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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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Results
Found 115 publication records. Showing 115 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Fang Xu |
A new approach for the nonlinearity test of ADCs/DACs and its application for BIST.  |
ETW  |
1999 |
DBLP DOI BibTeX RDF |
|
| 1 | Christophe Fagot, Olivier Gascuel, Patrick Girard 0001, Christian Landrault |
On calculating efficient LFSR seeds for built-in self test. |
ETW |
1999 |
DBLP DOI BibTeX RDF |
|
| 1 | Martin Keim, Ilia Polian, Harry Hengster, Bernd Becker 0001 |
A scalable BIST architecture for delay faults. |
ETW |
1999 |
DBLP DOI BibTeX RDF |
|
| 1 | Anna Maria Brosa, Joan Figueras |
On maximizing the coverage of catastrophic and parametric faults. |
ETW |
1999 |
DBLP DOI BibTeX RDF |
|
| 1 | A. Schubert, Walter Anheier |
On random pattern testability of cryptographic VLSI cores. |
ETW |
1999 |
DBLP DOI BibTeX RDF |
|
| 1 | Gundolf Kiefer, Hans-Joachim Wunderlich |
Deterministic BIST with partial scan. |
ETW |
1999 |
DBLP DOI BibTeX RDF |
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| 1 | Erik Jan Marinissen, Maurice Lousberg |
The role of test protocols in testing embedded-core-based system ICs. |
ETW |
1999 |
DBLP DOI BibTeX RDF |
|
| 1 | Rodrigo Picos, Miquel Roca 0001, Eugeni Isern 0001, Jaume Segura 0001, Eugenio García-Moreno |
Experimental results on BIC sensors for transient current testing. |
ETW |
1999 |
DBLP DOI BibTeX RDF |
|
| 1 | Hans A. R. Manhaeve, Johan Verfaillie, B. Straka, J. P. Cornil |
Application of supply current testing to analogue circuits, towards a structural analogue test methodology. |
ETW |
1999 |
DBLP DOI BibTeX RDF |
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| 1 | Bernd Straube, Kurt Reinschke, Wolfgang Vermeiren, Klaus Röbenack, Bert Müller, Christoph Clauß |
On the fault-injection-caused increase of the DAE-index in analogue fault simulation. |
ETW |
1999 |
DBLP DOI BibTeX RDF |
|
| 1 | Salvador Manich, A. Gabarró, M. Lopez, Joan Figueras, Patrick Girard 0001, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, João Paulo Teixeira 0001, Marcelino B. Santos |
Low power BIST by filtering non-detecting vectors. |
ETW |
1999 |
DBLP DOI BibTeX RDF |
|
| 1 | Octávio Páscoa Dias, Jorge Semião, Marcelino B. Santos, Isabel Maria Cacho Teixeira, João Paulo Teixeira 0001 |
From system level to defect-oriented test: a case study. |
ETW |
1999 |
DBLP DOI BibTeX RDF |
|
| 1 | |
4th European Test Workshop, ETW 1999, Constance, Germany, May 25-28, 1999 |
ETW |
1999 |
DBLP BibTeX RDF |
|
| 1 | Alfredo Benso, Silvia Cataldo, Silvia Chiusano, Paolo Prinetto, Yervant Zorian |
A high-level EDA environment for the automatic insertion of HD-BIST structures. |
ETW |
1999 |
DBLP DOI BibTeX RDF |
|
| 1 | Abderrahim Doumar, Toshiaki Ohmameuda, Hideo Ito |
Design of an automatic testing for FPGAs. |
ETW |
1999 |
DBLP DOI BibTeX RDF |
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Displaying result #101 - #115 of 115 (100 per page; Change: ) Pages: [ <<][ 1][ 2] |
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