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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 406 occurrences of 170 keywords
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Results
Found 306 publication records. Showing 306 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
9 | Mick Tegethoff, Kenneth P. Parker |
IEEE Std 1149.1: Where Are We? Where From Here? ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 12(2), pp. 53-59, 1995. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
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9 | Nai-Chi Lee |
A hierarchical analog test bus framework for testing mixed-signal integrated circuits and printed circuit boards. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 4(4), pp. 361-368, 1993. The full citation details ...](Pics/full.jpeg) |
1993 |
DBLP DOI BibTeX RDF |
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9 | Ting-Ting Y. Lin, Huoy-Yu Liou |
A New Framework for Designing: Built-in Test Multichip Modules with Pipelined Test Strategy. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 10(4), pp. 38-51, 1993. The full citation details ...](Pics/full.jpeg) |
1993 |
DBLP DOI BibTeX RDF |
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9 | Wu-Tung Cheng, James L. Lewandowski, Eleanor Wu |
Optimal diagnostic methods for wiring interconnects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(9), pp. 1161-1166, 1992. The full citation details ...](Pics/full.jpeg) |
1992 |
DBLP DOI BibTeX RDF |
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9 | Richard I. Hartley, Kenneth Welles II, Michael J. Hartman, Abhijit Chatterjee, Paul Delano, Barbara Molnar, Colin Rafferty |
A Rapid-Prototyping Environment for Digital-Signal Processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 8(2), pp. 11-25, 1991. The full citation details ...](Pics/full.jpeg) |
1991 |
DBLP DOI BibTeX RDF |
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9 | Robert W. Bassett, Barry J. Butkus, Stephen L. Dingle, Marc R. Faucher, Pamela S. Gillis, Jeannie H. Panner, John G. Petrovick, Donald L. Wheater |
Low-Cost Testing of High-Density Logic Components. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 7(2), pp. 15-28, 1990. The full citation details ...](Pics/full.jpeg) |
1990 |
DBLP DOI BibTeX RDF |
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Displaying result #301 - #306 of 306 (100 per page; Change: ) Pages: [ <<][ 1][ 2][ 3][ 4] |
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