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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 11 occurrences of 11 keywords
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Results
Found 5 publication records. Showing 5 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
36 | Manoj Singh Gaur, Raghavendra Narasimhan, Vijay Laxmi, Ujjwal Kumar |
Structural Fault Modelling in Nano Devices. ![Search on Bibsonomy](Pics/bibsonomy.png) |
NanoNet ![In: Nano-Net - Third International ICST Conference, NanoNet 2008, Boston, MA, USA, September 14-16, 2008, Revised Selected Papers, pp. 6-10, 2008, Springer, 978-3-642-02426-9. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Structural fault, stuck-at-0, stuck-at-1, MRF, bridge, TMR |
15 | Irith Pomeranz, Sudhakar M. Reddy |
Partitioned n-detection test generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 19th ACM Great Lakes Symposium on VLSI 2009, Boston Area, MA, USA, May 10-12 2009, pp. 93-98, 2009, ACM, 978-1-60558-522-2. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
fault partitioning, test generation, stuck-at faults, bridging faults, n-detection test sets |
15 | Jerzy W. Greblicki, Stanislaw J. Piestrak |
Design of Totally Self-Checking Code-Disjoint Synchronous Sequential Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EDCC ![In: Dependable Computing - EDCC-3, Third European Dependable Computing Conference, Prague, Czech Republic, September 15-17, 1999, Proceedings, pp. 251-266, 1999, Springer, 3-540-66483-1. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
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15 | Sunil P. Khatri, Robert K. Brayton, Alberto L. Sangiovanni-Vincentelli |
Sequential Multi-Valued Network Simplification using Redundancy Removal. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 12th International Conference on VLSI Design (VLSI Design 1999), 10-13 January 1999, Goa, India, pp. 206-211, 1999, IEEE Computer Society, 0-7695-0013-7. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
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15 | Irith Pomeranz, Sudhakar M. Reddy |
On n-detection test sequences for synchronous sequential circuits343. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 15th IEEE VLSI Test Symposium (VTS'97), April 27-May 1, 1997, Monterey, California, USA, pp. 336-343, 1997, IEEE Computer Society, 0-8186-7810-0. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
n-detection test sequences, stuck-at fault detection, test generation procedures, logic testing, fault simulation, synchronous sequential circuits, defect coverages |
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