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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 30 occurrences of 22 keywords
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Results
Found 17 publication records. Showing 17 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
57 | Albrecht P. Stroele |
Test response compaction using arithmetic functions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 380-386, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
arithmetic functions, combinational faults, underflow, feed back, logic testing, built-in self test, digital arithmetic, test pattern generation, adders, circuits, registers, aliasing probability, overflow, subtracters, test response compaction, arithmetic logic units |
42 | Nikos Temenos, Paul P. Sotiriadis |
Nonscaling Adders and Subtracters for Stochastic Computing Using Markov Chains. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 29(9), pp. 1612-1623, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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42 | Ankita Nandi, Chandan Kumar Jha 0001, Joycee Mekie |
Tunable Inexact Subtracters for Division in Image Processing Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MWSCAS ![In: 63rd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2020, Springfield, MA, USA, August 9-12, 2020, pp. 1100-1103, 2020, IEEE, 978-1-7281-8058-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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42 | Yuko Hara, Hiroyuki Tomiyama, Shinya Honda, Hiroaki Takada, Katsuya Ishii |
Behavioral Synthesis of Double-Precision Floating-Point Adders with Function-Level Transformations: A Case Study. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICESS ![In: Embedded Software and Systems, [Third] International Conference, ICESS 2007, Daegu, Korea, May 14-16, 2007, Proceedings, pp. 261-270, 2007, Springer, 978-3-540-72684-5. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
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42 | Oscar Gustafsson, Kenny Johansson, Håkan Johansson, Lars Wanhammar |
Implementation of Polyphase Decomposed FIR Filters for Interpolation and Decimation Using Multiple Constant Multiplication Techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
APCCAS ![In: IEEE Asia Pacific Conference on Circuits and Systems 2006, APCCAS 2006, Singapore, 4-7 December 2006, pp. 924-927, 2006, IEEE, 1-4244-0387-1. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
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42 | Trevor W. Fox, Laurence E. Turner |
The design of peak constrained least squares FIR filters with low complexity finite precision coefficients. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS (2) ![In: Proceedings of the 2001 International Symposium on Circuits and Systems, ISCAS 2001, Sydney, Australia, May 6-9, 2001, pp. 605-608, 2001, IEEE, 0-7803-6685-9. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
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42 | Albrecht P. Stroele |
BIST Pattern Generators Using Addition and Subtraction Operations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 11(1), pp. 69-80, 1997. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
built-in self-test, adder, accumulator, pattern generator, subtracter |
21 | Oscar Gustafsson |
A Difference Based Adder Graph Heuristic for Multiple Constant Multiplication Problems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS ![In: International Symposium on Circuits and Systems (ISCAS 2007), 27-20 May 2007, New Orleans, Louisiana, USA, pp. 1097-1100, 2007, IEEE, 1-4244-0920-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
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21 | A. Prasad Vinod 0001, Edmund Ming-Kit Lai |
Low power and high-speed implementation of fir filters for software defined radio receivers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Wirel. Commun. ![In: IEEE Trans. Wirel. Commun. 5(7), pp. 1669-1675, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
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21 | Håkan Johansson, Oscar Gustafsson, J. Johansson, Lars Wanhammar |
Adjustable Fractional-Delay FIR Filters Using the Farrow Structure and Multirate Techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
APCCAS ![In: IEEE Asia Pacific Conference on Circuits and Systems 2006, APCCAS 2006, Singapore, 4-7 December 2006, pp. 1055-1058, 2006, IEEE, 1-4244-0387-1. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
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21 | Keisuke Korekado, Takashi Morie, Osamu Nomura, Hiroshi Ando, Teppei Nakano, Masakazu Matsugu, Atsushi Iwata |
A Convolutional Neural Network VLSI for Image Recognition Using Merged/Mixed Analog-Digital Architecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
KES ![In: Knowledge-Based Intelligent Information and Engineering Systems, 7th International Conference, KES 2003, Oxford, UK, September 3-5, 2003, Proceedings, Part II, pp. 169-176, 2003, Springer, 3-540-40804-5. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
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21 | Mitsuru Yamada, Akinori Nishihara |
A high-speed FIR digital filter with CSD coefficients implemented on FPGA. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASP-DAC ![In: Proceedings of ASP-DAC 2001, Asia and South Pacific Design Automation Conference 2001, January 30-February 2, 2001, Yokohama, Japan, pp. 7-8, 2001, ACM, 0-7803-6634-4. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
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21 | Dimitris Bakalis, Dimitris Nikolos, Haridimos T. Vergos, Xrysovalantis Kavousianos |
On Accumulator-Based Bit-Serial Test Response Compaction Schemes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 2nd International Symposium on Quality of Electronic Design (ISQED 2001), 26-28 March 2001, San Jose, CA, USA, pp. 350-355, 2001, IEEE Computer Society, 0-7695-1025-6. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
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21 | Albrecht P. Stroele |
Synthesis for Arithmetic Built-In Self-Tes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada, pp. 165-170, 2000, IEEE Computer Society, 0-7695-0613-5. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
test configuration, built-in self-test, high-level synthesis, synthesis for testability, Accumulator |
21 | Yamin Li, Wanming Chu |
Implementation of single precision floating point square root on FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FCCM ![In: 5th IEEE Symposium on Field-Programmable Custom Computing Machines (FCCM '97), 16-18 April 1997, Napa Valley, CA, USA, pp. 226-233, 1997, IEEE Computer Society, 0-8186-8159-4. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
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21 | Albrecht P. Stroele |
Arithmetic Pattern Generators for Built-In Self-Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCD ![In: 1996 International Conference on Computer Design (ICCD '96), VLSI in Computers and Processors, October 7-9, 1996, Austin, TX, USA, Proceedings, pp. 131-134, 1996, IEEE Computer Society, 0-8186-7554-3. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
Arithmetic functions, built-in self-test, design for testability, pattern generator |
21 | Mehdi Ehsanian, Bozena Kaminska, Karim Arabi |
A new digital test approach for analog-to-digital converter testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 60-65, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
digital test approach, analog/digital converter testing, BIST circuitry, offset error, gain error, DNL, INL, area overhead reduction, medium resolution ADC, high resolution pipelined ADC, A/D converter testing, differential nonlinearity, integral nonlinearity, 1.5 micron, VLSI, built-in self test, built-in self-test, integrated circuit testing, CMOS integrated circuits, CMOS technology, analogue-digital conversion |
Displaying result #1 - #17 of 17 (100 per page; Change: )
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