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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 15 occurrences of 13 keywords
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Results
Found 24 publication records. Showing 24 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
57 | Ian Pyle |
Quality in Software Based Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ECBS ![In: IEEE Symposium and Workshop on Engineering of Computer Based Systems (ECBS'96), March 11-15, 1996, Friedrichshafen, Germany., pp. 214-, 1996, IEEE Computer Society, 0-8186-7355-9. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
software, Quality, process, production, risk, defects, checking |
25 | Peter Middleton |
Lean Software Development: Two Case Studies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Softw. Qual. J. ![In: Softw. Qual. J. 9(4), pp. 241-252, 2001. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
lean software development, zero-defects, mistake-proofing, management, quality, productivity, organizational change, just-in-time |
24 | Jerry M. Soden, Ronald R. Fritzemeier, Charles F. Hawkins |
Zero defects or zero stuck-at faults-CMOS IC process improvement with IDDQ. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1990, Washington, D.C., USA, September 10-14, 1990, pp. 255-256, 1990, IEEE Computer Society, 0-8186-9064-X. The full citation details ...](Pics/full.jpeg) |
1990 |
DBLP DOI BibTeX RDF |
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22 | Jan Schat |
Fault Clustering in deep-submicron CMOS Processes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008, pp. 511-514, 2008, ACM, 978-3-9810801-3-1. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
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18 | Di Jin, Qing Wang, Dezhi Peng, Jiajia Wang, Bijuan Li, Yating Cheng, Nanxun Mo, Xiaoyan Deng, Ran Tao |
Development and implementation of an LIS-based validation system for autoverification toward zero defects in the automated reporting of laboratory test results. ![Search on Bibsonomy](Pics/bibsonomy.png) |
BMC Medical Informatics Decis. Mak. ![In: BMC Medical Informatics Decis. Mak. 21(1), pp. 174, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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18 | Artem A. Nazarenko, João Sarraipa, Luis M. Camarinha-Matos, Christiane Grünewald, Marc Dorchain, Ricardo Jardim-Gonçalves |
Analysis of relevant standards for industrial systems to support zero defects manufacturing process. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Ind. Inf. Integr. ![In: J. Ind. Inf. Integr. 23, pp. 100214, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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18 | Mauro Fabrizioli, Juan Pardo, Oscar Salgado, Pedro Villalba |
Modelling, Predicting, Inspecting and Supervising Product Quality for Zero Defects Manufacturing in ZDMP Project. ![Search on Bibsonomy](Pics/bibsonomy.png) |
I-ESA Workshops ![In: Proceedings of Interoperability for Enterprise Systems and Applications Workshops co-located with 10th International Conference on Interoperability for Enterprise Systems and Applications (I-ESA 2020), Tarbes, France, November 17-19, 2020., 2020, CEUR-WS.org. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP BibTeX RDF |
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18 | Stuart Campbell, Santiago Cáceres, Gerardo Pagalda, Raul Poler, Ricardo Jardim-Gonçalves |
A European Manufacturing Platform for Zero-Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
I-ESA Workshops ![In: Proceedings of Interoperability for Enterprise Systems and Applications Workshops co-located with 10th International Conference on Interoperability for Enterprise Systems and Applications (I-ESA 2020), Tarbes, France, November 17-19, 2020., 2020, CEUR-WS.org. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP BibTeX RDF |
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18 | Víctor Anaya, Daniela Kirchberger, Juan Pardo, Óscar Salgado, Francisco Fraile |
A Technical Approach to Achieve Zero Defects Manufacturing Process in the ZDMP Project. ![Search on Bibsonomy](Pics/bibsonomy.png) |
I-ESA Workshops ![In: Proceedings of Interoperability for Enterprise Systems and Applications Workshops co-located with 10th International Conference on Interoperability for Enterprise Systems and Applications (I-ESA 2020), Tarbes, France, November 17-19, 2020., 2020, CEUR-WS.org. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP BibTeX RDF |
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18 | Neng-Hui Shih, Yao-Sheng Liao, Chih-Hsiung Wang |
Determining an economic production quantity under a zero defects policy. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Oper. Res. Soc. ![In: J. Oper. Res. Soc. 69(8), pp. 1309-1317, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
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18 | Harry H. Chen |
Enhancing the efficiency and accuracy of cell-aware testing to reach zero defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI-DAT ![In: 2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017, Hsinchu, Taiwan, April 24-27, 2017, pp. 1, 2017, IEEE, 978-1-5090-3969-2. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
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18 | Vezio Malandruccolo, Mauro Ciappa, Hubert Rothleitner, Wolfgang Fichtner |
A New Built-In Defect-Based Testing Technique to Achieve Zero Defects in the Automotive Environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 27(1), pp. 19-30, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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18 | Vezio Malandruccolo, Mauro Ciappa, Hubert Rothleitner, Wolfgang Fichtner |
A new built-in screening methodology to achieve zero defects in the automotive environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 49(9-11), pp. 1334-1340, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
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18 | Fred G. Kuper |
Automotive IC reliability: Elements of the battle towards zero defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 48(8-9), pp. 1459-1463, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
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18 | Rajesh Raina |
Achieving Zero-Defects for Automotive Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008, pp. 1-10, 2008, IEEE Computer Society, 978-1-4244-2403-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
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18 | Zhichun Wang, P. Zeelen, H. Tigelaar |
Importance of multi-temp testing in automotive qualification and zero defects program. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 47(9-11), pp. 1358-1361, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
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18 | Bernd Gessner |
How to ensure zero defects from the beginning with semiconductor test methods. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007, pp. 1-2, 2007, IEEE Computer Society, 1-4244-1128-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
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18 | William J. Bellows |
Conformance to specifications, zero defects, and six sigma quality: a closer look. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Internet Enterp. Manag. ![In: Int. J. Internet Enterp. Manag. 2(1), pp. 82-95, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
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18 | Charles Ernie Love, Renkuan G. Guo, K. H. Irwin |
Acceptable quality level versus zero-defects: some empirical evidence. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Comput. Oper. Res. ![In: Comput. Oper. Res. 22(4), pp. 403-417, 1995. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
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18 | Keith Baker, Bas Verhelst |
IDDQ testing because 'zero defects isn't enough': a Philips perspective. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1990, Washington, D.C., USA, September 10-14, 1990, pp. 253-254, 1990, IEEE Computer Society, 0-8186-9064-X. The full citation details ...](Pics/full.jpeg) |
1990 |
DBLP DOI BibTeX RDF |
|
18 | Donald S. Cleverley |
The Role of Testing in Achieving Zero Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983, pp. 248-253, 1983, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1983 |
DBLP BibTeX RDF |
|
16 | Richard K. Cheng |
A False Measure of Success "I'd rather have an ounce of cure over this 200 pounds of prevention". ![Search on Bibsonomy](Pics/bibsonomy.png) |
AGILE ![In: AGILE 2005 Conference (AGILE 2005), 24-29 July 2005, Denver, CO, USA, pp. 180-184, 2005, IEEE Computer Society, 0-7695-2487-7. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
10 | Mark E. Dean |
Trends in Computing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FMCAD ![In: Formal Methods in Computer-Aided Design, Third International Conference, FMCAD 2000, Austin, Texas, USA, November 1-3, 2000, Proceedings, pp. 1-2, 2000, Springer, 3-540-41219-0. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
10 | Steven D. McEuen |
Reliability benefits of IDDQ. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 3(4), pp. 327-335, 1992. The full citation details ...](Pics/full.jpeg) |
1992 |
DBLP DOI BibTeX RDF |
reliability, I DDQ, Gate oxide shorts |
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