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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 17 occurrences of 15 keywords
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Results
Found 13 publication records. Showing 13 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
1 | Elaine J. Weyuker, Thomas J. Ostrand |
Comparing methods to identify defect reports in a change management database. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DEFECTS ![In: Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008, pp. 27-31, 2008, ACM, 978-1-60558-051-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
1 | Rudolf Ramler |
The impact of product development on the lifecycle of defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DEFECTS ![In: Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008, pp. 21-25, 2008, ACM, 978-1-60558-051-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
defect lifecycle, product development |
1 | Norihiro Yoshida, Takashi Ishio, Makoto Matsushita, Katsuro Inoue |
Retrieving similar code fragments based on identifier similarity for defect detection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DEFECTS ![In: Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008, pp. 41-42, 2008, ACM, 978-1-60558-051-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
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1 | Timea Illes-Seifert, Barbara Paech |
Exploring the relationship of history characteristics and defect count: an empirical study. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DEFECTS ![In: Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008, pp. 11-15, 2008, ACM, 978-1-60558-051-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
defect database, versioning systems, empirical study |
1 | Premkumar T. Devanbu, Brendan Murphy, Nachiappan Nagappan, Thomas Zimmermann 0001 (eds.) |
Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008 ![Search on Bibsonomy](Pics/bibsonomy.png) |
DEFECTS ![ACM, 978-1-60558-051-7 The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP BibTeX RDF |
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1 | Stefan Wagner 0001 |
Defect classification and defect types revisited. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DEFECTS ![In: Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008, pp. 39-40, 2008, ACM, 978-1-60558-051-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
defect taxonomy, defect types, faults, defects, bugs, defect classification |
1 | Yasuhiro Hayase, Yii Yong Lee, Katsuro Inoue |
A criterion for filtering code clone related bugs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DEFECTS ![In: Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008, pp. 37-38, 2008, ACM, 978-1-60558-051-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
defect mining, code clone |
1 | Chadd C. Williams, Jaime Spacco |
SZZ revisited: verifying when changes induce fixes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DEFECTS ![In: Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008, pp. 32-36, 2008, ACM, 978-1-60558-051-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
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1 | Nathaniel Ayewah, William W. Pugh |
A report on a survey and study of static analysis users. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DEFECTS ![In: Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008, pp. 1-5, 2008, ACM, 978-1-60558-051-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Java, static analysis, software quality, bugs, false positives, software defects, FindBugs, bug patterns |
1 | Yue Jiang 0001, Bojan Cukic, Tim Menzies |
Can data transformation help in the detection of fault-prone modules? ![Search on Bibsonomy](Pics/bibsonomy.png) |
DEFECTS ![In: Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008, pp. 16-20, 2008, ACM, 978-1-60558-051-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
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1 | Yoshiki Higo, Kenji Murao, Shinji Kusumoto, Katsuro Inoue |
Predicting fault-prone modules based on metrics transitions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DEFECTS ![In: Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008, pp. 6-10, 2008, ACM, 978-1-60558-051-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
1 | Min Zhang 0008, Tracy Hall, Nathan Baddoo, Paul Wernick |
Do bad smells indicate "trouble" in code? ![Search on Bibsonomy](Pics/bibsonomy.png) |
DEFECTS ![In: Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008, pp. 43-44, 2008, ACM, 978-1-60558-051-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
bad smells, open source, faults |
1 | Burak Turhan, Ayse Basar Bener, Tim Menzies |
Nearest neighbor sampling for cross company defect predictors: abstract only. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DEFECTS ![In: Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008, pp. 26, 2008, ACM, 978-1-60558-051-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
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