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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 8 occurrences of 4 keywords
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Results
Found 4 publication records. Showing 4 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
60 | Samir Roy, Biplab K. Sikdar, Monalisa Mukherjee, Debesh K. Das |
Degree-of-Freedom Analysis for Sequential Machines Targeting BIST Quality and Gate Area. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASP-DAC/VLSI Design ![In: Proceedings of the 7th Asia and South Pacific Design Automation Conference (ASP-DAC 2002), and the 15th International Conference on VLSI Design (VLSI Design 2002), Bangalore, India, January 7-11, 2002, pp. 671-676, 2002, IEEE Computer Society, 0-7695-1299-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
FSM synthesis, emitability, BIST, reachability, degree of freedom |
31 | Biplab K. Sikdar, Samir Roy, Debesh K. Das |
A Degree-of-Freedom Based Synthesis Scheme for Sequential Machines with Enhanced BIST Quality and Reduced Area. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 21(1), pp. 83-93, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
emitability, FSM state encoding, reachability, degree-of-freedom |
31 | Biplab K. Sikdar, Arijit Sarkar, Samir Roy, Debesh K. Das |
Synthesis of Testable Finite State Machine Through Decomposition. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India, pp. 398-403, 2005, IEEE Computer Society, 0-7695-2481-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
emitability, FSM state encoding, decomposition, reachability, degree-of-freedom |
30 | Biplab K. Sikdar, Samir Roy, Debesh K. Das |
Enhancing BIST Quality of Sequential Machines through Degree-of-Freedom Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, pp. 285-, 2001, IEEE Computer Society, 0-7695-1378-6. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
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