|
|
Venues (Conferences, Journals, ...)
|
|
GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 452 occurrences of 271 keywords
|
|
|
Results
Found 1308 publication records. Showing 1308 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
17 | Miri Barak, Maya Usher |
The innovation profile of nanotechnology team projects of face-to-face and online learners. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Comput. Educ. ![In: Comput. Educ. 137, pp. 1-11, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | John Rumble, John Broome, Simon Hodson |
Building an International Consensus on Multi-Disciplinary Metadata Standards: A CODATA Case History in Nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Data Sci. J. ![In: Data Sci. J. 18, pp. 12, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Leila Tahmooresnejad, Catherine Beaudry |
Citation impact of public and private funding on nanotechnology-related publications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Technol. Manag. ![In: Int. J. Technol. Manag. 79(1), pp. 21-59, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Huanyu Li 0001, Rickard Armiento, Patrick Lambrix |
Extending Ontologies in the Nanotechnology Domain using Topic Models and Formal Topical Concept Analysis on Unstructured Text. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISWC (Satellites) ![In: Proceedings of the ISWC 2019 Satellite Tracks (Posters & Demonstrations, Industry, and Outrageous Ideas) co-located with 18th International Semantic Web Conference (ISWC 2019), Auckland, New Zealand, October 26-30, 2019., pp. 5-8, 2019, CEUR-WS.org. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP BibTeX RDF |
|
17 | Jie-lan Ding, Zhesi Shen, Per Ahlgren, Tobias Jeppsson, David Minguillo |
How does author ethnic diversity affect scientific impact? A study of nanoscience and nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSI ![In: Proceedings of the 17th International Conference on Scientometrics and Informetrics, ISSI 2019, Rome, Italy, September 2-5, 2019., pp. 2606-2607, 2019, ISSI Society, 978-88-3381-118-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP BibTeX RDF |
|
17 | Lili Wang 0004, Zexia Li |
Exploring the development of science-based nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSI ![In: Proceedings of the 17th International Conference on Scientometrics and Informetrics, ISSI 2019, Rome, Italy, September 2-5, 2019., pp. 1813-1824, 2019, ISSI Society, 978-88-3381-118-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP BibTeX RDF |
|
17 | |
2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019 ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![IEEE, 978-1-7281-2260-1 The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP BibTeX RDF |
|
17 | Luca Gnoli, Giuseppe Carnicelli, Alessio Parisi, Luca Urbinati, Burim Kabashi, Fabio Michieletti, Sebastian Ignacio Peradotto Ibarra, Marco Vacca, Mariagrazia Graziano, Jimson Mathew, Marco Ottavi |
Fault Tolerant Photovoltaic Array: A Repair Circuit Based on Memristor Sensing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-4, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Alberto Bosio, Ian O'Connor, Gennaro Severino Rodrigues, Fernanda Lima Kastensmidt, Elena I. Vatajelu, Giorgio Di Natale, Lorena Anghel, Surya Nagarajan, Moritz Fieback, Said Hamdioui |
Rebooting Computing: The Challenges for Test and Reliability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 8138-8143, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Maksim Jenihhin, Matteo Sonza Reorda, Aneesh Balakrishnan, Dan Alexandrescu |
Challenges of Reliability Assessment and Enhancement in Autonomous Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-6, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Antonio J. Sánchez, Yubal Barrios, Lucana Santos, Roberto Sarmiento |
Evaluation of TMR effectiveness for soft error mitigation in SHyLoC compression IP core implemented on Zynq SoC under heavy ion radiation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-4, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Tsai-Ling Tsai, Jin-Fu Li 0001, Chun-Lung Hsu, Chi-Tien Sun |
Testing of In-Memory-Computing 8T SRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-4, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Zhen Gao 0001, Jinhua Zhu, Lina Yan, Tong Yan, Pedro Reviriego |
Reliability Evaluation of Polyphase-filter based Decimators Implemented on SRAM-FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-4, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Nikos Foutris, Christos Kotselidis, Mikel Luján |
Simulating Wear-out Effects of Asymmetric Multicores at the Architecture Level. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-6, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Aleksandar Simevski, Patryk Skoncej, Cristiano Calligaro, Milos Krstic |
Scalable and Configurable Multi-Chip SRAM in a Package for Space Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-6, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Giulio Gambardella, Johannes Kappauf, Michaela Blott, Christoph Doehring, Martin Kumm, Peter Zipf, Kees A. Vissers |
Efficient Error-Tolerant Quantized Neural Network Accelerators. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-6, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Shanshan Liu 0001, Pedro Reviriego, Kazuteru Namba, Salvatore Pontarelli, Liyi Xiao, Fabrizio Lombardi |
Low Redundancy Double Error Correction Spotty Codes Combined with Gray Coding for 64 Data Bits Memories of 4-bit Multilevel Cells. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-4, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Markus Ulbricht 0002, Rizwan Tariq Syed, Milos Krstic |
Developing a Configurable Fault Tolerant Multicore System for Optimized Sensor Processing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-4, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Bifei Huang, Hao Yang, Israel Koren, Zahava Koren |
Detecting SEUs in Noisy Digital Imagers with small pixels. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-6, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Alessandro Vallero, Stefano Di Carlo |
Combining Cluster Sampling and ACE analysis to improve fault-injection based reliability evaluation of GPU-based systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 8138-8143, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Alexander Zeh, Manuela Meier, Viola Rieger |
Parity-Based Concurrent Error Detection Schemes for the ChaCha Stream Cipher. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-4, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Feroze Merchant, Anandraj Devarajan, Anik Basu, David Ashen, Brandon Yelton, Prashant D. Joshi |
High Performance Memory Repair. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-4, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Toshinori Hosokawa, Hiroshi Yamazaki, Kenichiro Misawa, Masayoshi Yoshimura, Yuki Hirama, Masavuki Arai |
A Low Capture Power Oriented X-filling Method Using Partial MaxSAT Iteratively. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-6, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Christian M. Fuchs, Pai H. Chou, Xiaoqing Wen, Nadia M. Murillo, Gianluca Furano, Stefan Holst, Antonis Tavoularis, Shyue-Kung Lu, Aske Plaat, Kostas Marinis |
A Fault-Tolerant MPSoC For CubeSats. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-6, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Annachiara Ruospo, Riccardo Cantoro, Ernesto Sánchez 0001, Pasquale Davide Schiavone, Angelo Garofalo, Luca Benini |
On-line Testing for Autonomous Systems driven by RISC-V Processor Design Verification. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-6, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Hideyuki Ichihara, Yuki Maeda, Tsuyoshi Iwagaki, Tomoo Inoue |
State Encoding with Stochastic Numbers for Transient Fault Tolerant Linear Finite State Machines. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-6, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Masayoshi Yoshimura, Yuki Takeuchi, Hiroshi Yamazaki, Toshinori Hosokawa |
A State Assignment Method to Improve Transition Fault Coverage for Controllers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-4, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Boyang Du, Sarah Azimi, Corrado De Sio, Ludovica Bozzoli, Luca Sterpone |
On the Reliability of Convolutional Neural Network Implementation on SRAM-based FPGA. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-6, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Ana Lasheras, Ramon Canal, Eva Rodríguez, Luca Cassano |
Protecting RSA Hardware Accelerators against Differential Fault Analysis through Residue Checking. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-6, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Fritz G. Previlon, Charu Kalra, David R. Kaeli, Paolo Rech |
A Comprehensive Evaluation of the Effects of Input Data on the Resilience of GPU Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-6, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Avishek Choudhury, Biplab K. Sikdar |
CORE-VR: A Coherence and Reusability Aware Low Voltage Fault Tolerant Cache in Multicore. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-4, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Jiaqiang Li, Pedro Reviriego, Liyi Xiao, Alexander Klockmann |
Protecting Large Word Size Memories against MCUs with 3-bit Burst Error Correction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-4, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Donald Kline Jr., Stephen Longofono, Rami G. Melhem, Alex K. Jones |
Predicting Single Event Effects in DRAM. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-6, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Lucas Matana Luza, Alexandre Besser, Viyas Gupta, Arto Javanainen, Ali Mohammadzadeh, Luigi Dilillo |
Effects of Heavy Ion and Proton Irradiation on a SLC NAND Flash Memory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-6, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Daniel Oliveira 0002, Philippe O. A. Navaux, Paolo Rech |
Increasing the Efficiency and Efficacy of Selective-Hardening for Parallel Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-6, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Mahsa Mousavi, Hamid Reza Pourshaghaghi, Henk Corporaal, Akash Kumar 0001 |
Scatter Scrubbing: A Method to Reduce SEU Repair Time in FPGA Configuration Memory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-6, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Jerrin Pathrose, Leon van de Logt, Hans G. Kerkhoff |
Analog Test Interface for IEEE 1687 Employing Split SAR Architecture to Support Embedded Instrument Dependability Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-4, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Danny Santoso, Hyeran Jeon |
Understanding of GPU Architectural Vulnerability for Deep Learning Workloads. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-6, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Satyadev Ahlawat, Jaynarayan T. Tudu, Manoj Singh Gaur, Masahiro Fujita, Virendra Singh |
Preventing Scan Attack through Test Response Encryption. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-6, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Stefano Di Mascio, Alessandra Menicucci, Eberhard K. A. Gill, Gianluca Furano, Claudio Monteleone |
On the Criticality of Caches in Fault-Tolerant Processors for Space. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pp. 1-4, 2019, IEEE, 978-1-7281-2260-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Maria K. Michael, Salvatore Pontarelli, Omer Khan |
Guest Editorial: Special Section on Defect and Fault Tolerance in VLSI and Nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Emerg. Top. Comput. ![In: IEEE Trans. Emerg. Top. Comput. 6(4), pp. 447-449, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Gang Wang |
Nanotechnology: The New Features. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1812.04939, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP BibTeX RDF |
|
17 | Woo-seok Jang, Heeyeul Kwon, Yongtae Park, Hakyeon Lee |
Predicting the degree of interdisciplinarity in academic fields: the case of nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 116(1), pp. 231-254, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Yu Meng |
Gender distinctions in patenting: Does nanotechnology make a difference? ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 114(3), pp. 971-992, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Gita Ghiasi, Matthew Harsh, Andrea Schiffauerova |
Inequality and collaboration patterns in Canadian nanotechnology: implications for pro-poor and gender-inclusive policy. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 115(2), pp. 785-815, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Zaida Chinchilla-Rodríguez, Sandra Miguel, Antonio Perianes-Rodríguez, Cassidy R. Sugimoto |
Dependencies and autonomy in research performance: examining nanoscience and nanotechnology in emerging countries. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 115(3), pp. 1485-1504, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Giuseppe Riva 0001 |
BYAXON: Could Nanotechnology "Rewire" an Injured Spinal Cord? ![Search on Bibsonomy](Pics/bibsonomy.png) |
Cyberpsychology Behav. Soc. Netw. ![In: Cyberpsychology Behav. Soc. Netw. 21(12), pp. 805, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Anna Spyrtou, Leonidas Manou, George Peikos, Panagiota Zachou |
Facilitating Primary Student Teachers' Development of Critical Thinking Through a Nanotechnology Module. ![Search on Bibsonomy](Pics/bibsonomy.png) |
TECH-EDU ![In: Technology and Innovation in Learning, Teaching and Education - First International Conference, TECH-EDU 2018, Thessaloniki, Greece, June 20-22, 2018, Revised Selected Papers, pp. 137-152, 2018, Springer, 978-3-030-20953-7. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Alma Jakupovic, Zivorad Kovacevic, Lejla Gurbeta, Almir Badnjevic |
Review of artificial neural network application in nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MECO ![In: 7th Mediterranean Conference on Embedded Computing, MECO 2018, Budva, Montenegro, June 10-14, 2018, pp. 1-4, 2018, IEEE, 978-1-5386-5683-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Sujeily Fonseca, Samuel Gonzalez, Brian Rodriguez, Melody Seda, Jorge Bobonis, Alberto Canela, Chaliana Rolon, Josean Bosque, Lexdyel Mendez, Annamary Cartagena, Tahiri Fuentes, Nayda G. Santiago, Ana Nieves-Rosa |
Educational Nanotechnology Video Game to Inspire Middle and High School Students to Pursue STEM Related Professional Careers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FIE ![In: IEEE Frontiers in Education Conference, FIE 2018, San Jose, CA, USA, October 3-6, 2018, pp. 1-5, 2018, IEEE, 978-1-5386-1174-6. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | |
2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018 ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![IEEE Computer Society, 978-1-5386-8398-9 The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP BibTeX RDF |
|
17 | Kristin Imenes, Knut E. Aasmundtveit |
Educational needs and open education resources in micro- and nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EDUCON ![In: 2018 IEEE Global Engineering Education Conference, EDUCON 2018, Santa Cruz de Tenerife, Tenerife, Islas Canarias, Spain, April 17-20, 2018, pp. 1841-1845, 2018, IEEE, 978-1-5386-2957-4. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Puneet Ramesh Savanur, Spyros Tragoudas |
Threshold Voltage Extraction Using Static NBTI Aging. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018, pp. 1-6, 2018, IEEE Computer Society, 978-1-5386-8398-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Abhishek Das, Nur A. Touba |
Efficient Non-Binary Hamming Codes for Limited Magnitude Errors in MLC PCMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018, pp. 1-6, 2018, IEEE Computer Society, 978-1-5386-8398-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren |
Analysis of Single Event Upsets Based on Digital Cameras with Very Small Pixels. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018, pp. 1-6, 2018, IEEE Computer Society, 978-1-5386-8398-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Lake Bu, Hai Cheng, Michel A. Kinsy |
Fast Dynamic Device Authentication Based on Lorenz Chaotic Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018, pp. 1-6, 2018, IEEE Computer Society, 978-1-5386-8398-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Elisabeth Baseman, Nathan DeBardeleben, Sean Blanchard, Juston S. Moore, Olena Tkachenko, Kurt B. Ferreira, Taniya Siddiqua, Vilas Sridharan |
Physics-Informed Machine Learning for DRAM Error Modeling. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018, pp. 1-6, 2018, IEEE Computer Society, 978-1-5386-8398-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Naixing Wang, Irith Pomeranz, Brady Benware, M. Enamul Amyeen, Srikanth Venkataraman |
Improving the Resolution of Multiple Defect Diagnosis by Removing and Selecting Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018, pp. 1-6, 2018, IEEE Computer Society, 978-1-5386-8398-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Mark Wilkening, Fritz Previlon, David R. Kaeli, Sudhanva Gurumurthi, Steven Raasch, Vilas Sridharan |
Evaluating the Resilience of Parallel Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018, pp. 1-6, 2018, IEEE Computer Society, 978-1-5386-8398-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Georgios Ioannis Paliaroutis, Pelopidas Tsoumanis, Nestor E. Evmorfopoulos, George Dimitriou, Georgios I. Stamoulis |
A Placement-Aware Soft Error Rate Estimation of Combinational Circuits for Multiple Transient Faults in CMOS Technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018, pp. 1-6, 2018, IEEE Computer Society, 978-1-5386-8398-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Vishal Gupta 0002, Saurabh Khandelwal, Jimson Mathew, Marco Ottavi |
45nm Bit-Interleaving Differential 10T Low Leakage FinFET Based SRAM with Column-Wise Write Access Control. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018, pp. 1-6, 2018, IEEE Computer Society, 978-1-5386-8398-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Yuta Yamamoto, Kazuteru Namba |
Construction of Latch Design with Complete Double Node Upset Tolerant Capability Using C-Element. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018, pp. 1-6, 2018, IEEE Computer Society, 978-1-5386-8398-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Semiu A. Olowogemo, William H. Robinson, Daniel B. Limbrick |
Effects of Voltage and Temperature Variations on the Electrical Masking Capability of Sub-65 nm Combinational Logic Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018, pp. 1-6, 2018, IEEE Computer Society, 978-1-5386-8398-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Gianluca Furano, Antonis Tavoularis, Lucana Santos, Veronique Ferlet-Cavrois, Cesar Boatella, Ruben Garcia Alia, Pablo Fernández-Martínez, Maria Kastriotou, Vanessa Wyrwoll, Salvatore Danzeca, Maris Tali, Dejan Gacnik, Iztok Kramberger, Lars Juul, Konstantinos Maragos 0001, George Lentaris |
FPGA SEE Test with Ultra-High Energy Heavy Ions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018, pp. 1-4, 2018, IEEE Computer Society, 978-1-5386-8398-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Zois-Gerasimos Tasoulas, Ryan Guss, Iraklis Anagnostopoulos |
Performance-Based and Aging-Aware Resource Allocation for Concurrent GPU Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018, pp. 1-6, 2018, IEEE Computer Society, 978-1-5386-8398-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Pilin Junsangsri, Fabrizio Lombardi |
Multiple Fault Detection in Nano Programmable Logic Arrays. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018, pp. 1-6, 2018, IEEE Computer Society, 978-1-5386-8398-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Marcello Traiola, Arnaud Virazel, Patrick Girard 0001, Mario Barbareschi, Alberto Bosio |
Investigation of Mean-Error Metrics for Testing Approximate Integrated Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018, pp. 1-6, 2018, IEEE Computer Society, 978-1-5386-8398-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Ludovica Bozzoli, Luca Sterpone |
MATS**: An On-Line Testing Approach for Reconfigurable Embedded Memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018, pp. 1-6, 2018, IEEE Computer Society, 978-1-5386-8398-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Markus Schütz, Andreas Steininger, Florian Huemer, Jakob Lechner |
State Recovery for Coarse-Grain TMR Designs in FPGAs Using Partial Reconfiguration. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018, pp. 1-6, 2018, IEEE Computer Society, 978-1-5386-8398-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Zhen Gao 0001, Lina Yan, Jinhua Zhu, Ruishi Han, Pedro Reviriego |
Analysis of the Effects of Single Event Upsets (SEUs) on User Memory in FPGA Implemented Viterbi Decoders. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018, pp. 1-6, 2018, IEEE Computer Society, 978-1-5386-8398-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Alexandre Coelho, Amir Charif, Nacer-Eddine Zergainoh, Raoul Velazco |
A Runtime Fault-Tolerant Routing Scheme for Partially Connected 3D Networks-on-Chip. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018, pp. 1-6, 2018, IEEE Computer Society, 978-1-5386-8398-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Pavan Kumar Javvaji, Spyros Tragoudas |
A Method to Model Statistical Path Delays for Accurate Defect Coverage. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018, pp. 1-6, 2018, IEEE Computer Society, 978-1-5386-8398-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Andrea Floridia, Ernesto Sánchez 0001 |
Hybrid On-Line Self-Test Strategy for Dual-Core Lockstep Processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018, pp. 1-6, 2018, IEEE Computer Society, 978-1-5386-8398-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Danilo Pellegrini, Marco Ottavi, Eugenio Martinelli, Corrado Di Natale |
Complementary Resistive Switch Sensing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018, pp. 1-5, 2018, IEEE Computer Society, 978-1-5386-8398-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Irith Pomeranz |
Postprocessing Procedure for Reducing the Faulty Switching Activity of a Low-Power Test Set. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018, pp. 1-6, 2018, IEEE Computer Society, 978-1-5386-8398-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Kirankumar S. Momaya, Lalit Lalwani |
Systems of technological innovation: a review of research activities taking the case of nanotechnology and India. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Technol. Anal. Strateg. Manag. ![In: Technol. Anal. Strateg. Manag. 29(6), pp. 626-641, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Bianka Ullmann, Tibor Grasser |
Transformation: nanotechnology - challenges in transistor design and future technologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Elektrotech. Informationstechnik ![In: Elektrotech. Informationstechnik 134(7), pp. 349-354, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Vivek Kant |
Nanotechnology and HFE: critically engaging human capital in small-scale robotics research. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Cogn. Technol. Work. ![In: Cogn. Technol. Work. 19(2-3), pp. 419-444, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Hamid Tayebi Khosroshahi, Behzad Abedi, Sabalan Daneshvar, Yashar Sarbaz, Abolhassan Shakeri Bavil |
Future of the Renal Biopsy: Time to Change the Conventional Modality Using Nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Biomed. Imaging ![In: Int. J. Biomed. Imaging 2017, pp. 6141734:1-6141734:14, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Laurent R. Bergé, Thomas Scherngell, Iris Wanzenböck |
Bridging centrality as an indicator to measure the 'bridging role' of actors in networks: An application to the European Nanotechnology co-publication network. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Informetrics ![In: J. Informetrics 11(4), pp. 1031-1042, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Marina A. Kornilina, Viktoriia O. Podryga, Sergey V. Polyakov, Dmitry V. Puzyrkov, Mikhail V. Yakoboskiy |
Cloud Service for Solution of Promising Problems of Nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Supercomput. Front. Innov. ![In: Supercomput. Front. Innov. 4(4), pp. 66-79, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Azam Sazvar, Mahmood Yahyazadehfar, Hassanali Aghajani |
Improving knowledge sharing, creation, and innovation performance in nanotechnology firms: an application of the hybrid model of Kano and QFD. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Knowl. Learn. ![In: Int. J. Knowl. Learn. 12(1), pp. 59-73, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Sercan Ozcan, Nazrul Islam 0002 |
Patent information retrieval: approaching a method and analysing nanotechnology patent collaborations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 111(2), pp. 941-970, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Alexander I. Terekhov |
Bibliometric spectroscopy of Russia's nanotechnology: 2000-2014. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 110(3), pp. 1217-1242, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Fengchao Liu, Na Zhang, Cong Cao |
An evolutionary process of global nanotechnology collaboration: a social network analysis of patents at USPTO. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 111(3), pp. 1449-1465, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Chunjuan Luan, Alan L. Porter |
Insight into the Disciplinary Structure of Nanoscience & Nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Data Inf. Sci. ![In: J. Data Inf. Sci. 2(1), pp. 70-88, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Fatima Mustafa, Rabeay Y. A. Hassan, Silvana Andreescu |
Multifunctional Nanotechnology-Enabled Sensors for Rapid Capture and Detection of Pathogens. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 17(9), pp. 2121, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Kobi Leins |
Regulation of the Use of Nanotechnology in Armed Conflict. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Technol. Soc. Mag. ![In: IEEE Technol. Soc. Mag. 36(1), pp. 46-47, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Shang-Rong Fang, Cheng-Wei Tai, Rung-Bin Lin |
On Benchmarking Pin Access for Nanotechnology Standard Cells. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISVLSI ![In: 2017 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2017, Bochum, Germany, July 3-5, 2017, pp. 237-242, 2017, IEEE Computer Society, 978-1-5090-6762-6. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Krishna Naishadham, Elena Bekyarova, Patrizia Savi |
Passive nanotechnology based sensors for the remote detection of environmental pollutants impacting public health. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE SENSORS ![In: 2017 IEEE SENSORS, Glasgow, United Kingdom, October 29 - November 1, 2017, pp. 1-3, 2017, IEEE, 978-1-5090-1012-7. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Vasily Bunakov, Brian Matthews |
Metadata for Nanotechnology: Interoperability Aspects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MTSR ![In: Metadata and Semantic Research - 11th International Conference, MTSR 2017 Tallinn, Estonia, November 28 - December 1, 2017, Proceedings, pp. 247-252, 2017, Springer, 978-3-319-70862-1. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Stephen M. Goodnick |
Plenary speakers: Nanotechnology enabled pathways for energy conversion. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EUROCON ![In: IEEE EUROCON 2017 -17th International Conference on Smart Technologies, Ohrid, Macedonia, July 6-8, 2017, pp. xl, 2017, IEEE, 978-1-5090-3843-5. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Nicolas Augustus Rongione, Huuduy Hguyen, Huan Wu, Yongjie Hu |
Nanotechnology for lower grade waste heat recovery. ![Search on Bibsonomy](Pics/bibsonomy.png) |
NEMS ![In: 12th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2017, Los Angeles, CA, USA, April 9-12, 2017, pp. 826-831, 2017, IEEE, 978-1-5090-3059-0. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Brandon Sorge, Grant Fore, Eric Nunnally, Gina Gibau, Mangilal Agarwal |
Nanotechnology experiences for students and teachers (NEST): Enhancing teachers' self-efficacy and their understanding of STEM career opportunitie. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FIE ![In: 2017 IEEE Frontiers in Education Conference, FIE 2017, Indianapolis, IN, USA, October 18-21, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5090-5920-1. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Justin L. Hess, Anthony Chase, Dan Minner, Maher E. Rizkalla, Mangilal Agarwal |
An evaluation of a research experience for teachers in nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FIE ![In: 2017 IEEE Frontiers in Education Conference, FIE 2017, Indianapolis, IN, USA, October 18-21, 2017, pp. 1-7, 2017, IEEE Computer Society, 978-1-5090-5920-1. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | |
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017 ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![IEEE Computer Society, 978-1-5386-0362-8 The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP BibTeX RDF |
|
17 | Wen Huang |
Miniaturization of on-chip passive electronic devices by silicon nitride self-rolled-up membrane microtube nanotechnology ![Search on Bibsonomy](Pics/bibsonomy.png) |
|
2017 |
RDF |
|
17 | Frank Sill Torres, Pedro Fausto Rodrigues Leite, Rolf Drechsler |
Unintrusive aging analysis based on offline learning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Taniya Siddiqua, Vilas Sridharan, Steven E. Raasch, Nathan DeBardeleben, Kurt B. Ferreira, Scott Levy, Elisabeth Baseman, Qiang Guan |
Lifetime memory reliability data from the field. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Pai-Shun Ting, John P. Hayes |
Eliminating a hidden error source in stochastic circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
Displaying result #301 - #400 of 1308 (100 per page; Change: ) Pages: [ <<][ 1][ 2][ 3][ 4][ 5][ 6][ 7][ 8][ 9][ 10][ 11][ 12][ 13][ >>] |
|