact Broadside Coupled Stripline 2-D Beamforming Network and Its Application to a 2-D Beam Scanning Array Antenna Using Panasonic Megtron 6 Substrate. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 24(2), pp. 714, January 2024. The full citation details ...](Pics/full.jpeg) |
2024 |
DBLP DOI BibTeX RDF |
|
22 | Muhammad Nasir, Adnan Iftikhar, Syed Muzahir Abbas, Rashid Saleem 0001, Muhammad Farhan Shafique, Moath Alathbah |
A Wideband Broadside Coupled Yagi Antenna and Arrays System for Ku Band Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 11, pp. 126967-126978, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Jean Temga, Tomoyuki Furuichi, Takashi Shiba, Noriharu Suematsu |
A 2-D Beam Scanning Array Antenna Fed by a Compact 16-Way 2-D Beamforming Network in Broadside Coupled Stripline. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEICE Trans. Commun. ![In: IEICE Trans. Commun. 106(9), pp. 768-777, September 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Yuhui Deng, Guang-Cai Sun, Liang Han, Yuqi Wang, Yu Zhang, Mengdao Xing |
2-D Wavenumber Domain Autofocusing for High-Resolution Highly Squinted SAR Imaging Based on Equivalent Broadside Model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Geosci. Remote. Sens. ![In: IEEE Trans. Geosci. Remote. Sens. 61, pp. 1-15, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Kourosh Parsaei, Rasool Keshavarz, Rashid Mirzavand, Negin Shariati |
Compact Pixelated Microstrip Forward Broadside Coupler Using Binary Particle Swarm Optimization. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Circuits Syst. I Regul. Pap. ![In: IEEE Trans. Circuits Syst. I Regul. Pap. 70(12), pp. 5265-5274, December 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Kai Da Xu 0001, Yiqun Liu 0011 |
Millimeter-Wave On-Chip Bandpass Filter Using Complementary-Broadside-Coupled Structure. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Circuits Syst. II Express Briefs ![In: IEEE Trans. Circuits Syst. II Express Briefs 70(8), pp. 2829-2833, August 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Harbinder Singh 0001, Simrandeep Singh, Amit Gupta |
Real-time linear antenna array synthesis of broadside pattern using improved dwarf mongoose optimization algorithm. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Telecommun. Syst. ![In: Telecommun. Syst. 84(4), pp. 565-579, December 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Kola Thirupathaiah, Montasir Qasymeh, A. Ramakrishna |
Nanoplasmonic Broadband Filters Using Broadside Edge Coupled Coplanar Waveguide. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITNAC ![In: 33rd International Telecommunication Networks and Applications Conference, ITNAC 2023, Melbourne, Australia, November 29 - Dec. 1, 2023, pp. 124-127, 2023, IEEE, 979-8-3503-1713-8. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Compact Set of Functional Broadside Tests with Fault Detection on Primary Outputs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 41st IEEE VLSI Test Symposium, VTS 2023, San Diego, CA, USA, April 24-26, 2023, pp. 1-7, 2023, IEEE, 979-8-3503-4630-5. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Compaction of Functional Broadside Tests for Path Delay Faults Using Clusters of Propagation Lines. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 105-110, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Yankai Zhang, Jiayi Mao, Yefeng Cai, Chao Ye, Qiaoxi Zhu |
Broadband Frequency-Invariant Broadside Beamforming with a Differential Loudspeaker Array. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EUSIPCO ![In: 31st European Signal Processing Conference, EUSIPCO 2023, Helsinki, Finland, September 4-8, 2023, pp. 1728-1732, 2023, IEEE, 978-9-4645-9360-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Linping Feng, Jine Chen, Xinhua Yu, Lei Zhu 0009, Haiwen Liu |
A Novel Wideband 90° Filtering Phase Shifter Using Broadside-Coupled MSLs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Circuits Syst. II Express Briefs ![In: IEEE Trans. Circuits Syst. II Express Briefs 69(6), pp. 2742-2746, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Partitioning Functional Test Sequences Into Multicycle Functional Broadside Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 29(1), pp. 89-99, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz, Xijiang Lin |
Single Test Type to Replace Broadside and Skewed-Load Tests for Transition Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 29(2), pp. 423-433, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Covering Test Holes of Functional Broadside Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Design Autom. Electr. Syst. ![In: ACM Trans. Design Autom. Electr. Syst. 26(3), pp. 23:1-23:15, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
22 | Pedram Sohrabi, Pejman Rezaei, Sina Kiani, Mina Fakhr |
A symmetrical SIW-based leaky-wave antenna with continuous beam scanning from backward-to-forward through broadside. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Wirel. Networks ![In: Wirel. Networks 27(8), pp. 5417-5424, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
LFSR-based generation of boundary-functional broadside tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IET Comput. Digit. Tech. ![In: IET Comput. Digit. Tech. 14(2), pp. 61-68, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Broadside Tests for Transition and Stuck-At Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(8), pp. 1739-1743, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Direct Computation of LFSR-Based Stored Tests for Broadside and Skewed-Load Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(12), pp. 5238-5246, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Multicycle Broadside and Skewed-Load Tests for Test Compaction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(1), pp. 262-266, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Reverse Low-Power Broadside Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(3), pp. 742-746, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Functional Broadside Tests Under Broadcast Scan. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(10), pp. 3139-3143, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
22 | Julian Potschka, Julian Zuber, Katharina Kolb, Tim Maiwald, Marco Dietz, Amelie Hagelauer, Klaus Aufinger, Robert Weigel |
A Switchable, Passively Tuneable 28 GHz to 39 GHz Upconversion Link for a 5G Repeater using a Broadside Coupler and Analog Predistortion in a 130 nm BiCMOS Technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
NEWCAS ![In: 18th IEEE International New Circuits and Systems Conference, NEWCAS 2020, Montréal, QC, Canada, June 16-19, 2020, pp. 30-33, 2020, IEEE, 978-1-7281-7044-2. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
22 | Allan Pen, Marc Le Roy, Raafat Lababidi, Denis Le Jeune, André Pérennec, Jean-Luc Issler, Kevin Elis, Adrien Gay, Jean-Hervé Corre |
Broadside FD Antenna Topologies for Nanosat Intersatellite Link. ![Search on Bibsonomy](Pics/bibsonomy.png) |
NEWCAS ![In: 18th IEEE International New Circuits and Systems Conference, NEWCAS 2020, Montréal, QC, Canada, June 16-19, 2020, pp. 242-245, 2020, IEEE, 978-1-7281-7044-2. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
22 | Sagiru Gaya, Oludayo Sokunbi, Sharif Iqbal Mitu Sheikh, Hussein Attia |
Monopole Antenna with Beam Scanning in Both End-fire and Broadside Directions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
RWS ![In: 2020 IEEE Radio and Wireless Symposium, RWS 2020, San Antonio, TX, USA, January 26-29, 2020, pp. 265-267, 2020, IEEE, 978-1-7281-1120-9. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
22 | Peh Tee Howe, Nor Muzlifah Mahyuddin, José M. de la Rosa |
Analysis of Parasitic Effects on Capacitor-Loaded Broadside-Coupled Split-Ring Resonator RF Filters. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS ![In: IEEE International Symposium on Circuits and Systems, ISCAS 2020, Sevilla, Spain, October 10-21, 2020, pp. 1-5, 2020, IEEE, 978-1-7281-3320-1. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Storage Based Built-In Test Pattern Generation Method for Close-to-Functional Broadside Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 26th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2020, Napoli, Italy, July 13-15, 2020, pp. 1-4, 2020, IEEE, 978-1-7281-8187-5. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
22 | Basim Shanyour, Spyros Tragoudas |
Broadside ATPG for Low Power Trojans Detection using Built-in Current Sensors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 26th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2020, Napoli, Italy, July 13-15, 2020, pp. 1-3, 2020, IEEE, 978-1-7281-8187-5. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
22 | Davide Comite, Symon K. Podilchak, Paolo Baccarelli, Paolo Burghignoli, Alessandro Galli, Alois P. Freundorfer, Yahia M. M. Antar |
Design of a Polarization-Diverse Planar Leaky-Wave Antenna for Broadside Radiation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 7, pp. 28672-28683, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
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22 | Yunjie Geng, Junhong Wang, Zheng Li 0009, Yujian Li, Meie Chen, Zhan Zhang |
Dual-Beam and Tri-Band SIW Leaky-Wave Antenna With Wide Beam Scanning Range Including Broadside Direction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 7, pp. 176361-176368, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Padding of Multicycle Broadside and Skewed-Load Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 27(11), pp. 2587-2595, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Extracting a Close-to-Minimum Multicycle Functional Broadside Test Set From a Functional Test Sequence. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 27(6), pp. 1428-1437, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
22 | Shaofang Gong, Xin Xu, Magnus Karlsson 0003 |
Broadside-Coupled Microstrip Lines as Low Loss Metamaterial for Microwave Circuit Design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Wirel. Commun. Mob. Comput. ![In: Wirel. Commun. Mob. Comput. 2019, pp. 9249352:1-9249352:13, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Boundary-Functional Broadside and Skewed-Load Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Design Autom. Electr. Syst. ![In: ACM Trans. Design Autom. Electr. Syst. 24(1), pp. 7:1-7:20, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
22 | Xuexia Yang, Naida Zhu, Ningjie Xie, Meng Hou, Steven Gao |
Broadband Dual-Polarized Phased Array with Broadside and Endfire Radiation for 5G Millimeter Wave Communications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ComComAP ![In: Computing, Communications and IoT Applications, ComComAp 2019, Shenzhen, China, October 26-28, 2019, pp. 210-212, 2019, IEEE, 978-1-7281-1973-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Compaction of a Functional Broadside Test Set through the Compaction of a Functional Test Sequence without Sequential Fault Simulation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2019, Washington, DC, USA, November 9-15, 2019, pp. 1-7, 2019, IEEE, 978-1-7281-4823-6. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Static test compaction procedure for large pools of multicycle functional broadside tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IET Comput. Digit. Tech. ![In: IET Comput. Digit. Tech. 12(5), pp. 233-240, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
On-chip generation of primary input sequences for multicycle functional broadside tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IET Comput. Digit. Tech. ![In: IET Comput. Digit. Tech. 12(3), pp. 80-86, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Partially Invariant Patterns for LFSR-Based Generation of Close-to-Functional Broadside Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Design Autom. Electr. Syst. ![In: ACM Trans. Design Autom. Electr. Syst. 23(4), pp. 53:1-53:18, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
22 | Zhang Ju Hou, Yang Yang 0034, Leung Chiu, Xi Zhu 0001, Eryk Dutkiewicz, John C. Vardaxoglou, Quan Xue |
A W-Band Balanced Power Amplifier Using Broadside Coupled Strip-Line Coupler in SiGe BiCMOS 0.13-µm Technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Circuits Syst. I Regul. Pap. ![In: IEEE Trans. Circuits Syst. I Regul. Pap. 65-I(7), pp. 2139-2150, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
22 | Rakesh Chowdhury, Naveen Mishra, Mohammed Muzammil Sani, Raghvendra Kumar Chaudhary |
Analysis of a Wideband Circularly Polarized Cylindrical Dielectric Resonator Antenna With Broadside Radiation Coupled With Simple Microstrip Feeding. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 5, pp. 19478-19485, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
22 | Hiroshi Iwata, Nanami Katayama, Ken-ichi Yamaguchi |
Formal Verification-Based Redundancy Identification of Transition Faults with Broadside Scan Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEICE Trans. Inf. Syst. ![In: IEICE Trans. Inf. Syst. 100-D(6), pp. 1182-1189, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Close-to-Functional Broadside Tests With a Safety Margin. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(12), pp. 2139-2143, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
22 | Naixing Wang, Bo Yao, Xijiang Lin, Irith Pomeranz |
Functional Broadside Test Generation Using a Commercial ATPG Tool. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISVLSI ![In: 2017 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2017, Bochum, Germany, July 3-5, 2017, pp. 308-313, 2017, IEEE Computer Society, 978-1-5090-6762-6. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
22 | David Alan Garren |
Effects of speed difference on accelerating target imagery signatures for broadside SAR. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IGARSS ![In: 2017 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2017, Fort Worth, TX, USA, July 23-28, 2017, pp. 2377-2380, 2017, IEEE, 978-1-5090-4951-6. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Combined input test data volume reduction for mixed broadside and skewed-load test sets. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IET Comput. Digit. Tech. ![In: IET Comput. Digit. Tech. 10(3), pp. 138-145, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
LFSR-Based Generation of Partially-Functional Broadside Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 65(8), pp. 2659-2664, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Design-for-Testability for Functional Broadside Tests under Primary Input Constraints. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Design Autom. Electr. Syst. ![In: ACM Trans. Design Autom. Electr. Syst. 21(2), pp. 35:1-35:18, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Periodic Scan-In States to Reduce the Input Test Data Volume for Partially Functional Broadside Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Design Autom. Electr. Syst. ![In: ACM Trans. Design Autom. Electr. Syst. 22(1), pp. 7:1-7:22, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
22 | Richard W. Ziolkowski |
Low Profile, Broadside Radiating, Electrically Small Huygens Source Antennas. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 3, pp. 2644-2651, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Skewed-Load Test Cubes Based on Functional Broadside Tests for a Low-Power Test Set. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 23(3), pp. 593-597, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Piecewise-Functional Broadside Tests Based on Reachable States. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 64(8), pp. 2415-2420, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Enhanced Test Compaction for Multicycle Broadside Tests by Using State Complementation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Design Autom. Electr. Syst. ![In: ACM Trans. Design Autom. Electr. Syst. 21(1), pp. 13:1-13:20, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
22 | Keun-Kwan Ryu, Sung-Chan Kim |
Push-Push Voltage Controlled Dielectric Resonator Oscillator Using a Broadside Coupler. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Inform. and Commun. Convergence Engineering ![In: J. Inform. and Commun. Convergence Engineering 13(2), 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
22 | Yiran Cui, Long Jin, Zhengheng Zhang, Lei Li |
Novel design of substrate integrated waveguide filter employing broadside-coupled complementary split ring resonators. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEICE Electron. Express ![In: IEICE Electron. Express 12(6), pp. 20150188, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Piecewise-functional broadside tests based on intersections of reachable states. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFTS ![In: 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015, Amherst, MA, USA, October 12-14, 2015, pp. 133-138, 2015, IEEE Computer Society, 978-1-4799-8606-4. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Generation of close-to-functional broadside tests with equal primary input vectors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 52nd Annual Design Automation Conference, San Francisco, CA, USA, June 7-11, 2015, pp. 137:1-137:6, 2015, ACM, 978-1-4503-3520-1. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Low-Power Test Generation by Merging of Functional Broadside Test Cubes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 22(7), pp. 1570-1582, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Low-Power Diagnostic Test Sets for Transition Faults Based on Functional Broadside Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 22(11), pp. 2427-2431, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Multi-cycle broadside tests with runs of constant primary input vectors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IET Comput. Digit. Tech. ![In: IET Comput. Digit. Tech. 8(2), pp. 90-96, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Sharing Logic for Built-In Generationof Functional Broadside Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 63(4), pp. 1048-1054, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Functional Broadside Tests for Multistep Defect Diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(9), pp. 1429-1433, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Simultaneous Generation of Functional and Low-Power Non-Functional Broadside Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(8), pp. 1245-1257, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Low-power skewed-load tests based on functional broadside tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Design Autom. Electr. Syst. ![In: ACM Trans. Design Autom. Electr. Syst. 19(2), pp. 18:1-18:18, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Design-for-testability for multi-cycle broadside tests by holding of state variables. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Design Autom. Electr. Syst. ![In: ACM Trans. Design Autom. Electr. Syst. 19(2), pp. 19:1-19:20, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
22 | Bo Yao, Irith Pomeranz, Srikanth Venkataraman, M. Enamul Amyeen |
Built-in generation of functional broadside tests considering primary input constraints. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Great Lakes Symposium on VLSI 2014, GLSVLSI '14, Houston, TX, USA - May 21 - 23, 2014, pp. 237-238, 2014, ACM, 978-1-4503-2816-6. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
On the use of multi-cycle tests for storage of two-cycle broadside tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 32nd IEEE VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014, pp. 1-6, 2014, IEEE Computer Society, 978-1-4799-2611-4. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
22 | Hassiba Louazene, M'Hamed Boulakroune, Mouloud Challal |
The Broadside-coupled Microstrip Structure using Open Loop Resonator DGS. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISNCC ![In: The International Symposium on Networks, Computers and Communications, ISNCC 2014, Hammamet, Tunisia, June 17-19, 2014, pp. 1-4, 2014, IEEE. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
22 | Manuel J. Freire, Marcos A. Lopez, Florian Meise, Jose M. Algarin, Peter M. Jakob, Michael Bock, Ricardo Marqués |
A Broadside-Split-Ring Resonator-Based Coil for MRI at 7 T. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Medical Imaging ![In: IEEE Trans. Medical Imaging 32(6), pp. 1081-1084, 2013. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
22 | Geliang Yang, Zhigong Wang, Zhiqun Li, Qin Li, Fa-en Liu, Zhu Li |
Ka-band ultra low voltage miniature sub-harmonic resistive mixer with a new broadside coupled Marchand balun in 0.18-μm CMOS technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Zhejiang Univ. Sci. C ![In: J. Zhejiang Univ. Sci. C 14(4), pp. 288-295, 2013. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
On Test Compaction of Broadside and Skewed-Load Test Cubes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 21(9), pp. 1705-1714, 2013. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Broadside and Skewed-Load Tests Under Primary Input Constraints. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 21(4), pp. 776-780, 2013. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|