Search results for "fabless"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
106	Thomas Hartung, Jim Kupec, Ana Hunter, Brad Paulsen, Felicia James, Nick Yu	How will the fabless model survive?	DAC	2006	DBLP DOI BibTeX RDF	fabless, foundry, DFM, business
94	Yi-Nung Yang, Shi-Chung Chang	A contract of purchase commitments on shared yields as a risk-sharing mechanism among fabless-foundry partnership.	WSC	2008	DBLP DOI BibTeX RDF
53	Matt Nowak, Riko Radojcic	Are there economic benefits in DFM?	DAC	2005	DBLP DOI BibTeX RDF	fabless, foundries, DFM, design for manufacturability
32	Hao Shen, Lance Shen, Pierce Xu, Wu Yang, Junna Zhong	Application of Data Mining Based Scan Diagnosis Yield Analysis in a Foundry and Fabless Working Environment.	ATS	2016	DBLP DOI BibTeX RDF
32	Arwa Ben Dhia, Lirida A. B. Naviner, Philippe Matherat	Comparison of fault-tolerant fabless CLBs in SRAM-based FPGAs.	LATW	2013	DBLP DOI BibTeX RDF
32	Ping K. Ko, C. Patrick Yue	The evolution of fabless IC industry in China: Past, present, and future.	VLSI-DAT	2012	DBLP DOI BibTeX RDF
32	Wen-Min Lu, Wei-Kang Wang, Wei-Ting Tung, Fengyi Lin	Capability and efficiency of intellectual capital: The case of fabless companies in Taiwan.	Expert Syst. Appl.	2010	DBLP DOI BibTeX RDF
32	Farrokh Ayazi	Is fabless MEMS fabulous?	ISSCC	2009	DBLP DOI BibTeX RDF
32	Mei-Tai Chu, Joseph Z. Shyu, Rajiv Khosla	Measuring the relative performance for leading fabless firms by using data envelopment analysis.	J. Intell. Manuf.	2008	DBLP DOI BibTeX RDF
32	Shashank Bhonge, Vamsi Boppana	Low power chips: a fabless asic perspective.	ISLPED	2008	DBLP DOI BibTeX RDF
32	Bruce Cory	Needs fabless yield ramp foundry partnership to be most successful.	ITC	2005	DBLP DOI BibTeX RDF
32	Jia-Jane Shuai, Gwo-Hshiung Tzeng, Han-Lin Li	The multi-source fabless-foundry partnership selection model.	Int. J. Manuf. Technol. Manag.	2004	DBLP DOI BibTeX RDF
32	Louis Y. Y. Lu, Shiu-Wan Hung, Chyan Yang	Successful factors of the fabless IC industry in Taiwan.	Int. J. Manuf. Technol. Manag.	2004	DBLP DOI BibTeX RDF
32		Fabless or IDM? What the Future Holds for Both: An Interview with Cirrus Logic Chairman, Michael L. Hackworth.	IEEE Des. Test Comput.	2003	DBLP BibTeX RDF
32	Jitendra Khare	DFM - A Fabless Perspective.	ITC	2003	DBLP DOI BibTeX RDF
32	W. Terry Coston	Issues for fabless design companies moving towards deep submicron system on a chip design.	CICC	1998	DBLP DOI BibTeX RDF
21	Nagaraj Ns, Juan C. Rey, Jamil Kawa, Robert C. Aitken, Christian Lütkemeyer, Vijay Pitchumani, Andrzej J. Strojwas, Steve Trimberger	Who solves the variability problem?	DAC	2010	DBLP DOI BibTeX RDF	IC variability
21	KyungHo Kim	Best ways to use billions of devices on a wireless mobile SoC.	ASP-DAC	2008	DBLP DOI BibTeX RDF
21	Mary Lou Jepsen	CAD for displays!	ICCAD	2008	DBLP DOI BibTeX RDF
21	Jorge Guajardo, Sandeep S. Kumar, Geert Jan Schrijen, Pim Tuyls	Brand and IP protection with physical unclonable functions.	ISCAS	2008	DBLP DOI BibTeX RDF
21	Juan C. Rey, N. S. Nagaraj, Andrew B. Kahng, Fabian Klass, Rob Aitken, Cliff Hou, Luigi Capodieci, Vivek Singh	DFM in practice: hit or hype?	DAC	2008	DBLP DOI BibTeX RDF	critical area analysis, CMP, yield, DFM, OPC, lithography
21	Ruchir Puri, William H. Joyner, Shekhar Borkar, Ty Garibay, Jonathan Lotz, Robert K. Montoye	Custom is from Venus and synthesis from Mars.	DAC	2008	DBLP DOI BibTeX RDF	IC synthesis techniques, custom IC design, VLSI design
21	Wim Roelandts	Creating a Culture of Innovation.	VLSI Design	2007	DBLP DOI BibTeX RDF
21	Oh-Hyun Kwon	Perspective of the Future Semiconductor Industry: Challenges and Solutions.	DAC	2007	DBLP BibTeX RDF
21	Enrico Macii, Massoud Pedram, Dirk Friebel, Robert C. Aitken, Antun Domic, Roberto Zafalon	Low-power design tools: are EDA vendors taking this matter seriously?	DATE	2006	DBLP DOI BibTeX RDF
21	Andreas J. Strojwas, Michael Campbell, Vassilios Gerousis, Jim Hogan, John Kibarian, Marc Levitt, Walter Ng, Dipu Pramanik, Mark Templeton	When IC yield missed the target, who is at fault?	DAC	2004	DBLP DOI BibTeX RDF
21	Tohru Ihara, Jie Zhu	The general idea and usage of manufacturing knowledge data-contained differences of production culture.	AI Soc.	2003	DBLP DOI BibTeX RDF	Focused point of part drawing, Global production activities, Manufacturing knowledge data, Process planning difficulty, Production culture, Risk of manufacturing trouble
21	Michael Reinhardt, Michael Santarini	What is Design Quality? How can Quality in Electronic Design be Quantified?	ISQED	2000	DBLP DOI BibTeX RDF
21	Charles H. Ouyang, Hans T. Heineken, Jitendra Khare, Saghir A. Shaikh, Manuel d'Abreu	Maximizing Wafer Productivity Through Layout Optimization.	VLSI Design	2000	DBLP DOI BibTeX RDF	wafer productivity, die cost, interconnect cost, manufacturability, yield, design for manufacturability