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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 4 occurrences of 4 keywords
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Results
Found 5 publication records. Showing 5 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
96 | Brett Daniel, Tihomir Gvero, Darko Marinov |
On test repair using symbolic execution. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSTA ![In: Proceedings of the Nineteenth International Symposium on Software Testing and Analysis, ISSTA 2010, Trento, Italy, July 12-16, 2010, pp. 207-218, 2010, ACM, 978-1-60558-823-0. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
pex, reassert, symbolic test repair, test repair, symbolic execution |
40 | Robert White, Jens Krinke |
ReAssert: Deep Learning for Assert Generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2011.09784, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP BibTeX RDF |
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40 | Brett Daniel, Danny Dig, Tihomir Gvero, Vilas Jagannath, Johnston Jiaa, Damion Mitchell, Jurand Nogiec, Shin Hwei Tan, Darko Marinov |
ReAssert: a tool for repairing broken unit tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSE ![In: Proceedings of the 33rd International Conference on Software Engineering, ICSE 2011, Waikiki, Honolulu , HI, USA, May 21-28, 2011, pp. 1010-1012, 2011, ACM, 978-1-4503-0445-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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40 | Brett Daniel, Vilas Jagannath, Danny Dig, Darko Marinov |
ReAssert: Suggesting Repairs for Broken Unit Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASE ![In: ASE 2009, 24th IEEE/ACM International Conference on Automated Software Engineering, Auckland, New Zealand, November 16-20, 2009, pp. 433-444, 2009, IEEE Computer Society, 978-0-7695-3891-4. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
Software test maintenance, Software testing, Software maintenance, Software tools |
30 | Chauchin Su, Yue-Tsang Chen |
Intrinsic response extraction for the removal of the parasiticeffects in analog test buses. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19(4), pp. 437-445, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
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