Search results for "stuck-at-0"

Found 9 publication records. Showing 9 according to the selection in the facets

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
36	Manoj Singh Gaur, Raghavendra Narasimhan, Vijay Laxmi, Ujjwal Kumar	Structural Fault Modelling in Nano Devices.	NanoNet	2008	DBLP DOI BibTeX RDF	Structural fault, stuck-at-0, stuck-at-1, MRF, bridge, TMR
17	Baisakhi Das, Nilanjana Das, Biplab K. Sikdar	Stuck-At 0/1 Trojans on Return Address Stack.	ISED	2018	DBLP DOI BibTeX RDF
15	Irith Pomeranz, Sudhakar M. Reddy	Partitioned n-detection test generation.	ACM Great Lakes Symposium on VLSI	2009	DBLP DOI BibTeX RDF	fault partitioning, test generation, stuck-at faults, bridging faults, n-detection test sets
15	Sunil P. Khatri, Robert K. Brayton, Alberto L. Sangiovanni-Vincentelli	Sequential Multi-Valued Network Simplification using Redundancy Removal.	VLSI Design	1999	DBLP DOI BibTeX RDF
15	Kanji Hirabayashi	Self-checking CMOS circuits using pass-transistor logic.	J. Electron. Test.	1991	DBLP DOI BibTeX RDF
7	Joonhwan Yi, John P. Hayes	The Coupling Model for Function and Delay Faults.	J. Electron. Test.	2005	DBLP DOI BibTeX RDF	test generation, fault modeling, delay faults, functional faults
7	Ricardo Salem Zebulum, Didier Keymeulen, Vu Duong, Xin Guo 0002, Michael I. Ferguson, Adrian Stoica	Experimental Results in Evolutionary Fault-Recovery for Field Programmable.	Evolvable Hardware	2003	DBLP DOI BibTeX RDF
7	Stefan Gerber 0002, Michael Gössel	Detection of Permanent Hardware Faults of a Floating Point Adder by Pseudoduplication.	EDCC	1994	DBLP DOI BibTeX RDF
7	Egor S. Sogomonyan, Michael Gössel	Design of self-testing and on-line fault detection combinational circuits with weakly independent outputs.	J. Electron. Test.	1993	DBLP DOI BibTeX RDF	Concurrent error detection, self-test, self-checking circuits

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