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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 12 occurrences of 12 keywords
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Results
Found 1 publication records. Showing 1 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
36 | S. Lavabre, Yves Bertrand, Michel Renovell, Christian Landrault |
Test configurations to enhance the testability of sequential circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 4th Asian Test Symposium (ATS '95), November 23-24, 1995. Bangalore, India, pp. 160-168, 1995, IEEE Computer Society, 0-8186-7129-7. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
shift operation, scan register, test operation, modified flip-flops, ISCAS89 benchmarks, multiconfiguration, triconfiguration, dynamic generation, logic testing, controllability, design for testability, design for testability, sequential circuits, sequential circuits, observability, observability, DFT, fault coverage, flip-flops, minimisation, scan designs, test application time, test vector |
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